Sol–gel tantalum pentoxide thin films with tunable refractive index for optical sensing applications

2020 ◽  
Vol 52 (10) ◽  
Author(s):  
R. Georgiev ◽  
B. Georgieva ◽  
K. Lazarova ◽  
M. Vasileva ◽  
T. Babeva
Polymers ◽  
2021 ◽  
Vol 13 (3) ◽  
pp. 478
Author(s):  
Wan Mohd Ebtisyam Mustaqim Mohd Daniyal ◽  
Yap Wing Fen ◽  
Silvan Saleviter ◽  
Narong Chanlek ◽  
Hideki Nakajima ◽  
...  

In this study, X-ray photoelectron spectroscopy (XPS) was used to study chitosan–graphene oxide (chitosan–GO) incorporated with 4-(2-pyridylazo)resorcinol (PAR) and cadmium sulfide quantum dot (CdS QD) composite thin films for the potential optical sensing of cobalt ions (Co2+). From the XPS results, it was confirmed that carbon, oxygen, and nitrogen elements existed on the PAR–chitosan–GO thin film, while for CdS QD–chitosan–GO, the existence of carbon, oxygen, cadmium, nitrogen, and sulfur were confirmed. Further deconvolution of each element using the Gaussian–Lorentzian curve fitting program revealed the sub-peak component of each element and hence the corresponding functional group was identified. Next, investigation using surface plasmon resonance (SPR) optical sensor proved that both chitosan–GO-based thin films were able to detect Co2+ as low as 0.01 ppm for both composite thin films, while the PAR had the higher binding affinity. The interaction of the Co2+ with the thin films was characterized again using XPS to confirm the functional group involved during the reaction. The XPS results proved that primary amino in the PAR–chitosan–GO thin film contributed more important role for the reaction with Co2+, as in agreement with the SPR results.


2000 ◽  
Author(s):  
Qinyuan Zhang ◽  
Jun Shen ◽  
Guangming Wu ◽  
Bin Zhou ◽  
Junxia Lu ◽  
...  

Sensors ◽  
2021 ◽  
Vol 21 (22) ◽  
pp. 7452
Author(s):  
Muhammad A. Butt ◽  
Andrzej Kaźmierczak ◽  
Cuma Tyszkiewicz ◽  
Paweł Karasiński ◽  
Ryszard Piramidowicz

In this paper, a novel and cost-effective photonic platform based on silica–titania material is discussed. The silica–titania thin films were grown utilizing the sol–gel dip-coating method and characterized with the help of the prism-insertion technique. Afterwards, the mode sensitivity analysis of the silica–titania ridge waveguide is investigated via the finite element method. Silica–titania waveguide systems are highly attractive due to their ease of development, low fabrication cost, low propagation losses and operation in both visible and near-infrared wavelength ranges. Finally, a ring resonator (RR) sensor device was modelled for refractive index sensing applications, offering a sensitivity of 230 nm/RIU, a figure of merit (FOM) of 418.2 RIU−1, and Q-factor of 2247.5 at the improved geometric parameters. We believe that the abovementioned integrated photonics platform is highly suitable for high-performance and economically reasonable optical sensing devices.


2008 ◽  
Vol 516 (7) ◽  
pp. 1499-1502 ◽  
Author(s):  
V. Musat ◽  
E. Fortunato ◽  
A.M. Botelho do Rego ◽  
R. Monteiro

2020 ◽  
Vol 7 (1) ◽  
pp. 016439 ◽  
Author(s):  
F Medjaldi ◽  
A Bouabellou ◽  
Y Bouachiba ◽  
A Taabouche ◽  
K Bouatia ◽  
...  

1997 ◽  
Author(s):  
Michael T. Murtagh ◽  
Hyeog-Chan Kwon ◽  
Mahmoud R. Shahriari

2002 ◽  
Vol 17 (10) ◽  
pp. 2652-2659 ◽  
Author(s):  
Reji Thomas ◽  
Shoichi Mochizuki ◽  
Toshiyuki Mihara ◽  
Tadashi Ishida

Ferroelectric lead lanthanum gadolinium zirconium titanate (PLGZT) thin films were prepared by the sol-gel spin coating technique. Three-step preannealing heat treatment was employed to prepare crack-free films. Various types of substrates, and the effects of the seed layer and annealing temperature on the perovskite crystallization were studied. Phase-pure perovskite crystallization was obtained by annealing the films on PbTiO3/Pt/Ti/Si substrates at 700 °C for 30 min. The Auger electron spectroscopy depth profile showed uniform elemental distribution along the thickness except the surface and interface regions. Dielectric constant and loss tangent at 10 kHz were 1000 and 0.06, respectively. Remanent polarization (Pr) and coercive field (Ec) were 11.8 μC/cm2 and 71 kV/cm, respectively. The direct band gap energy was 3.55 eV for the amorphous films. The refractive index and extinction coefficient at 610 nm for amorphous PLGZT films were 2.14 and 0.0028, respectively. The dispersion of the refractive index was interpreted in terms of a single electronic oscillator at 6.06 eV.


2014 ◽  
Vol 597 ◽  
pp. 165-169
Author(s):  
Jie Hong Lei ◽  
Ri Dong Zhang

The porous sol-gel silica thin films were prepared on silicon substrate by the dip coating process. The surface roughness and microstructure of the film was measured by optical microscopy and AFM .Coating thickness and refractive index were measured by ellipsometry method. Influence of withdrawal speed and concentration of colloid was investigated for the thickness of silica. The relation of the thickness and withdrawal speed was fitted by the linear and power functions, and the results were analyzed and compared. It was found that the films with the same thickness prepared by different concentrations of colloid have different refractive indexes. The experimental results indicated that the thickness and refractive index of the film can be controlled by changing the withdrawal speed and colloid concentration.


1997 ◽  
Vol 474 ◽  
Author(s):  
Junmo Koo ◽  
Changho Lee ◽  
Kwangsoo No ◽  
Byeong-Soo Bae

ABSTRACTLead lanthanum titanate thin films have been prepared on MgO and sapphire substrates by sol-gel method. XRD analyses confirm that the PLT films fabricated on MgO(lOO) and c-plane sapphire substrates grow preferentially with (100) and (111) orientations, respectively. The PLT films with a high La content have a low refractive index due to the decrease of the refractive index anisotropy. The propagation losses in PLT films measured, using He-Ne laser light and the prism coupling method decrease as the La content increases. This is due to the reduction of the refractive index anisotropy and the surface scattering by the surface roughness as a function of La content in the film.


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