Effects of Rapid Thermal Annealing on the Structural, Optical, and Electrical Properties of Au/CuPc/n-Si (MPS)-type Schottky Barrier Diodes

2021 ◽  
Vol 127 (10) ◽  
Author(s):  
P. R. Sekhar Reddy ◽  
V. Janardhanam ◽  
V. Rajagopal Reddy ◽  
Min Hyuk Park ◽  
Chel-Jong Choi
Keyword(s):  
Electrical Properties ◽  
Schottky Barrier ◽  
Thermal Annealing ◽  
Rapid Thermal Annealing ◽  
Optical And Electrical Properties ◽  
Schottky Barrier Diodes

Effect of Inert Annealing Gases on Morphology of Gold Nanoparticles Produced by Using Rapid Thermal Annealing

2019 ◽  
Vol 57 ◽  
pp. 7-16
Author(s):  
Tung Thanh Bui ◽  
Tien Minh Huynh ◽  
Thuy Thanh Tieu ◽  
Chien Mau Dang
Keyword(s):  
Gold Nanoparticles ◽  
Electrical Properties ◽  
Thermal Annealing ◽  
Rapid Thermal Annealing ◽  
Metallic Nanoparticles ◽  
Strong Influence ◽  
Silicon Substrates ◽  
Optical And Electrical Properties ◽  
Potential Applications ◽  
Spherical Gold Nanoparticles

Metallic nanoparticles have various potential applications. Recent studies have showed that their morphology had a strong influence on their optical and electrical properties. In this work, rapid thermal annealing was used to produce gold nanoparticles on silicon substrates. Morphology control of the gold nanoparticles was made by changing inert annealing gases. Spherical gold nanoparticles were obtained with nitrogen while hemispherical gold nanoparticles were formed with argon.

Influence of Rapid Thermal Annealing on Structural, Optical and Electrical Properties of ITO Thin Films

2016 ◽  
Vol 675-676 ◽  
pp. 249-252
Author(s):  
Wissawat Sakulsaknimitr ◽  
Worasitti Sriboon ◽  
Kanyakorn Teanchai ◽  
Mati Horprathum ◽  
Chanunthorn Chananonnawathorn ◽  
...  
Keyword(s):  
Thin Films ◽  
Electrical Properties ◽  
Thermal Annealing ◽  
Rapid Thermal Annealing ◽  
Hall Effect Measurement ◽  
Electron Beam Evaporation ◽  
Optical And Electrical Properties ◽  
Force Microscopy ◽  
Atomic Force ◽  
Ito Thin Films

Indium doped tin oxide (ITO) thin films were deposited on silicon wafer (100) and glass slide by ion assisted electron beam evaporation deposition. After deposition, the ITO thin films were annealed in vacuum (100-300°C) and their structural, optical and electrical properties were systematically investigated. X-ray diffraction,atomic force microscopy, ultraviolet–visible (UV–vis) spectrophotometer and hall-effect measurement were employed to obtain information on the crystallization, transmission and resistivity the films.It was found that the rapid thermal annealing can improve the resistivity of ITO thin films which specializes for the transparent conductive layers.

scholarly journals Effect of rapid thermal annealing on barrier height and 1/f noise of Ni/GaN Schottky barrier diodes

2015 ◽  
Vol 107 (9) ◽  
pp. 093502 ◽  
Author(s):  
Ashutosh Kumar ◽  
M. Latzel ◽  
S. Christiansen ◽  
V. Kumar ◽  
R. Singh
Keyword(s):  
Schottky Barrier ◽  
Barrier Height ◽  
Thermal Annealing ◽  
Rapid Thermal Annealing ◽  
Schottky Barrier Diodes

scholarly journals Effects of Rapid Thermal Annealing on the Structural, Optical, and Electrical Properties of ZnO/Ag/SnO2 Tri-Layer Films

2019 ◽  
Vol 57 (8) ◽  
pp. 506-509
Author(s):  
Su-Hyeon Choe ◽  
Yu-Sung Kim ◽  
Jin-Young Choi ◽  
Yun-Je Park ◽  
Byung-Chul Cha ◽  
...  
Keyword(s):  
Electrical Properties ◽  
Thermal Annealing ◽  
Rapid Thermal Annealing ◽  
Optical And Electrical Properties

Effects of rapid thermal annealing on the optical and electrical properties of InN epilayers

2006 ◽  
Vol 18 (42) ◽  
pp. L543-L549 ◽  
Author(s):  
G W Shu ◽  
P F Wu ◽  
Y W Liu ◽  
J S Wang ◽  
J L Shen ◽  
...  
Keyword(s):  
Electrical Properties ◽  
Thermal Annealing ◽  
Rapid Thermal Annealing ◽  
Optical And Electrical Properties
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