Computer Simulation and Measurement of Capacitance Voltage Characteristics from Quantum Wire Devices of Trench-Oxide MOS Structure
1995 ◽
Vol 34
(Part 1, No. 2B)
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pp. 874-877
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1979 ◽
Vol 26
(7)
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pp. 1081-1085
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1987 ◽
Vol 22
(9)
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pp. 985-989
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Keyword(s):
1993 ◽
Vol 32
(Part 1, No. 9A)
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pp. 4005-4011
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Keyword(s):
Keyword(s):
2020 ◽
Vol 8
(6)
◽
pp. 1962-1971
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Keyword(s):