Effect of Electron Beam Irradiation on the Metal Ion Removal of Water Treatment Filter Made of Nanocellulose

2017 ◽  
Vol 49 (5) ◽  
pp. 78-85
Author(s):  
Ji Young Lee ◽  
Hae Min Jo ◽  
Tae Ung ◽  
Chul Hwan Kim ◽  
Kyung Min ◽  
...  
Keyword(s):  
Electron Beam ◽  
Water Treatment ◽  
Metal Ion ◽  
Electron Beam Irradiation ◽  
Beam Irradiation ◽  
Metal Ion Removal ◽  
Ion Removal

scholarly journals Recent advances in dye and metal ion removal using efficient adsorbents and novel nano-based materials: an overview

RSC Advances ◽  
2021 ◽  
Vol 11 (58) ◽  
pp. 36528-36553
Author(s):  
Ahmad K. Badawi ◽  
M. Abd Elkodous ◽  
Gomaa A. M. Ali
Keyword(s):  
Water Treatment ◽  
Metal Ions ◽  
Metal Ion ◽  
Metal Ion Removal ◽  
Ion Removal ◽  
Recent Advances ◽  
Metal Ions Removal

Various materials including waste precursors used as adsorbents for water treatment (dyes and metal ions removal).

The Changes of Absorption and Catalytic Capacity on Reduced Graphene Oxide After Electron Beam Irradiation

NANO ◽  
2015 ◽  
Vol 10 (03) ◽  
pp. 1550041 ◽  
Author(s):  
Peng Liu ◽  
Wei Qi ◽  
Wenzhen An ◽  
Longlong Tian ◽  
Zhan Li ◽  
...  
Keyword(s):  
Organic Matter ◽  
Graphene Oxide ◽  
Electron Beam ◽  
Metal Ion ◽  
Electron Beam Irradiation ◽  
Systematic Investigation ◽  
Pristine Graphene ◽  
Beam Irradiation ◽  
Porous Graphene ◽  
Catalytic Capacity

As is well-known, porous nanomaterials have attracted increasing attention recently, and graphene-related materials (such as porous graphene) have been studied both experimentally and theoretically. Almost all researches are focused on nanoelectronics, supercapacitors, multifunctional membrances, bio-applications or others. Consequently, in order to understand the differences between porous graphene and normal graphene at adsorption and catalytic property, in this experiment, with the removal of metal ion (152 Eu(III) ) and organic matter (gallic acid) and reduction of 4-nitrophenol (4-NP) by NaBH 4 as model reactions, a systematic investigation into the adsorptive performance as well as catalytic activity of graphene with or without electron beam irradiation exposure had been carried out. As the results showed, compared with the reduction of pristine graphene oxidized (R-GO), the reduction of graphene oxidized with electron beam irradiation exposure (100 MGy, about 2 h, radiation graphene oxide (R-RGO)) had many irregular defects caused by lack of atoms; the adsorptive performance of the R-RGO increased for metals but decreased for organic matter. However, the adsorption rate of the R-RGO was lower for metals, but higher for organic matter than that of the R-GO. In addition, the results also showed that the R-RGO had a better catalytic capacity than the R-GO.

scholarly journals New Type of Sodium Alginate-g-acrylamide Polyelectrolyte Obtained by Electron Beam Irradiation: Characterization and Study of Flocculation Efficacy and Heavy Metal Removal Capacity

Polymers ◽  
2019 ◽  
Vol 11 (2) ◽  
pp. 234 ◽  
Author(s):  
Gabriela Craciun ◽  
Elena Manaila and Daniel Ighigeanu
Keyword(s):  
Heavy Metal ◽  
Electron Beam ◽  
Sodium Alginate ◽  
Electron Beam Irradiation ◽  
Metal Removal ◽  
Heavy Metal Removal ◽  
Beam Irradiation ◽  
Kaolin Suspension ◽  
Ion Removal ◽  
Removal Capacity

