A high-performance VLSI array reconfiguration scheme based on network flow under row and column rerouting

Author(s):  
Hao Ding ◽  
Junyan Qian ◽  
Lingzhong Zhao ◽  
Zhongyi Zhai
2016 ◽  
Vol 27 (12) ◽  
pp. 3575-3587 ◽  
Author(s):  
Junyan Qian ◽  
Zhide Zhou ◽  
Tianlong Gu ◽  
Lingzhong Zhao ◽  
Liang Chang

2019 ◽  
Vol 28 (14) ◽  
pp. 1950237
Author(s):  
Ling Zheng ◽  
Zhiliang Qiu ◽  
Weina Wang ◽  
Weitao Pan ◽  
Shiyong Sun ◽  
...  

Network flow classification is a key function in high-speed switches and routers. It directly determines the performance of network devices. With the development of the Internet and various kinds of applications, the flow classification needs to support multi-dimensional fields, large rule sets, and sustain a high throughput. Software-based classification cannot meet the performance requirement as high as 100 Gbps. FPGA-based flow classification methods can achieve a very high throughput. However, the range matching is still challenging. For this, this paper proposes a range supported bit vector (RSBV) method. First, the characteristic of range matching is analyzed, then the rules are pre-encoded and stored in memory. Second, the fields of an input packet header are used as addresses to read the memory, and the result of range matching is derived through pipelined Boolean operations. On this basis, bit vector for any types of fields (AFBV) is further proposed, which supports the flow classification for multi-dimensional fields efficiently, including exact matching, longest prefix matching, range matching, and arbitrary wildcard matching. The proposed methods are implemented in FPGA platform. Through a two-dimensional pipeline architecture, the AFBV can operate at a high clock frequency and can achieve a processing speed of more than 100 Gbps. Simulation results show that for a rule set of 512-bit width and 1[Formula: see text]k rules, the AFBV can achieve a throughput of 520 million packets per second (MPPS). The performance is improved by 44% compared with FSBV and 30% compared with Stride BV. The power consumption is reduced by about 43% compared with TCAM solution.


2019 ◽  
Vol 24 (2) ◽  
pp. 47 ◽  
Author(s):  
Reena Patel ◽  
Guillermo Riveros ◽  
David Thompson ◽  
Edward Perkins ◽  
Jan Jeffery Hoover ◽  
...  

This work presents a transdisciplinary, integrated approach that uses computational mechanics experiments with a flow network strategy to gain fundamental insights into the stress flow of high-performance, lightweight, structured composites by investigating the rostrum of paddlefish. Although computational mechanics experiments give an overall distribution of stress in the structural systems, stress flow patterns formed at nascent stages of loading a biostructure are hard to determine. Computational mechanics experiments on a complex model will involve a high degree of freedom thereby making the extraction of finer details computationally expensive. To address this challenge, the evolution of the stress in the rostrum is formulated as a network flow problem generated by extracting the node and connectivity information from the numerical model of the rostrum. The flow network is weighted based on the parameter of interest, which is stress in the current research. The changing kinematics of the system is provided as input to the mathematical algorithm that computes the minimum cut of the flow network. The flow network approach is verified using two simple classical problems. When applied to the model of the rostrum, the flow network approach identifies strain localization in tensile regions, and buckling/crushing in compressive regions.


Author(s):  
A. V. Crewe ◽  
M. Isaacson ◽  
D. Johnson

A double focusing magnetic spectrometer has been constructed for use with a field emission electron gun scanning microscope in order to study the electron energy loss mechanism in thin specimens. It is of the uniform field sector type with curved pole pieces. The shape of the pole pieces is determined by requiring that all particles be focused to a point at the image slit (point 1). The resultant shape gives perfect focusing in the median plane (Fig. 1) and first order focusing in the vertical plane (Fig. 2).


