scholarly journals Exploring the friction and wear behaviors of Ag-Mo hybrid modified thermosetting polyimide composites at high temperature

Friction ◽  
2019 ◽  
Vol 8 (5) ◽  
pp. 893-904 ◽  
Author(s):  
Chunjian Duan ◽  
Ren He ◽  
Song Li ◽  
Mingchao Shao ◽  
Rui Yang ◽  
...  
Keyword(s):  
Electron Microscope ◽  
High Temperature ◽  
High Performance ◽  
Friction And Wear ◽  
Bulk Temperature ◽  
Transmission Electron ◽  
Different Temperatures ◽  
New Type ◽  
Polyimide Composites

AbstractPolyimide composites have been extensively used as motion components under extreme conditions for their thermal stability and special self-lubricating performance. In the present study, Ag-Mo hybrids as lubricant fillers were incorporated into thermosetting polyimide to prepare a new type of tribo-materials (TPI-1) at high temperature. Comprehensive investigations at different temperatures reveal that the newly developed TPI-1 exhibits a better reduction in friction and wear rate below 100 °C, but all of them increase significantly when the bulk temperature exceeds 250 °C. The wear mechanisms demonstrated that sandwich-like tribofilms with different layers were established at different temperatures, which was further verified by characterization of scanning electron microscope (SEM), Raman spectroscopy, and transmission electron microscope (TEM). Considering the high-performance TPI coupled with Ag-Mo hybrids, we anticipate that further exploration would provide guidance for designing TPI tribo-materials that would be used at high temperatures.

An Electron Microscope Study of Interdiffusion and Compound Formation in Ta-Au Thin Films

1973 ◽  
Vol 31 ◽  
pp. 32-33 ◽  
Author(s):  
T. C. Tisone ◽  
S. Lau
Keyword(s):  
Electron Microscope ◽  
Electron Microscope Study ◽  
Thermally Grown Oxide ◽  
Ion Milling ◽  
Compound Formation ◽  
Technology Application ◽  
Transmission Electron ◽  
Before And After ◽  
Au Thin Films

In a study of the properties of a Ta-Au metallization system for thin film technology application, the interdiffusion between Ta(bcc)-Au, βTa-Au and Ta2M-Au films was studied. Considered here is a discussion of the use of the transmission electron microscope(TEM) in the identification of phases formed and characterization of the film microstructures before and after annealing.The films were deposited by sputtering onto silicon wafers with 5000 Å of thermally grown oxide. The film thicknesses were 2000 Å of Ta and 2000 Å of Au. Samples for TEM observation were prepared by ultrasonically cutting 3mm disks from the wafers. The disks were first chemically etched from the silicon side using a HNO3 :HF(19:5) solution followed by ion milling to perforation of the Au side.

Characterization of submicrometer fluid Inclusions in minerals by Analytical/Transmission Electron Microscopy and electron diffraction

1990 ◽  
Vol 48 (4) ◽  
pp. 424-424
Author(s):  
George Guthrie ◽  
David Veblen
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Electron Diffraction ◽  
Light Microscopy ◽  
Fluid Inclusions ◽  
Energy Dispersive Spectrometer ◽  
Analytical Transmission Electron Microscopy ◽  
Transmission Electron

The nature of a geologic fluid can often be inferred from fluid-filled cavities (generally <100 μm in size) that are trapped during the growth of a mineral. A variety of techniques enables the fluids and daughter crystals (any solid precipitated from the trapped fluid) to be identified from cavities greater than a few micrometers. Many minerals, however, contain fluid inclusions smaller than a micrometer. Though inclusions this small are difficult or impossible to study by conventional techniques, they are ideally suited for study by analytical/ transmission electron microscopy (A/TEM) and electron diffraction. We have used this technique to study fluid inclusions and daughter crystals in diamond and feldspar.Inclusion-rich samples of diamond and feldspar were ion-thinned to electron transparency and examined with a Philips 420T electron microscope (120 keV) equipped with an EDAX beryllium-windowed energy dispersive spectrometer. Thin edges of the sample were perforated in areas that appeared in light microscopy to be populated densely with inclusions. In a few cases, the perforations were bound polygonal sides to which crystals (structurally and compositionally different from the host mineral) were attached (Figure 1).

Automatic analysis of Kikuchi diffraction patterns

1994 ◽  
Vol 52 ◽  
pp. 900-901
Author(s):  
H. Weiland ◽  
D. P. Field
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
Spatial Resolution ◽  
Relevant Information ◽  
Crystalline Materials ◽  
Large Size ◽  
Transmission Electron ◽  
New Type ◽  
Diffraction Patterns ◽  
Orientation Determination

Recent advances in the automatic indexing of backscatter Kikuchi diffraction patterns on the scanning electron microscope (SEM) has resulted in the development of a new type of microscopy. The ability to obtain statistically relevant information on the spatial distribution of crystallite orientations is giving rise to new insight into polycrystalline microstructures and their relation to materials properties. A limitation of the technique in the SEM is that the spatial resolution of the measurement is restricted by the relatively large size of the electron beam in relation to various microstructural features. Typically the spatial resolution in the SEM is limited to about half a micron or greater. Heavily worked structures exhibit microstructural features much finer than this and require resolution on the order of nanometers for accurate characterization. Transmission electron microscope (TEM) techniques offer sufficient resolution to investigate heavily worked crystalline materials.Crystal lattice orientation determination from Kikuchi diffraction patterns in the TEM (Figure 1) requires knowledge of the relative positions of at least three non-parallel Kikuchi line pairs in relation to the crystallite and the electron beam.

