Comments on “energy dispersive x-ray measurements of thin metal foils”

1977 ◽  
Vol 11 (4) ◽  
pp. 256-258 ◽  
Author(s):  
Nestor J. Zaluzec ◽  
John B. Woodhouse ◽  
Hamish L. Fraser
Keyword(s):  
Thin Metal ◽  
Energy Dispersive ◽  
X Ray ◽  
Metal Foils

Energy Dispersive X-Ray Measurements of thin Metal Foils

1976 ◽  
Vol 34 ◽  
pp. 426-427
Author(s):  
J. Bentley ◽  
E. A. Kenik
Keyword(s):  
Materials Science ◽  
Energy Dispersive Spectrometer ◽  
Thin Foil ◽  
Thin Metal ◽  
Energy Dispersive ◽  
Thin Specimen ◽  
X Ray ◽  
Metal Foils ◽  
Small Probe ◽  
Scanning Transmission

Instruments combining a 100 kV transmission electron microscope (TEM) with scanning transmission (STEM), secondary electron (SEM) and x-ray energy dispersive spectrometer (EDS) attachments to give analytical capabilities are becoming increasingly available and useful. Some typical applications in the field of materials science which make use of the small probe size and thin specimen geometry are the chemical analysis of small precipitates contained within a thin foil and the measurement of chemical concentration profiles near microstructural features such as grain boundaries, point defect clusters, dislocations, or precipitates. Quantitative x-ray analysis of bulk samples using EDS on a conventional SEM is reasonably well established, but much less work has been performed on thin metal foils using the higher accelerating voltages available in TEM based instruments.

STEM-EDS X-RAY MICROANALYSIS IN THIN METAL FOILS

1984 ◽  
Vol 45 (C2) ◽  
pp. C2-381-C2-386
Author(s):  
P. Doig ◽  
P. E.J. Flewitt
Keyword(s):  
Thin Metal ◽  
X Ray ◽  
Metal Foils

Microchemical Analysis of thin Metal Foils

1976 ◽  
Vol 34 ◽  
pp. 420-421 ◽  
Author(s):  
N. J. Zaluzec ◽  
H. L. Fraser
Keyword(s):  
Thin Metal ◽  
Specimen Thickness ◽  
Marked Variation ◽  
X Ray ◽  
Metal Foils ◽  
Elemental Concentrations ◽  
Microchemical Analysis

Several techniques have been developed for quantitative x-ray microanalysis of thin metal foils. These techniques usually provide relative elemental concentrations, and assume that for a “thin” homogeneous alloy of elements A and B, the ratio of intensity (I) of any two characteristic x-ray peaks (e.g.IAKα/IBKα) should be independent of specimen thickness. Recently, Fraser et al., conducted experiments using a highly ordered alloy (β-NiAl) to investigate this assumption, and indeed showed that in electron transparent regions of the foils there was a marked variation in the ratio of the Ka peaks of Ni and Al, respectively. The results given by Fraser et al., are summarized in Fig. 1.

X-ray determination of the thickness of thin metal foils

2013 ◽  
Vol 21 (3) ◽  
pp. 347-355 ◽  
Author(s):  
Robert C. Block ◽  
Jeffrey A. Geuther ◽  
Brian Methe ◽  
Devin P. Barry ◽  
Gregory Leinweber
Keyword(s):  
Thin Metal ◽  
X Ray ◽  
Metal Foils

Microanalysis of precipitates in a ferritic steel

1978 ◽  
Vol 36 (1) ◽  
pp. 618-619
Author(s):  
J.M. Titchmarsh
Keyword(s):  
Ferritic Steel ◽  
Particle Identification ◽  
Energy Dispersive ◽  
Objective Lens ◽  
Ferritic Steels ◽  
Replica Technique ◽  
X Ray ◽  
Large Numbers ◽  
Scanning Transmission ◽  
Made In

The advances in recent years in the microanalytical capabilities of conventional TEM's fitted with probe forming lenses allow much more detailed investigations to be made of the microstructures of complex alloys, such as ferritic steels, than have been possible previously. In particular, the identification of individual precipitate particles with dimensions of a few tens of nanometers in alloys containing high densities of several chemically and crystallographically different precipitate types is feasible. The aim of the investigation described in this paper was to establish a method which allowed individual particle identification to be made in a few seconds so that large numbers of particles could be examined in a few hours.A Philips EM400 microscope, fitted with the scanning transmission (STEM) objective lens pole-pieces and an EDAX energy dispersive X-ray analyser, was used at 120 kV with a thermal W hairpin filament. The precipitates examined were extracted using a standard C replica technique from specimens of a 2¼Cr-lMo ferritic steel in a quenched and tempered condition.