The goals of the paper were first the obtainment and characterization of sodium alginate-g-acrylamide polyelectrolytes by electron beam irradiation in the range of 0.5 to 2 kGy, and second, the evaluation of flocculation efficacy and heavy metal removal capacity from aqueous solutions of known concentrations. Based on sodium alginate concentration, two types of grafted polymers were obtained. Physical, chemical, and structural investigations were performed. Flocculation studies under different stirring conditions on 0.5, 0.1 and 0.2% kaolin suspension were done. The removal capacity of Cu2+ and Cr6+ ions was also investigated. The acrylamide grafting ratio on sodium alginate backbone was found up to 2000% for samples containing 1% sodium alginate and up to 500% for samples containing 2% sodium alginate. Transmittances between 98 and 100% were obtained using, in the flocculation studies, polyelectrolytes containing 2% sodium alginate in concentrations of 0.5 and 1 ppm on kaolin suspension of 0.1 wt %. The polymer concentration was found critical for kaolin suspension of 0.05 and 0.1 wt %. Polymers containing 1% sodium alginate were efficient in Cr6+ ion removal, while those containing 2% in Cu2+ ion removal.

Methods to Monitor and Improve the Performance of Specimen Holders for Transmission Electron Cryomicroscopy

1996 ◽  
Vol 54 ◽  
pp. 454-455
Author(s):  
B. L. Armbruster ◽  
B. Kraus ◽  
M. Pan
Keyword(s):  
Electron Microscopy ◽  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Beam Irradiation ◽  
Quality Of Data ◽  
Electron Cryomicroscopy ◽  
Thermal Equilibration ◽  
Transmission Electron ◽  
Electron Microscopes

One goal in electron microscopy of biological specimens is to improve the quality of data to equal the resolution capabilities of modem transmission electron microscopes. Radiation damage and beam- induced movement caused by charging of the sample, low image contrast at high resolution, and sensitivity to external vibration and drift in side entry specimen holders limit the effective resolution one can achieve. Several methods have been developed to address these limitations: cryomethods are widely employed to preserve and stabilize specimens against some of the adverse effects of the vacuum and electron beam irradiation, spot-scan imaging reduces charging and associated beam-induced movement, and energy-filtered imaging removes the “fog” caused by inelastic scattering of electrons which is particularly pronounced in thick specimens.Although most cryoholders can easily achieve a 3.4Å resolution specification, information perpendicular to the goniometer axis may be degraded due to vibration. Absolute drift after mechanical and thermal equilibration as well as drift after movement of a holder may cause loss of resolution in any direction.

A Study of Electron Beam Irradiation Influence on Device Contact Junction Characteristics of Advanced DRAM Using Atomic Force Probing

2013 ◽  
Author(s):  
Wei-Chih Wang ◽  
Jian-Shing Luo
Keyword(s):  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Forward Bias ◽  
Irradiation Damage ◽  
Beam Irradiation ◽  
Excess Current ◽  
Atomic Force ◽  
Order Of Magnitude ◽  
Voltage Contrast ◽  
Acceleration Voltage

Abstract In this paper, we revealed p+/n-well and n+/p-well junction characteristic changes caused by electron beam (EB) irradiation. Most importantly, we found a device contact side junction characteristic is relatively sensitive to EB irradiation than its whole device characteristic; an order of magnitude excess current appears at low forward bias region after 1kV EB acceleration voltage irradiation (Vacc). Furthermore, these changes were well interpreted by our Monte Carlo simulation results, the Shockley-Read Hall (SRH) model and the Generation-Recombination (G-R) center trap theory. In addition, four essential examining items were suggested and proposed for EB irradiation damage origins investigation and evaluation. Finally, by taking advantage of the excess current phenomenon, a scanning electron microscope (SEM) passive voltage contrast (PVC) fault localization application at n-FET region was also demonstrated.

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