Single- and dual-beam in situ irradiations of high-purity iron in a transmission electron microscope: Effects of heavy ion irradiation and helium injection

ABSTRACTIrradiation-induced amorphization of Cd2Nb2O7 pyrochlore was investigated by means of in-situ temperature-dependent ion-irradiation experiments in a transmission electron microscope, combined with ex-situ ion-implantation (at ambient temperature) and RBS/channeling analysis. The in-situ experiments were performed using Ne or Xe ions with energies of 280 and 1200 keV, respectively. For the bulk implantation experiments, the incident ion energies were 70 keV (Ne+) and 320 keV (Xe2+). The critical amorphization temperature for Cd2Nb2O7 is ∼480 K (280 keV Ne+) or ∼620 K (1200 keV Xe2+). The dose for in-situ amorphization at room temperature is 0.22 dpa for Xe2+, but is 0.65 dpa for Ne+ irradiation. Both types of experiments suggest a cascade overlap mechanism of amorphization. The results were analyzed in light of available models for the crystalline-to-amorphous transformation and were compared to previous ionirradiation experiments on other pyrochlore compositions.

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Edge-On Ion Irradiation of Electron Microscope Specimens

MRS Proceedings ◽

10.1557/proc-268-337 ◽

1992 ◽

Vol 268 ◽

Cited By ~ 1

Author(s):

Mauro P. Otero ◽

Charles W. Allen

Keyword(s):

Electron Microscope ◽

Cross Section ◽

Transmission Electron Microscope ◽

Ion Irradiation ◽

Special Technique ◽

Plan View ◽

Depth Direction ◽

Transmission Electron ◽

Foil Specimen

ABSTRACTA special technique is described for in situ transmission electron microscope (TEM) experiments involving simultaneous ion irradiation, in which the resultant phenomena are observed as in a cross-section TEM specimen. That is, instead of ion-irradiating the film or foil specimen normal to the major surfaces and observing in plan view (i.e., in the same direction), the specimen is irradiated edge-on (i.e., parallel to the major surfaces) and is observed normal to the depth direction with respect to the irradiation. The results of amorphization of Si, irradiated in this orientation by 1 or 1.5 MeV Kr, are presented and briefly compared with the usual plan view observations. The limitations of the technique are discussed and several experiments which might profitably employ this technique are suggested.

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Development of dual-beam system using an electrostatic accelerator for in-situ observation of swift heavy ion irradiation effects on materials

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/j.nimb.2013.05.034 ◽

2013 ◽

Vol 314 ◽

pp. 43-46

Author(s):

M. Matsuda ◽

T. Asozu ◽

M. Sataka ◽

A. Iwase

Keyword(s):

Ion Irradiation ◽

Heavy Ion ◽

In Situ Observation ◽

Irradiation Effects ◽

Swift Heavy Ion Irradiation ◽

Heavy Ion Irradiation ◽

Swift Heavy Ion ◽

Beam System ◽

Dual Beam

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Helium bubble nucleation and growth in alloy HT9 through the use of in situ TEM: Sequential he-implantation and heavy-ion irradiation versus dual-beam irradiation

Journal of Nuclear Materials ◽

10.1016/j.jnucmat.2020.152641 ◽

2020 ◽

pp. 152641

Author(s):

Kai Duemmler ◽

Ce Zheng ◽

Cedric Baumier ◽

Aurelie Gentils ◽

Djamel Kaoumi

Keyword(s):

Ion Irradiation ◽

Heavy Ion ◽

Nucleation And Growth ◽

Bubble Nucleation ◽

In Situ Tem ◽

Beam Irradiation ◽

Helium Bubble ◽

Heavy Ion Irradiation ◽

Dual Beam

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In situ Ion Irradiation and Heating Experiments in the Transmission Electron Microscope: Simulations of Dust Processing in Circumstellar Environments

Microscopy and Microanalysis ◽

10.1017/s143192761901300x ◽

2019 ◽

Vol 25 (S2) ◽

pp. 2454-2455

Author(s):

Pierre Haenecour ◽

Michelle S. Thompson ◽

Thomas J. Zega ◽

Jane Y. Howe ◽

Wei-Ying Chen

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Ion Irradiation ◽

Transmission Electron ◽

Circumstellar Environments

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Remote On-Line Control of a High-Voltage in situ Transmission Electron Microscope with A Rational User Interface

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100164386 ◽

1996 ◽

Vol 54 ◽

pp. 384-385

Author(s):

M.A. O’Keefe ◽

J. Taylor ◽

D. Owen ◽

B. Crowley ◽

K.H. Westmacott ◽

...

Keyword(s):

Electron Microscopy ◽

Electron Microscope ◽

User Interface ◽

Transmission Electron Microscope ◽

High Voltage ◽

Materials Science ◽

Transmission Electron ◽

On Line ◽

Electron Microscopes

Remote on-line electron microscopy is rapidly becoming more available as improvements continue to be developed in the software and hardware of interfaces and networks. Scanning electron microscopes have been driven remotely across both wide and local area networks. Initial implementations with transmission electron microscopes have targeted unique facilities like an advanced analytical electron microscope, a biological 3-D IVEM and a HVEM capable of in situ materials science applications. As implementations of on-line transmission electron microscopy become more widespread, it is essential that suitable standards be developed and followed. Two such standards have been proposed for a high-level protocol language for on-line access, and we have proposed a rational graphical user interface. The user interface we present here is based on experience gained with a full-function materials science application providing users of the National Center for Electron Microscopy with remote on-line access to a 1.5MeV Kratos EM-1500 in situ high-voltage transmission electron microscope via existing wide area networks. We have developed and implemented, and are continuing to refine, a set of tools, protocols, and interfaces to run the Kratos EM-1500 on-line for collaborative research. Computer tools for capturing and manipulating real-time video signals are integrated into a standardized user interface that may be used for remote access to any transmission electron microscope equipped with a suitable control computer.

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