scholarly journals Characterization of Li-rich layered oxides by using transmission electron microscope

2017 ◽  
Vol 2 (3) ◽  
pp. 174-185 ◽  
Author(s):  
Hu Zhao ◽  
Bao Qiu ◽  
Haocheng Guo ◽  
Kai Jia ◽  
Zhaoping Liu ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Layered Oxides ◽  
Transmission Electron

Characterization of JEOL 3000f TEM Equipped for Electron Holography

2000 ◽  
Vol 6 (S2) ◽  
pp. 228-229
Author(s):  
M. A. Schofield ◽  
Y. Zhu
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Design Of Experiment ◽  
Electron Holography ◽  
Fringe Spacing ◽  
Interference Fringes ◽  
Transmission Electron ◽  
Careful Design

Quantitative off-axis electron holography in a transmission electron microscope (TEM) requires careful design of experiment specific to instrumental characteristics. For example, the spatial resolution desired for a particular holography experiment imposes requirements on the spacing of the interference fringes to be recorded. This fringe spacing depends upon the geometric configuration of the TEM/electron biprism system, which is experimentally fixed, but also upon the voltage applied to the biprism wire of the holography unit, which is experimentally adjustable. Hence, knowledge of the holographic interference fringe spacing as a function of applied voltage to the electron biprism is essential to the design of a specific holography experiment. Furthermore, additional instrumental parameters, such as the coherence and virtual size of the electron source, for example, affect the quality of recorded holograms through their effect on the contrast of the holographic fringes.

scholarly journals MICROWAVE ASSISTED SYNTHESIS AND STRUCTURAL CHARACTERIZATION OF NICKEL OXIDE NANOPARTICLES

2016 ◽  
Vol 3 (1) ◽  
pp. 12-14
Author(s):  
Kalpanadevi K ◽  
Manimekalai R
Keyword(s):  
Electron Microscope ◽  
Nickel Oxide ◽  
Structural Characterization ◽  
Nano Particles ◽  
Microwave Assisted Synthesis ◽  
Nio Nanoparticles ◽  
Nickel Oxide Nanoparticles ◽  
Transmission Electron ◽  
Good Crystallinity

Nickel oxide (NiO) nano-particles were produced via a simple microwave method from the Ni(OH)2 precursor, which was obtained by slow drop-wise addition of 0.1M sodium hydroxide to 0.1M nickel nitrate. The mixture was vigorously stirred until the pH reached 7.2. The mixture was then irradiated with microwave to deposit Ni(OH)2 at a better precipitation rate. Drying the precipitate at 320°C resulted in formation of NiO nanoparticles. High Resolution Transmission Electron Microscope (HRTEM), Scanning Electron Microscope (SEM) and X-ray diffraction (XRD), employed for the structural characterization of the as-prepared NiO nanoparticles, revealed their good crystallinity and high-purity. Microwave irradiation increased homogeneity and decreased the mean particle size of the produced NiO particles.

Attritious Wear of Silicon Carbide

1976 ◽  
Vol 98 (4) ◽  
pp. 1125-1134 ◽  
Author(s):  
R. Komanduri ◽  
M. C. Shaw
Keyword(s):  
Silicon Carbide ◽  
Electron Microscope ◽  
High Temperature ◽  
High Speed ◽  
Layer By Layer ◽  
Wear Area ◽  
Work Material ◽  
Transmission Electron ◽  
Metal Silicides ◽  
Boundary Fracture

Attritious wear of silicon carbide in simulated grinding tests against a cobalt base superalloy at high speed and extremely small feed rate was studied using a scanning electron microscope (SEM) and an auger electron spectroscope (AES). In many cases the wear area of silicon carbide was found to be concave rather than planar in shape. Several microcracks and grain boundary fracture were also observed. No evidence of metal build-up was observed on silicon carbide which was not the case with aluminum oxide. AES study of the rubbed surface on the work material and transmission electron microscope (TEM) investigation of the wear debris suggest that attritious wear of silicon carbide is due to one or more of the following mechanisms: 1 – Preferential removal of surface atoms on the abrasive, layer by layer, by oxidation under high temperature and a favorably directed shear stress; 2 – disassociation of silicon carbide at high temperature and (a) diffusion of silicon into the work material and formation of metal silicides and (b) diffusion of carbon into the work material and formation of unstable metal carbides (in the present case Ni3C and Co3C) which decompose during cooling to metal and carbon atoms; 3 – pinocoidal cleavage fracture of silicon carbide on basal planes c(0001) resulting in the removal of many micron-sized crystallites.

Fabrication and In Situ Transmission Electron Microscope Characterization of Free-Standing Graphene Nanoribbon Devices

ACS Nano ◽  
2016 ◽  
Vol 10 (1) ◽  
pp. 1475-1480 ◽  
Author(s):  
Qing Wang ◽  
Ryo Kitaura ◽  
Shoji Suzuki ◽  
Yuhei Miyauchi ◽  
Kazunari Matsuda ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Graphene Nanoribbon ◽  
Free Standing ◽  
Transmission Electron
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