Evaluation of the Energy Losses for Quasibrittle Fracture Based on the X-Ray Investigations of Newly Formed Surfaces

2020 ◽  
Vol 55 (4) ◽  
pp. 509-513
Author(s):  
B. K. Hanulich ◽  
V. М. Tymoshchuk ◽  
О. М. Holiyan
Keyword(s):  
Energy Losses ◽  
Quasibrittle Fracture ◽  
X Ray

scholarly journals X-ray diffraction method application to assess the energy losses on explosive-rock contact under various blasting

2020 ◽  
Vol 168 ◽  
pp. 00051
Author(s):  
Ihor Kratkovskyi ◽  
Ernest Yefremov ◽  
Kostyantyn Ishchenko ◽  
Sergo Khomeriki
Keyword(s):  
Rock Fracture ◽  
Diffraction Method ◽  
Optical Systems ◽  
Energy Losses ◽  
X Ray Diffraction ◽  
X Ray ◽  
Wave Nature ◽  
Diffraction Patterns ◽  
The Individual ◽  
Granulometric Characteristics

The dissipative energy losses of the explosion on the explosive-rock contact are usually evaluated with comparative analysis of the particle size distribution of finely dispersed fractions (0-100 microns). The more tiny particles contained in the destruction products, the higher there is a level of energy loss during the explosion. Fine dust granulometric characteristics are determined by processing the mass measurements data of the individual smallest particles sizes when decoding microphotographs obtained by a microscope. However due to the chromatic aberrations due the wave nature of light and the optical systems imperfection, it is not possible to reliably estimate the mass and granulometric characteristics particles of micron size. X-ray diffraction method for studying ultrafine rock fracture products makes it possible to estimate the dissipative energy losses on explosive-rock contact based on the reflected X-ray beam total intensity in diffractograms. In order to establish the effectiveness of methods for reducing the level of dissipative energy losses of an explosion, X-ray diffraction patterns of finely dispersed fracture products of rock samples under various conditions of dynamic loading are analyzed (using different charge designs, attenuating the rocks by the action of a surfactant, and the force action of a different gradient stress field).

Energy Losses of Electrons and X-Ray K-Absorption in KCl and KBr

1978 ◽  
Vol 17 (S2) ◽  
pp. 238 ◽  
Author(s):  
Shigeo Arai ◽  
Shuichi Abe
Keyword(s):  
Energy Losses ◽  
X Ray

On the problem of filtered images in chemical analysis

1978 ◽  
Vol 36 (1) ◽  
pp. 538-539
Author(s):  
G. Zanchi ◽  
J. Sevely ◽  
B. Jouffrey
Keyword(s):  
Chemical Analysis ◽  
Energy Loss ◽  
High Spatial Resolution ◽  
Energy Losses ◽  
List Type ◽  
Characteristic Energy ◽  
X Ray ◽  
Energy Filtering ◽  
Imaging Properties ◽  
Loss Range

As was proposed in several recent review papers (for instance 1-3) it is interesting to use electron energy losses corresponding to inner shell excitations by incident electrons to perform chemical analysis. One of the main advantages of the inner shell excitation spectroscopy (ISES) is that it is essentially available for light elements, contrary to characteristic X ray emission spectroscopy.Two methods can be used :- energy analysis : energy loss spectra are obtained from selected projected area of the sample and elemental characteristic energy losses are detected;- image energy filtering : images are formed by selecting electrons in an energy loss range which contains a characteristic energy loss. They show a map of the distribution of a given element in the object with a high spatial resolution.Combining these two methods is quite essential to perform chemical analysis. Such studies can be achieved in CTEM by means of an energy filtering system preserving the imaging properties of the microscope.

scholarly journals Interface-Induced Plasmon Nonhomogeneity in Nanostructured Metal-Dielectric Planar Metamaterial

2015 ◽  
Vol 2015 ◽  
pp. 1-9 ◽  
Author(s):  
A. I. Kovalev ◽  
D. L. Wainstein ◽  
A. Yu. Rashkovskiy ◽  
R. Gago ◽  
F. Soldera ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Photoelectron Spectroscopy ◽  
Electron Spectroscopy ◽  
Auger Electron ◽  
Electronic States ◽  
Energy Losses ◽  
Critical Layer Thickness ◽  
Characteristic Energy ◽  
X Ray ◽  
Nanostructured Metal

Transformations of the electronic structure in thin silver layers in metal-dielectric (TiAlN/Ag) multilayer nanocomposite were investigated by a set of electron spectroscopy techniques. Localization of the electronic states in the valence band and reduction of electron concentration in the conduction band was observed. This led to decreasing metallic properties of silver in the thin films. A critical layer thickness of 23.5 nm associated with the development of quantum effects was determined by X-ray photoelectron spectroscopy. Scanning Auger electron microscopy of characteristic energy losses provided images of plasmon localization in the Ag layers. The nonuniformity of plasmon intensities distribution near the metal-nitride interfaces was assessed experimentally.

scholarly journals Single atom spectroscopy: Decreased scattering delocalization at high energy losses, effects of atomic movement and X-ray fluorescence yield

