A methodology for projecting SiO2 thick gate oxide reliability on trench power MOSFETs and its application on MOSFETs VGS rating
1995 ◽
Vol 35
(3)
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pp. 603-608
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Keyword(s):
1998 ◽
Vol 38
(2)
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pp. 255-258
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Keyword(s):
2013 ◽
Vol 21
(3)
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pp. 580-584
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