Attritious Wear of Silicon Carbide

1976 ◽  
Vol 98 (4) ◽  
pp. 1125-1134 ◽  
Author(s):  
R. Komanduri ◽  
M. C. Shaw
Keyword(s):  
Silicon Carbide ◽  
Electron Microscope ◽  
High Temperature ◽  
High Speed ◽  
Layer By Layer ◽  
Wear Area ◽  
Work Material ◽  
Transmission Electron ◽  
Metal Silicides ◽  
Boundary Fracture

Attritious wear of silicon carbide in simulated grinding tests against a cobalt base superalloy at high speed and extremely small feed rate was studied using a scanning electron microscope (SEM) and an auger electron spectroscope (AES). In many cases the wear area of silicon carbide was found to be concave rather than planar in shape. Several microcracks and grain boundary fracture were also observed. No evidence of metal build-up was observed on silicon carbide which was not the case with aluminum oxide. AES study of the rubbed surface on the work material and transmission electron microscope (TEM) investigation of the wear debris suggest that attritious wear of silicon carbide is due to one or more of the following mechanisms: 1 – Preferential removal of surface atoms on the abrasive, layer by layer, by oxidation under high temperature and a favorably directed shear stress; 2 – disassociation of silicon carbide at high temperature and (a) diffusion of silicon into the work material and formation of metal silicides and (b) diffusion of carbon into the work material and formation of unstable metal carbides (in the present case Ni3C and Co3C) which decompose during cooling to metal and carbon atoms; 3 – pinocoidal cleavage fracture of silicon carbide on basal planes c(0001) resulting in the removal of many micron-sized crystallites.

scholarly journals Fabrication and evaluation of slow-release lignin-based avermectin nano-delivery system with UV-shielding property

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Dongmei Mo ◽  
Xiangying Li ◽  
Yong Chen ◽  
Yang Jiang ◽  
Chunfang Gan ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Controlled Release ◽  
Delivery System ◽  
High Speed ◽  
Large Scale ◽  
Diazonium Salt ◽  
Sodium Lignosulfonate ◽  
Ultrasonic Dispersion ◽  
Transmission Electron ◽  
The Stability

AbstractNanopesticide is one of the best pesticide formulation technologies to overcome the disadvantages of traditional pesticides, which has received great attention from the international community. Using high-speed emulsification and ultrasonic dispersion technology, an avermectin nano-delivery system (Av-NDs) with a particle size of 80–150 nm was prepared through embedding the pesticide molecule utilizing the cross-linking reaction between sodium lignosulfonate and p-phenylenediamine diazonium salt. The formulation and composition of Av-NDs were optimized, the morphology of Av-NDs was analyzed by scanning electron microscope, transmission electron microscope and dynamic light scattering, and the structure of Av-NDs was characterized by UV, IR and 1H NMR. Anti-photolysis and controlled-release tests show that the stability of Av-NDs is 3–4 times of the original avermectin (Av) and possesses the pH-responsive controlled release property. Furthermore, the insecticidal activity of Av-NDs is better than that of avermectin suspension concentrate (Av-SC). The Av-NDs with anti-photolysis and controlled-release characteristics is suitable for large-scale industrial production and is capable to be utilized as effective insecticide in the field.

scholarly journals Formation and evolution of porosity during high temperature creep of a nickel-based single crystal superalloy

2020 ◽  
Vol 155 ◽  
pp. 01005
Author(s):  
Weiwei Liu ◽  
Yuanyuan Guo ◽  
Mai Zhang ◽  
Jian Zhang
Keyword(s):  
Electron Microscope ◽  
High Temperature ◽  
Single Crystal ◽  
Volume Fraction ◽  
Great Influence ◽  
Single Crystal Superalloy ◽  
Creep Process ◽  
Steady Creep ◽  
Transmission Electron ◽  
Formation And Evolution

A Re-containing single-crystal superalloy was used to research the high temperature low stress creep behavior. Transmission electron microscope, scanning electron microscope and some other research methods are employed. The results and analysis are summarized below: Two mechanisms for the steady creep are found in this experiment. The volume fraction of pores after creep test at 1100°C increased more than 2 times compared with that before test, but the increasing at 1000°C is relatively small, which reveals that temperature has an great influence on the formation of pore during creep; There are two types of pores associated with fracture during the creep process. One is the casting shrinkage located between the interdentritic, which is formed in the solidification of the alloy. Another type of pore is nucleated and growing during the creep deformation.

