Design of a high-performance 12T SRAM cell for single event upset tolerance

2021 ◽  
Vol 64 (11) ◽  
Author(s):  
Chunhua Qi ◽  
Yanqing Zhang ◽  
Guoliang Ma ◽  
Chaoming Liu ◽  
Tianqi Wang ◽  
...  
Keyword(s):  
High Performance ◽  
Single Event Upset ◽  
Single Event ◽  
Sram Cell

Impact of Single Event Upset on Voltage and Current Behaviors of CNTFET SRAM and a Comparison with CMOS SRAM

2016 ◽  
Vol 26 (02) ◽  
pp. 1750020
Author(s):  
T. R. Rajalakshmi ◽  
R. Sudhakar
Keyword(s):  
Carbon Nanotubes ◽  
Carbon Nanotube ◽  
High Performance ◽  
High Stability ◽  
Single Event Upset ◽  
Single Event ◽  
Sram Cell ◽  
Current Characteristics ◽  
The Impact ◽  
In Cells

Carbon nanotubes (CNTs) provide a better alternative of silicon when it comes to nanoscales. Thanks to the high stability and high performance of carbon nanotube, CNT-based FET (CNTFET) devices are gaining popularity of late. They provide high packaging densities. Not much study had been done to analyze the characteristics of CNTFET SRAM in the presence of single event upset (SEU). The aim of this paper is to analyze the way in which SEU brings alterations in CNTFET SRAM characteristics and perform its comparison with respect to CMOS 6T SRAM. This paper analyzes the impact of SEU on voltage and current characteristics in CNTFET-based SRAM cell during three different conditions —read, write and hold modes. In the analysis, CNTFET SRAM showed that even small amount of radiations can cause flipping in cells and special circuitries are required to detect and correct the errors for SEU affected SRAM.

Impact of energy straggle on proton-induced single event upset test in a 65-nm SRAM cell

2017 ◽  
Vol 26 (8) ◽  
pp. 088501 ◽  
Author(s):  
Bing Ye ◽  
Jie Liu ◽  
Tie-Shan Wang ◽  
Tian-Qi Liu ◽  
Jie Luo ◽  
...  
Keyword(s):  
Single Event Upset ◽  
Single Event ◽  
Sram Cell

scholarly journals A novel single event upset hardened CMOS SRAM cell

2012 ◽  
Vol 9 (3) ◽  
pp. 140-145 ◽  
Author(s):  
Guohe Zhang ◽  
Jun Shao ◽  
Feng Liang ◽  
Dongxuan Bao
Keyword(s):  
Single Event Upset ◽  
Single Event ◽  
Sram Cell
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