Non-resonant X-ray/laser interaction spectroscopy as a method for assessing charge competition, trapping and luminescence efficiency in wide band-gap materials

2010 ◽  
Vol 130 (8) ◽  
pp. 1404-1414 ◽  
Author(s):  
N.R.J. Poolton ◽  
A.J.J. Bos ◽  
J. Wallinga ◽  
J.T.M. de Haas ◽  
P. Dorenbos ◽  
...  
Nanoscale ◽  
2021 ◽  
Vol 13 (7) ◽  
pp. 4038-4050
Author(s):  
Ida Gjerlevsen Nielsen ◽  
Sanna Sommer ◽  
Bo Brummerstedt Iversen

The indium oxides, c-In2O3, h-In2O3, InOOH and In(OH)3, have been studied by in situ X-ray scattering to determine the formation and transformation mechanisms in this system of important wide band gap semiconductors.


2014 ◽  
Vol 10 (3) ◽  
pp. 2532-2539 ◽  
Author(s):  
H. Saadouni ◽  
D. E. Janzen ◽  
M. Rzaigui ◽  
W.Smirani Sta

The synthesis, crystal structure and spectroscopic studies are reported for the salt m-anisidinium nitrate. A single-crystal  X-ray investigation has shown that this compound crystallizes in the non-centrosymmetric space group Cc with the lattice parameters: a = 5.744(3) Å, b = 14.968(6) Å, c = 10.178(4) Å; b  = 96.910(7)o; V = 868.6(6)Å3 ; Z = 4. The structure was solved from 1973 independent reflections with R1 = 0.033 and wR2 = 0.088. The hydrogen atoms of the protonated amine undergo hydrogen bonding interactions with oxygen atoms of three different nitrate anions forming 2-dimensional sheets. Solution NMR results are consistent with the X-ray structure. A measured optical band gap of 3.35eV indicates m-anisidinium nitrate is a wide-band-gap dielectric material.


2006 ◽  
Vol 942 ◽  
Author(s):  
Maria Antonella Tagliente ◽  
Marcello Massaro ◽  
Giovanni Mattei ◽  
Paolo Mazzoldi ◽  
Giovanni Pellegrini ◽  
...  

ABSTRACTZinc Oxide (ZnO) is a II-VI semiconductor material with a wide direct band-gap of 3.37 eV at room temperature (RT). In the past decades, the material has been used for a variety of applications such as gas sensors, surface acoustic wave devices, or transparent contacts. Recently, ZnO has gained a new substantial interest primarily because to its potentialities for optoelectronic and spintronic applications. The renewed interest has been fueled by the availability of high-quality bulk substrates, reports of p-type conduction and theoretical predictions of its ferromagnetic behavior at room temperature when doped with transition metals. In the domain of optoelectronics, its main applications include devices emitting in the blue and UV regions by exploiting its wide band-gap such as light-emitting and laser diodes. With respect to several wide band-gap semiconductor materials, ZnO has the advantage of a larger exciton binding energy (about 60 meV) which paves the way for an intense near-band-edge excitonic emission at room and higher temperatures. On the other hand, a band gap engineering can be also achieved by the incorporation of Cadmium and Magnesium atoms into the ZnO lattice.Many techniques have been used to prepare ZnO in various forms, such as single crystals, powders and films. In the past few years, the great attention toward materials with nanometric size have motivated a number of studies on the synthesis of ZnO nanocrystals. Ion implantation is one of the most effective and versatile technique to obtain nanoparticles. ZnO particles embedded in silica matrix have been successfully prepared by ion implantation followed by thermal oxidation.In this work, we report on a detailed structural and optical characterization of the ZnO-silica nanocomposites by using several complementary techniques; in particular, Glancing Incidence X-ray Diffraction (GIXRD), Rutherford Backscattering Spectrometry (RBS), linear Optical Absorption (OA) in the UV-near IR spectrum and Photo-Luminescence (PL). The ZnO nanoparticles embedded in SiO2 matrix were prepared by implanting the substrates with 130 keV Zn+ ions at doses of 1, 1.5 and 2´1017 ions/cm2. Subsequently, the implanted samples were annealed for 1h in a furnace at a temperature between 500 and 800°C under flowing O2 gas. X-ray diffraction results indicate the formation of Zn and ZnO nanoparticles in the as-implanted and annealed samples, respectively. Moreover, the ZnO nanocrystals embedded in the SiO2 matrix have a (002) preferred orientation. After the oxidation, the optical absorption spectra show an absorption edge at about 374 nm by confirming the presence of the ZnO particles. A relatively strong exciton photoluminescence peak was observed at room temperature under pulsed N2 laser excitation at l=337nm. The results obtained, peculiarly related to the implantation doses and annealing temperature, are discussed.


Coatings ◽  
2021 ◽  
Vol 11 (9) ◽  
pp. 1064
Author(s):  
Iosif-Daniel Simandan ◽  
Florinel Sava ◽  
Angel-Theodor Buruiana ◽  
Ion Burducea ◽  
Nicu Becherescu ◽  
...  

ZnS is a wide band gap material which was proposed as a possible candidate to replace CdS as a buffer layer in solar cells. However, the structural and optical properties are influenced by the deposition method. ZnS thin films were prepared using magnetron sputtering (MS), pulsed laser deposition (PLD), and a combined deposition technique that uses the same bulk target for sputtering and PLD at the same time, named MSPLD. The compositional, structural, and optical properties of the as-deposited and annealed films were inferred from Rutherford backscattering spectrometry, X-ray diffraction, X-ray reflectometry, Raman spectroscopy, and spectroscopic ellipsometry. PLD leads to the best stoichiometric transfer from target to substrate, MS makes fully amorphous films, whereas MSPLD facilitates obtaining the densest films. The study reveals that the band gap is only slightly influenced by the deposition method, or by annealing, which is encouraging for photovoltaic applications. However, sulphur vacancies contribute to lowering the bandgap and therefore should be controlled. Moreover, the results add valuable information towards the understanding of ZnS polymorphism. The combined MSPLD method offers several advantages such as an increased deposition rate and the possibility to tune the optical properties of the obtained thin films.


Author(s):  
Joanna L. Batstone

Interest in II-VI semiconductors centres around optoelectronic device applications. The wide band gap II-VI semiconductors such as ZnS, ZnSe and ZnTe have been used in lasers and electroluminescent displays yielding room temperature blue luminescence. The narrow gap II-VI semiconductors such as CdTe and HgxCd1-x Te are currently used for infrared detectors, where the band gap can be varied continuously by changing the alloy composition x.Two major sources of precipitation can be identified in II-VI materials; (i) dopant introduction leading to local variations in concentration and subsequent precipitation and (ii) Te precipitation in ZnTe, CdTe and HgCdTe due to native point defects which arise from problems associated with stoichiometry control during crystal growth. Precipitation is observed in both bulk crystal growth and epitaxial growth and is frequently associated with segregation and precipitation at dislocations and grain boundaries. Precipitation has been observed using transmission electron microscopy (TEM) which is sensitive to local strain fields around inclusions.


Author(s):  
Raquel Caballero ◽  
Leonor de la Cueva ◽  
Andrea Ruiz-Perona ◽  
Yudenia Sánchez ◽  
Markus Neuschitzer ◽  
...  

2013 ◽  
Vol 28 (6) ◽  
pp. 671-676 ◽  
Author(s):  
Yu-Qing ZHANG ◽  
Li-Li ZHAO ◽  
Shi-Long XU ◽  
Chao ZHANG ◽  
Xiao-Ying CHEN ◽  
...  

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