Utilization of the GD OES Depth Profiling Technique in Automotive Parts Analysis

2017 ◽  
pp. 135-142
Author(s):  
Tamás I. Török ◽  
Gábor Lassú
Keyword(s):  
Depth Profiling ◽  
Automotive Parts

Preferential Sputtering of Ni3Al Single Crystals Studied Using Atom-Probe Field-Ion Microscopy and XPS

1981 ◽  
Vol 39 ◽  
pp. 16-17
Author(s):  
M.P. Thomas ◽  
A.R. Waugh ◽  
M.J. Southon ◽  
Brian Ralph
Keyword(s):  
Single Crystals ◽  
Photoelectron Spectroscopy ◽  
Surface Composition ◽  
Depth Profiling ◽  
Analytical Techniques ◽  
Atom Probe ◽  
Probe Field ◽  
Preferential Sputtering ◽  
Argon Ion Bombardment ◽  
Argon Ion

It is well known that ion-induced sputtering from numerous multicomponent targets results in marked changes in surface composition (1). Preferential removal of one component results in surface enrichment in the less easily removed species. In this investigation, a time-of-flight atom-probe field-ion microscope A.P. together with X-ray photoelectron spectroscopy XPS have been used to monitor alterations in surface composition of Ni3Al single crystals under argon ion bombardment. The A.P. has been chosen for this investigation because of its ability using field evaporation to depth profile through a sputtered surface without the need for further ion sputtering. Incident ion energy and ion dose have been selected to reflect conditions widely used in surface analytical techniques for cleaning and depth-profiling of samples, typically 3keV and 1018 - 1020 ion m-2.

Atomic force microscopy (AFM) of the topography of silicon surfaces exposed to ion beams

1992 ◽  
Vol 50 (2) ◽  
pp. 1132-1133
Author(s):  
Mark Denker ◽  
Jennifer Wall ◽  
Mark Ray ◽  
Richard Linton
Keyword(s):  
Secondary Ion Mass Spectrometry ◽  
Incidence Angle ◽  
Ion Beam ◽  
Depth Profiling ◽  
Depth Resolution ◽  
Ion Beams ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Trace Impurities ◽  
Energy Dose

Reactive ion beams such as O2+ and Cs+ are used in Secondary Ion Mass Spectrometry (SIMS) to analyze solids for trace impurities. Primary beam properties such as energy, dose, and incidence angle can be systematically varied to optimize depth resolution versus sensitivity tradeoffs for a given SIMS depth profiling application. However, it is generally observed that the sputtering process causes surface roughening, typically represented by nanometer-sized features such as cones, pits, pyramids, and ripples. A roughened surface will degrade the depth resolution of the SIMS data. The purpose of this study is to examine the relationship of the roughness of the surface to the primary ion beam energy, dose, and incidence angle. AFM offers the ability to quantitatively probe this surface roughness. For the initial investigations, the sample chosen was <100> silicon, and the ion beam was O2+.Work to date by other researchers typically employed Scanning Tunneling Microscopy (STM) to probe the surface topography.

IDENTIFIKASI KARAKTERISTIK MEKANIS BANTALAN LUNCUR MOTOR STARTER DARI SERBUK TEMBAGA ALUMUNIUM

2013 ◽  
Vol 12 (3) ◽  
Author(s):  
Syamsul Rizal ◽  
Amin Suhandi
Keyword(s):  
Mechanical Test ◽  
Life Time ◽  
Extrusion Process ◽  
Automotive Application ◽  
Powder Metallurgy Method ◽  
Powder Metal ◽  
Time Operation ◽  
Different Temperatures ◽  
Automotive Parts ◽  
Solid Form

There are many attempts to support the development of industry in Indonesia, especially on automotive sector, one of them is by replacing import components with local component products. Bushing is one of imported component that widely used on automotive application including motor strater. Bushing usually made of  copper alloy such as brass, bronz or babbit in a solid form by casting or extrusion process. In this research powder metal technology is used to process Cu-Al powder to become slide bearing of motor starter. It is expected that powder metal process not only increasing local content in automotive parts but also providing better quality by increasing life time of bushing compared to ordinary one. Cu-Al metal powder was compacted at various pressure, i.e: 250 MPa, 350 MPa and 450 MPa, and then all specimens were sintered at different temperatures : 4000C, 5000C dan 6000C for 1 hour.  After sintering specimens were air cooled to room temperature. After physical and mechanical test it can be deduced that bushing made by powder metallurgy method could increase its mechanical properties and as aresult improve its life time operation.  

Metallographic Examinations Performed on Automotive Parts Through Several Case Studies

2019 ◽  
Vol 56 (1) ◽  
pp. 5-21
Author(s):  
P. Jacquot ◽  
B. Stauder ◽  
N. Jacquot ◽  
G. Fürst
Keyword(s):  
Case Studies ◽  
Automotive Parts

KAISER ALUMINUM ALLOY 6262

Alloy Digest ◽  
1999 ◽  
Vol 48 (9) ◽  
Keyword(s):  
Corrosion Resistance ◽  
Shear Strength ◽  
Aluminum Alloy ◽  
Physical Properties ◽  
Surface Treatment ◽  
Tensile Properties ◽  
Heat Treating ◽  
Kaiser Aluminum ◽  
Automotive Parts

Abstract Kaiser Aluminum alloy 6262 (Tennalum alloy 6262) is an Al-Mg-Si-Cu-Cr-Pb-Bi alloy with characteristic good machinability and corrosion resistance and a good acceptance of coatings (anodize response). It is typically used in automotive parts, fittings, building hardware, and valve components. This datasheet provides information on composition, physical properties, tensile properties, and shear strength as well as fatigue. It also includes information on forming, heat treating, machining, joining, and surface treatment. Filing Code: AL-361. Producer or source: Tennalum, A Division of Kaiser Aluminum.

Surface Microstructure Evolution Upon Silicidation of Ni(Pt) and the Different Responses to Metal Etch

2013 ◽  
Author(s):  
Wentao Qin ◽  
Dorai Iyer ◽  
Jim Morgan ◽  
Carroll Casteel ◽  
Robert Watkins ◽  
...  
Keyword(s):  
Thin Film ◽  
Oxide Film ◽  
Microstructure Evolution ◽  
Depth Profiling ◽  
Surface Microstructure ◽  
The Difference ◽  
Surface Microstructures ◽  
Pt Films

Abstract Ni(5 at.%Pt ) films were silicided at a temperature below 400 °C and at 550 °C. The two silicidation temperatures had produced different responses to the subsequent metal etch. Catastrophic removal of the silicide was seen with the low silicidation temperature, while the desired etch selectivity was achieved with the high silicidation temperature. The surface microstructures developed were characterized with TEM and Auger depth profiling. The data correlate with both silicidation temperatures and ultimately the difference in the response to the metal etch. With the high silicidation temperature, there existed a thin Si-oxide film that was close to the surface and embedded with particles which contain metals. This thin film is expected to contribute significantly to the desired etch selectivity. The formation of this layer is interpreted thermodynamically.

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