Preparation And elemental analysis of ancient fibers

1987 ◽  
Vol 45 ◽  
pp. 410-411
Author(s):  
Allen Angel ◽  
Kathryn A. Jakes
Keyword(s):  
Cross Sections ◽  
Physical Structure ◽  
Energy Dispersive ◽  
Archaeological Sites ◽  
X Ray ◽  
Long Term Storage ◽  
Backscattered Electron ◽  
Electron Imaging

Fabrics recovered from archaeological sites often are so badly degraded that fiber identification based on physical morphology is difficult. Although diagenetic changes may be viewed as destructive to factors necessary for the discernment of fiber information, changes occurring during any stage of a fiber's lifetime leave a record within the fiber's chemical and physical structure. These alterations may offer valuable clues to understanding the conditions of the fiber's growth, fiber preparation and fabric processing technology and conditions of burial or long term storage (1).Energy dispersive spectrometry has been reported to be suitable for determination of mordant treatment on historic fibers (2,3) and has been used to characterize metal wrapping of combination yarns (4,5). In this study, a technique is developed which provides fractured cross sections of fibers for x-ray analysis and elemental mapping. In addition, backscattered electron imaging (BSI) and energy dispersive x-ray microanalysis (EDS) are utilized to correlate elements to their distribution in fibers.

Microanalytical Identification of a New Zr-Nb-Fe Phase

1990 ◽  
Vol 48 (2) ◽  
pp. 132-133
Author(s):  
O.T. Woo ◽  
G.J.C. Carpenter
Keyword(s):  
Trace Elements ◽  
Cold Rolling ◽  
Proportionality Factor ◽  
Tube Material ◽  
X Ray ◽  
Metal Foils ◽  
Arc Melting ◽  
Intermetallic Particles ◽  
Intermetallic Precipitates ◽  
Cold Worked

To study the influence of trace elements on the corrosion and hydrogen ingress in Zr-2.5 Nb pressure tube material, buttons of this alloy containing up to 0.83 at% Fe were made by arc-melting. The buttons were then annealed at 973 K for three days, furnace cooled, followed by ≈80% cold-rolling. The microstructure of cold-worked Zr-2.5 at% Nb-0.83 at% Fe (Fig. 1) contained both β-Zr and intermetallic precipitates in the α-Zr grains. The particles were 0.1 to 0.7 μm in size, with shapes ranging from spherical to ellipsoidal and often contained faults. β-Zr appeared either roughly spherical or as irregular elongated patches, often extending to several micrometres.The composition of the intermetallic particles seen in Fig. 1 was determined using Van Cappellen’s extrapolation technique for energy dispersive X-ray analysis of thin metal foils. The method was employed to avoid corrections for absorption and fluorescence via the Cliff-Lorimer equation: CA/CB = kAB · IA/IB, where CA and CB are the concentrations by weight of the elements A and B, and IA and IB are the X-ray intensities; kAB is a proportionality factor.

PHAX-SCAN: Functional integration of a Scanning Electron Microscope and an energy-dispersive x-ray analyser

1989 ◽  
Vol 47 ◽  
pp. 56-57
Author(s):  
Marc H. Peeters ◽  
Max T. Otten
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
High Speed ◽  
High Performance ◽  
Functional Integration ◽  
Energy Dispersive ◽  
X Rays ◽  
X Ray ◽  
High Speed Analysis ◽  
Scanning Electron

Over the past decades, the combination of energy-dispersive analysis of X-rays and scanning electron microscopy has proved to be a powerful tool for fast and reliable elemental characterization of a large variety of specimens. The technique has evolved rapidly from a purely qualitative characterization method to a reliable quantitative way of analysis. In the last 5 years, an increasing need for automation is observed, whereby energy-dispersive analysers control the beam and stage movement of the scanning electron microscope in order to collect digital X-ray images and perform unattended point analysis over multiple locations.The Philips High-speed Analysis of X-rays system (PHAX-Scan) makes use of the high performance dual-processor structure of the EDAX PV9900 analyser and the databus structure of the Philips series 500 scanning electron microscope to provide a highly automated, user-friendly and extremely fast microanalysis system. The software that runs on the hardware described above was specifically designed to provide the ultimate attainable speed on the system.

Sign in / Sign up

Export Citation Format

Share Document