Impact of Stacking Faults and Domain Boundaries on the Electronic Transport in Cubic Silicon Carbide Probed by Conductive Atomic Force Microscopy
2020 ◽
Vol 6
(2)
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pp. 1901171
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2005 ◽
Vol 405
(1-3)
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pp. 63-67
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2013 ◽
2014 ◽
Vol 9
(3)
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pp. 234-238
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2021 ◽
Vol 129
◽
pp. 105789
2015 ◽
Vol 54
(5S)
◽
pp. 05EB02
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