Measurement of Energy Loss in Thin Films Using Microbeam Deflection Method

2011 ◽  
pp. 89-96
Author(s):  
F.-C. Hsu ◽  
C.-J. Tong ◽  
M.-T. Lin ◽  
Y.-C. Cheng
Keyword(s):  
Thin Films ◽  
Energy Loss

Electron energy loss spectroscopy of diamond-like carbon thin films

1992 ◽  
Vol 50 (2) ◽  
pp. 1272-1273
Author(s):  
J. Kulik ◽  
Y. Lifshitz ◽  
G.D. Lempert ◽  
S. Rotter ◽  
J.W. Rabalais ◽  
...  
Keyword(s):  
Thin Films ◽  
Energy Loss ◽  
Electron Energy ◽  
Ion Beam ◽  
Diamond Like Carbon ◽  
Ion Beam Deposition ◽  
Chemistry Research ◽  
Carbon Thin Films ◽  
Electron Energy Loss ◽  
Beam Deposition

Carbon thin films with diamond-like properties have generated significant interest in condensed matter science in recent years. Their extreme hardness combined with insulating electronic characteristics and high thermal conductivity make them attractive for a variety of uses including abrasion resistant coatings and applications in electronic devices. Understanding the growth and structure of such films is therefore of technological interest as well as a goal of basic physics and chemistry research. Recent investigations have demonstrated the usefulness of energetic ion beam deposition in the preparation of such films. We have begun an electron microscopy investigation into the microstructure and electron energy loss spectra of diamond like carbon thin films prepared by energetic ion beam deposition.The carbon films were deposited using the MEIRA ion beam facility at the Soreq Nuclear Research Center in Yavne, Israel. Mass selected C+ beams in the range 50 to 300 eV were directed onto Si {100} which had been etched with HF prior to deposition.

scholarly journals Tuning the Electrical Properties of NiO Thin Films by Stoichiometry and Microstructure

Coatings ◽  
2021 ◽  
Vol 11 (6) ◽  
pp. 697
Author(s):  
Yu-He Liu ◽  
Xiao-Yan Liu ◽  
Hui Sun ◽  
Bo Dai ◽  
Peng Zhang ◽  
...  
Keyword(s):  
Thin Films ◽  
Electrical Properties ◽  
Energy Loss ◽  
Single Crystal ◽  
Oxygen Stoichiometry ◽  
High Resistivity ◽  
Edge Structure ◽  
Glass Substrates ◽  
Lower Resistivity

Here, the electrical properties of NiO thin films grown on glass and Al2O3 (0001) substrates have been investigated. It was found that the resistivity of NiO thin films strongly depends on oxygen stoichiometry. Nearly perfect stoichiometry yields extremely high resistivity. In contrast, off-stoichiometric thin films possess much lower resistivity, especially for oxygen-rich composition. A side-by-side comparison of energy loss near the edge structure spectra of Ni L3 edges between our NiO thin films and other theoretical spectra rules out the existence of Ni3+ in NiO thin films, which contradicts the traditional hypothesis. In addition, epitaxial NiO thin films grown on Al2O3 (0001) single crystal substrates exhibit much higher resistivity than those on glass substrates, even if they are deposited simultaneously. This feature indicates the microstructure dependence of electrical properties.

Multiple Plasmon Effects in the Energy-Loss Spectra of Electrons in Thin Films

1971 ◽  
Vol 3 (3) ◽  
pp. 719-729 ◽  
Author(s):  
M. Šunjić ◽  
A. A. Lucas
Keyword(s):  
Thin Films ◽  
Energy Loss

Quantification of the H content in diamondlike carbon and polymeric thin films by reflection electron energy loss spectroscopy

2005 ◽  
Vol 87 (8) ◽  
pp. 084101 ◽  
Author(s):  
F. Yubero ◽  
V. J. Rico ◽  
J. P. Espinós ◽  
J. Cotrino ◽  
A. R. González-Elipe
Keyword(s):  
Thin Films ◽  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Polymeric Thin Films ◽  
Diamondlike Carbon ◽  
Electron Energy Loss

scholarly journals Energy loss by fast-travelling charged particles traversing two-dimensional materials

2020 ◽  
Vol 233 ◽  
pp. 03005
Author(s):  
Jaime E. Santos ◽  
Mikhail Vasilevskiy ◽  
Nuno M.R. Peres ◽  
Antti-Pekka Jauho
Keyword(s):  
Thin Films ◽  
Energy Loss ◽  
2D Materials ◽  
Charged Particles ◽  
Monolayer Graphene ◽  
Two Dimensional ◽  
Particle Detection ◽  
Hydrodynamic Approximation ◽  
Radiation Losses ◽  
Two Dimensional Materials

We consider the problem of the radiation losses by fast-traveling particles traversing two-dimensional (2d) materials or thin films. After review¬ing the screening of electromagnetic fields by two dimensional conducting ma¬terials, we obtain the energy loss by a fast particle traversing such a material or film. In particular, we discuss the pattern of radiation emitted by monolayer graphene treated within a hydrodynamic approximation. These results are com¬pared with recent published results using similar approximations and, having in mind a potential application to particle detection, we briefly discuss how one can improve on the signals obtained by using other two-dimensional materials.

scholarly journals ENERGY LOSS IN CONDENSED MATTER OF H1 AND He4 IN THE ENERGY RANGE 4 < E < 30 kev

1962 ◽  
Vol 40 (12) ◽  
pp. 1749-1764 ◽  
Author(s):  
Arie Van Wijngaarden ◽  
Henry E. Duckworth
Keyword(s):  
Thin Films ◽  
Aluminum Oxide ◽  
Energy Loss ◽  
Energy Range ◽  
Energy Dependence ◽  
Cross Section ◽  
Cross Sections ◽  
Condensed Matter ◽  
Forward Direction ◽  
Electronic Component

Measurements are reported of the energy loss suffered by H1 and He4 particles, of 4- to 30-kev energy, in passing through thin films of carbon, aluminum oxide, and VYNS. Only those particles that emerged in the forward direction were studied. Evidence is presented for identifying the stopping cross sections per atom observed in this way with Se, the electronic component of the total stopping cross section per atom. It appears that the calculated energy dependence of [Formula: see text] is somewhat in error, and that the magnitudes of the Se's for He4 are systematically too small by 10–15%.

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