2016 ◽  
Vol 160 ◽  
pp. 239-246 ◽  
Author(s):  
Luiz H.G. Tizei ◽  
Yoko Iizumi ◽  
Toshiya Okazaki ◽  
Ryo Nakanishi ◽  
Ryo Kitaura ◽  
...  
Keyword(s):  
High Energy ◽  
Fluorescence Yield ◽  
Single Atom ◽  
Energy Losses ◽  
X Ray

scholarly journals Resistivity Enhancement of Sr-Hexaferrite Using Rare Earth Dopant to Minimize Energy Losses

2018 ◽  
Vol 778 ◽  
pp. 195-199 ◽  
Author(s):  
Nahall Niazi ◽  
Omer Farooq ◽  
Fatima Tuz Zahra ◽  
Muhammad Anis-ur-Rehman
Keyword(s):  
Room Temperature ◽  
Single Phase ◽  
Hexagonal Structure ◽  
Precipitation Method ◽  
Strontium Hexaferrite ◽  
Energy Losses ◽  
X Ray Diffraction ◽  
High Frequencies ◽  
X Ray ◽  
Co Precipitation

Strontium hexaferrite is a material of choice due its various magnetic applications. Energy losses are a prominent issue in these magnetic materials. To lower these energy losses, we need to improve the resistivity by reducing eddy current losses. In this work nanoparticles of Gadolinium (Gd) doped Sr-hexaferrite (SrFe12-xGdxO19 x =0 .0, 0.1) have been synthesized by co-precipitation method. Structural analysis was done by using X-ray diffraction technique (XRD). It was found that the formation of single phase i.e. hexagonal structure has been achieved when the samples were sintered at 920°C for 20 minutes. AC electrical properties such as conductivity (𝜎ac), dielectric constant (ε′), dielectric loss (tanδ) and impedance (Z); real (Z') and imaginary (Z") parts have been studied as a function of frequency at room temperature. Aim of the work was to enhance the resistivity and was successfully achieved. Gd doped sample is proposed as an energy efficient material to be used in devices working at high frequencies.

Scanning Transmission Energy Analyzing Microscope (“STEAM”)

1974 ◽  
Vol 32 ◽  
pp. 440-441
Author(s):  
Jack A. Horner
Keyword(s):  
Resolution Enhancement ◽  
Energy Losses ◽  
Thin Sections ◽  
X Ray ◽  
The Past ◽  
Recent Interest ◽  
Scanning Transmission ◽  
Electron Energy Loss ◽  
Scattered Component ◽  
Transmission Energy

The use of electron energy loss analyzers has been rather extensive in recent years. Most analyzers have been designed to discriminate losses in the range 0 < ΔE < 100eV or to reject the inelastically scattered component of transmitted beams for the purpose of contrast and resolution enhancement. More recent interest has been directed towards detection of energy losses associated with inner shell ionizations, simultaneous with characteristic X-ray emission. Such an apparatus has been under development in this laboratory for the past 2½ years. The design and use of this device for elemental analysis in thin sections is described.

Comparison of the Characteristic Energy Losses of Electrons with the Fine Structure of the X-Ray Absorption Spectra

1956 ◽  
Vol 101 (5) ◽  
pp. 1460-1467 ◽  
Author(s):  
Lewis B. Leder ◽  
H. Mendlowitz ◽  
L. Marton
Keyword(s):  
Fine Structure ◽  
Absorption Spectra ◽  
Energy Losses ◽  
Characteristic Energy ◽  
X Ray ◽  
X Ray Absorption

scholarly journals Is PSR J0855−4644 responsible for the 1.4 TeV electron spectral bump hinted by DAMPE?

2020 ◽  
Vol 500 (4) ◽  
pp. 4573-4577
Author(s):  
Yiwei Bao ◽  
Yang Chen ◽  
Siming Liu
Keyword(s):  
Dark Matter ◽  
Spectral Feature ◽  
Cosmic Ray ◽  
High Energy ◽  
Radiative Energy ◽  
Energy Losses ◽  
Pulsar Wind Nebulae ◽  
X Ray ◽  
High Energy Electrons ◽  
Pulsar Wind

ABSTRACT DAMPE observation on the cosmic ray electron spectrum hints a narrow excess at ∼1.4 TeV. Although the excess can be ascribed to dark matter particles, pulsars and pulsar wind nebulae are believed to be more natural astrophysical origins: electrons injected from nearby pulsars at their early ages can form a bump-like feature in the spectrum due to radiative energy losses. In this paper, with a survey of nearby pulsars, we filter out four pulsars that may have notable contributions to ∼1.4 TeV cosmic ray electrons. Among them, PSR J0855−4644 has a spin-down luminosity more than 50 times higher than others and presumably dominates the electron fluxes from them. X-ray observations on the inner compact part (which may represent a tunnel for the transport of electrons from the pulsar) of PWN G267.0−01.0 are then used to constrain the spectral index of high-energy electrons injected by the pulsar. We show that high-energy electrons released by PSR J0855−4644 could indeed reproduce the 1.4 TeV spectral feature hinted by the DAMPE with reasonable parameters.

Sign in / Sign up

Export Citation Format

Share Document