Investigation of Ni Doped Ge-Te Materials for High Temperature Phase Change Memory Applications

2016 ◽  
Vol 848 ◽  
pp. 460-465
Author(s):  
Liang Liang Cao ◽  
Liang Cai Wu ◽  
Zhi Tang Song ◽  
Wen Qing Zhu ◽  
Yong Hui Zheng ◽  
...  
Keyword(s):  
High Temperature ◽  
Phase Change ◽  
High Speed ◽  
Random Access ◽  
High Temperature Phase ◽  
Temperature Phase ◽  
Change Behavior ◽  
Transmission Electron ◽  
Ni Addition ◽  
Memory Applications

Ni-doped Ge-Te (Ni-GT) material was proposed and investigated for phase change random access memory (PCRAM) applications. With Ni addition, the crystallization temperature, data retention ability and crystallization speed were obviously improved. The surface roughness of crystalline Ni-GT films was decreased by Ni incorporation. Moreover, temperature dependent transmission electron microscopy (TEM) was applied to investigate the phase change behavior of Ni-GT films. All the experimental results demonstrated that Ni-GT material has potential for high-speed PCRAM applications in high temperature environment.

Growth of TiN/AlN Superlattice by Pulsed Laser Deposition

2002 ◽  
Vol 750 ◽  
Author(s):  
H. Wang ◽  
A. Gupta ◽  
Ashutosh Tiwari ◽  
X. Zhang ◽  
J. Narayan
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Pulsed Laser Deposition ◽  
High Speed ◽  
Pulsed Laser ◽  
Laser Deposition ◽  
Internal Stresses ◽  
Layer By Layer ◽  
Special Configuration ◽  
Transmission Electron

ABSTRACTTiN-AlN binary-components have attracted a lot of interests in coatings of high speed cutting tools, due to their higher oxidation resistance, higher hardness, lower internal stresses and better adhesion. Especially, nanometer-scale multilayer structures of AlN/TiN show superior structural and mechanical properties due to their tremendous interface area and become one of the promising candidates for superhard coatings. Here we present a novel method to grow highly aligned TiN/AlN superlattice by pulsed laser deposition. In this method TiN and AlN targets are arranged in a special configuration that they can be ablated in sequence, giving alternate layer by layer growth of TiN(1nm)/AlN(4nm). X-ray diffraction and transmission electron microscopy (TEM) analysis showed the structure to be cubic for both TiN and AlN in the nanoscale multilayers. Microstructure and uniformity for the superlattice structure were studied by TEM and Scanning transmission electron microscopy with Z-contrast (STEM). Nanoindentation results indicated a higher hardness for this new structure than pure AlN and rule-of-mixtures value. Four point probe electrical resistivity measurements showed overall insulating behavior.

Uniform silicon carbide doped Sb2Te nanomaterial for high temperature and high speed PCM applications

2016 ◽  
Vol 664 ◽  
pp. 591-594 ◽  
Author(s):  
Yun Meng ◽  
Qiuming She ◽  
Liangliang Cao ◽  
Yan Chen ◽  
Peigao Han ◽  
...  
Keyword(s):  
Silicon Carbide ◽  
High Temperature ◽  
High Speed

Applications of Electron Tomography on Advanced DRAM

2007 ◽  
Author(s):  
Jian-Shing Luo ◽  
Jeremy D. Russell ◽  
Lang-Yu Huang ◽  
Tsang-Pei Chen
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Barrier Layer ◽  
High Speed ◽  
Electron Tomography ◽  
Random Access ◽  
Case Examples ◽  
Step Coverage ◽  
Transmission Electron ◽  
Stem Tomography