Author(s):  
N. Yoshimura ◽  
K. Shirota ◽  
T. Etoh

One of the most important requirements for a high-performance EM, especially an analytical EM using a fine beam probe, is to prevent specimen contamination by providing a clean high vacuum in the vicinity of the specimen. However, in almost all commercial EMs, the pressure in the vicinity of the specimen under observation is usually more than ten times higher than the pressure measured at the punping line. The EM column inevitably requires the use of greased Viton O-rings for fine movement, and specimens and films need to be exchanged frequently and several attachments may also be exchanged. For these reasons, a high speed pumping system, as well as a clean vacuum system, is now required. A newly developed electron microscope, the JEM-100CX features clean high vacuum in the vicinity of the specimen, realized by the use of a CASCADE type diffusion pump system which has been essentially improved over its predeces- sorD employed on the JEM-100C.


Author(s):  
John W. Coleman

In the design engineering of high performance electromagnetic lenses, the direct conversion of electron optical design data into drawings for reliable hardware is oftentimes difficult, especially in terms of how to mount parts to each other, how to tolerance dimensions, and how to specify finishes. An answer to this is in the use of magnetostatic analytics, corresponding to boundary conditions for the optical design. With such models, the magnetostatic force on a test pole along the axis may be examined, and in this way one may obtain priority listings for holding dimensions, relieving stresses, etc..The development of magnetostatic models most easily proceeds from the derivation of scalar potentials of separate geometric elements. These potentials can then be conbined at will because of the superposition characteristic of conservative force fields.


Author(s):  
J W Steeds ◽  
R Vincent

We review the analytical powers which will become more widely available as medium voltage (200-300kV) TEMs with facilities for CBED on a nanometre scale come onto the market. Of course, high performance cold field emission STEMs have now been in operation for about twenty years, but it is only in relatively few laboratories that special modification has permitted the performance of CBED experiments. Most notable amongst these pioneering projects is the work in Arizona by Cowley and Spence and, more recently, that in Cambridge by Rodenburg and McMullan.There are a large number of potential advantages of a high intensity, small diameter, focussed probe. We discuss first the advantages for probes larger than the projected unit cell of the crystal under investigation. In this situation we are able to perform CBED on local regions of good crystallinity. Zone axis patterns often contain information which is very sensitive to thickness changes as small as 5nm. In conventional CBED, with a lOnm source, it is very likely that the information will be degraded by thickness averaging within the illuminated area.


Author(s):  
Klaus-Ruediger Peters

A new generation of high performance field emission scanning electron microscopes (FSEM) is now commercially available (JEOL 890, Hitachi S 900, ISI OS 130-F) characterized by an "in lens" position of the specimen where probe diameters are reduced and signal collection improved. Additionally, low voltage operation is extended to 1 kV. Compared to the first generation of FSEM (JE0L JSM 30, Hitachi S 800), which utilized a specimen position below the final lens, specimen size had to be reduced but useful magnification could be impressively increased in both low (1-4 kV) and high (5-40 kV) voltage operation, i.e. from 50,000 to 200,000 and 250,000 to 1,000,000 x respectively.At high accelerating voltage and magnification, contrasts on biological specimens are well characterized1 and are produced by the entering probe electrons in the outmost surface layer within -vl nm depth. Backscattered electrons produce only a background signal. Under these conditions (FIG. 1) image quality is similar to conventional TEM (FIG. 2) and only limited at magnifications >1,000,000 x by probe size (0.5 nm) or non-localization effects (%0.5 nm).


Author(s):  
G.K.W. Balkau ◽  
E. Bez ◽  
J.L. Farrant

The earliest account of the contamination of electron microscope specimens by the deposition of carbonaceous material during electron irradiation was published in 1947 by Watson who was then working in Canada. It was soon established that this carbonaceous material is formed from organic vapours, and it is now recognized that the principal source is the oil-sealed rotary pumps which provide the backing vacuum. It has been shown that the organic vapours consist of low molecular weight fragments of oil molecules which have been degraded at hot spots produced by friction between the vanes and the surfaces on which they slide. As satisfactory oil-free pumps are unavailable, it is standard electron microscope practice to reduce the partial pressure of organic vapours in the microscope in the vicinity of the specimen by using liquid-nitrogen cooled anti-contamination devices. Traps of this type are sufficient to reduce the contamination rate to about 0.1 Å per min, which is tolerable for many investigations.


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