Characterization of crystallite size, dislocation characteristics and stacking faults in nanostructured mechanically alloyed Cu–Fe system using an advanced X-ray diffraction analysis method

2014 ◽  
Vol 590 ◽  
pp. 565-571 ◽  
Author(s):  
V. Soleimanian ◽  
M. Mojtahedi ◽  
M. Goodarzi ◽  
M.R. Aboutalebi
Keyword(s):  
Diffraction Analysis ◽  
Crystallite Size ◽  
Stacking Faults ◽  
Analysis Method ◽  
X Ray Diffraction ◽  
Mechanically Alloyed ◽  
X Ray

Hydrothermal Synthesis and Structural Characterization of Orthorhombic LiMnO2 with Low Stacking Faults

2015 ◽  
Vol 1120-1121 ◽  
pp. 174-178
Author(s):  
Li Zhu Zhao ◽  
G. Chen
Keyword(s):  
Aqueous Solution ◽  
Structural Characterization ◽  
Stacking Faults ◽  
Lithium Hydroxide ◽  
Orthorhombic Structure ◽  
X Ray Diffraction ◽  
Hydrothermal Technique ◽  
X Ray

LiMnO2 are synthesized by hydrothermal technique by using Mn(CH3COO)2.4H2O and MnO2 with the same mole ratio which are dissolved in aqueous solution with different concentration LiOH. Structural characterization based on X-ray diffraction and Raman spectroscopy reveals that LiMnO2 is in a well-order orthorhombic structure with lower stacking faults compared to the LiMnO2 prepared by other techniques. Experimental results show that the concentration of lithium hydroxide in aqueous solution affect the quality of LiMnO2.

Synthesis and Characterization of Tetrakis(pentafluoroethyl)germane

Synthesis ◽  
2017 ◽  
Vol 49 (11) ◽  
pp. 2389-2393 ◽  
Author(s):  
Stefanie Pelzer ◽  
Beate Neumann ◽  
Hans-Georg Stammler ◽  
Nikolai Ignat’ev ◽  
Reint Eujen ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Nmr Spectroscopy ◽  
Ir Spectroscopy ◽  
Diffraction Analysis ◽  
Spectroscopic Characterization ◽  
Synthesis And Characterization ◽  
X Ray Diffraction ◽  
X Ray ◽  
Comprehensive Characterization

This paper describes the synthesis and comprehensive characterization of tetrakis(pentafluoroethyl)germane. In addition to a complete NMR spectroscopic characterization, including the rarely used 73Ge NMR spectroscopy, Ge(C2F5)4 was studied by IR spectroscopy, mass spectrometry as well as X-ray diffraction analysis. A 73Ge NMR investigation as well as an X-ray diffraction study of the related germane Ge(CF3)4 are also included.

Synthesis and characterization of the pentazolate anion cyclo-N5ˉ in (N5)6(H3O)3(NH4)4Cl

Science ◽  
2017 ◽  
Vol 355 (6323) ◽  
pp. 374-376 ◽  
Author(s):  
Chong Zhang ◽  
Chengguo Sun ◽  
Bingcheng Hu ◽  
Chuanming Yu ◽  
Ming Lu
Keyword(s):  
Thermal Analysis ◽  
Single Crystal ◽  
Diffraction Analysis ◽  
Decomposition Temperature ◽  
Synthesis And Characterization ◽  
X Ray Diffraction ◽  
X Ray ◽  
Onset Decomposition Temperature ◽  
The Stability

Pentazole (HN5), an unstable molecular ring comprising five nitrogen atoms, has been of great interest to researchers for the better part of a century. We report the synthesis and characterization of the pentazolate anion stabilized in a (N5)6(H3O)3(NH4)4Cl salt. The anion was generated by direct cleavage of the C–N bond in a multisubstituted arylpentazole using m-chloroperbenzoic acid and ferrous bisglycinate. The structure was confirmed by single-crystal x-ray diffraction analysis, which highlighted stabilization of the cyclo-N5ˉ ring by chloride, ammonium, and hydronium. Thermal analysis indicated the stability of the salt below 117°C on the basis of thermogravimetry-measured onset decomposition temperature.

SYNTHESIS AND CHARACTERIZATION OF La2Ca3Cu4Oy

1999 ◽  
Vol 13 (12n13) ◽  
pp. 451-453
Author(s):  
K. JEYABALAN ◽  
L. K. KALIYAPERUMAL
Keyword(s):  
Diffraction Analysis ◽  
Lattice Parameters ◽  
Synthesis And Characterization ◽  
Orthorhombic Structure ◽  
X Ray Diffraction ◽  
X Ray

Synthesis and characterization of La 2 Ca 3 Cu 4 O y compound is reported here. The powder X-ray diffraction analysis shows that the system belongs to an orthorhombic structure and the lattice parameters are a = 3.814(4)Å, b = 3.930(5)Å and c = 34.772(3)Å.

scholarly journals Characterization of individual stacking faults in a wurtzite GaAs nanowire by nanobeam X-ray diffraction

2017 ◽  
Vol 24 (5) ◽  
pp. 981-990 ◽  
Author(s):  
Arman Davtyan ◽  
Sebastian Lehmann ◽  
Dominik Kriegner ◽  
Reza R. Zamani ◽  
Kimberly A. Dick ◽  
...  
Keyword(s):  
Bragg Peak ◽  
Stacking Faults ◽  
Growth Direction ◽  
X Ray Diffraction ◽  
X Ray ◽  
Patterson Function ◽  
Transmission Electron ◽  
Gaas Nanowires ◽  
Gaas Nanowire

Coherent X-ray diffraction was used to measure the type, quantity and the relative distances between stacking faults along the growth direction of two individual wurtzite GaAs nanowires grown by metalorganic vapour epitaxy. The presented approach is based on the general property of the Patterson function, which is the autocorrelation of the electron density as well as the Fourier transformation of the diffracted intensity distribution of an object. Partial Patterson functions were extracted from the diffracted intensity measured along the [000\bar{1}] direction in the vicinity of the wurtzite 00\bar{1}\bar{5} Bragg peak. The maxima of the Patterson function encode both the distances between the fault planes and the type of the fault planes with the sensitivity of a single atomic bilayer. The positions of the fault planes are deduced from the positions and shapes of the maxima of the Patterson function and they are in excellent agreement with the positions found with transmission electron microscopy of the same nanowire.

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