Abstract It is well known that pursuing the miniaturization of devices to lower the cost and increase high-speed performance are extremely important goals for dynamic random access memory (DRAM). Therefore, electron tomography has a high potential for application to novel generation DRAMs. In this article, several real-case examples of electron tomography on 90 nm technology DRAM, including barrier layer step coverage, via fill process observations and defect analysis are reported. These cases were demonstrated to show the applications of bright field-transmission electron microscope (BF-TEM) and HADDF- scanning transmission electron microscope (STEM) tomography to analyze barrier layer step coverage, defects, and W fill quality in advanced DRAM. By appropriate use of BF-TEM or HAADF STEM tomography, optimal information for failure analysis, root cause clarification, and subsequent process improvements can be obtained. Electron tomography holds significant advantages in comparison to traditional TEM imaging for appropriate cases.

Preparation and characteristics of sepiolite-waterborne polyurethane composites

2021 ◽  
Vol 0 (0) ◽  
Author(s):  
Tong Xu ◽  
Hong Xu ◽  
Yi Zhong ◽  
Linping Zhang ◽  
Di Qian ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Waterborne Polyurethane ◽  
Elemental Content ◽  
Layer By Layer ◽  
Silane Coupling Agents ◽  
Scanning Calorimetry ◽  
X Ray ◽  
Transmission Electron ◽  
Organically Modified ◽  
Polyurethane Composites

Abstract A kind of organic/inorganic composite material composed of waterborne polyurethane and sepiolite was prepared in this work. Sepiolite was organically modified by three kinds of silane coupling agents, and then compounded with waterborne polyurethane through layer-by-layer method in order to prepare composite materials. X-ray diffraction (XRD) and Fourier transform infrared (FTIR) show the crystal and chemistry structure of sepiolite samples, and confirmed the preparation of organic sepiolite. Scanning electron microscope (SEM) and energy dispersive X-ray spectroscopy (EDS) showed the surface microstructure and elemental content of sepiolite and organic sepiolite, and was consistent with the XRD results. Transmission electron microscope (TEM) examination of waterborne polyurethane composites surfaces showed that sepiolite particles were regularly dispersed in the waterborne polyurethane matrix. Thermal resistance of waterborne polyurethane composites was determined by thermogravimetry analyzer (TG) and derivative thermogravimetry analyzer (DTG), differential scanning calorimetry (DSC), gas chromatography (GC), and mass chromatography (MS). Mechanical behavior was examined by tensile strength tester, showed higher break strength than that of the control waterborne polyurethane. Therefore, organically modified sepiolite was considered to be a kind of wonderful inorganic material that could be used to improve the thermal stability and mechanical property of polymer.

Chemical Structure Analysis of a Σ 9 Grain Boundary in α-SiC by Arhvtem

2002 ◽  
Vol 727 ◽  
Author(s):  
Eriko Takuma ◽  
Hideki Ichinose
Keyword(s):  
Silicon Carbide ◽  
Electron Microscope ◽  
Grain Boundary ◽  
Rigid Body ◽  
Chemical Structure ◽  
Boundary Energy ◽  
The Other ◽  
Atomic Resolution ◽  
Grain Boundary Energy ◽  
Transmission Electron

AbstractGrain boundary chemical structure of high purity α silicon carbide was investigated by an atomic resolution high voltage transmission electron microscope (ARHVTEM). Each of a ‘darker’ spots and each of the ‘brighter’ spots in the image have been identified to be silicon (Si) and carbon (C). Two (0001)/(1107) Σ 9 CSL grain boundaries were observed. One boundary showed a rigid body translation of 1/3 <1100> to the component crystals and the other did not. The unit period of the boundary was determined to 2.26 nm along >1120<. Two 6-membered, four 5-membered and 7-membered rings build up the boundary. Each ring consists of three C-C pairs, one Si-Si pair and non-paired Si atoms. In the case without the rigid body translation the number of lone Si atoms are four and only two Si atoms were determined in the other case. The observed structures suggest that the chemical structure of a grain boundary dominantly influences the grain boundary energy.

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