Evidence of Poole-frenkel and Fowler-Nordheim tunneling transport mechanisms in leakage current of (Pd/Au)/Al0.22Ga0.78N/GaN heterostructures

2020 ◽  
Vol 314-315 ◽  
pp. 113920
Author(s):  
I. Jabbari ◽  
M. Baira ◽  
H. Maaref ◽  
R. Mghaieth
Keyword(s):  
Leakage Current ◽  
Transport Mechanisms ◽  
Nordheim Tunneling ◽  
Tunneling Transport

scholarly journals Leakage current transport mechanisms of La0.67Sr0.33MnO3/BaTiO3 bilayer films grown on Nb:SrTiO3

2015 ◽  
Vol 38 (3) ◽  
pp. 725-729 ◽  
Author(s):  
PAN RUIKUN ◽  
LIU PANKE ◽  
LI MINGKAI ◽  
TAO HAIZHENG ◽  
LI PAI ◽  
...  
Keyword(s):  
Leakage Current ◽  
Current Transport ◽  
Transport Mechanisms ◽  
Bilayer Films

The Transport Mechanisms of Reverse Leakage Current in Ultraviolet Light-Emitting Diodes

2016 ◽  
Vol 33 (11) ◽  
pp. 117301 ◽  
Author(s):  
Feng Dai ◽  
Xue-Feng Zheng ◽  
Pei-Xian Li ◽  
Xiao-Hui Hou ◽  
Ying-Zhe Wang ◽  
...  
Keyword(s):  
Leakage Current ◽  
Ultraviolet Light ◽  
Light Emitting Diodes ◽  
Transport Mechanisms ◽  
Light Emitting ◽  
Reverse Leakage Current ◽  
Ultraviolet Light Emitting Diodes

scholarly journals Thermionic and tunneling transport mechanisms in graphene field-effect transistors

2008 ◽  
Vol 205 (7) ◽  
pp. 1527-1533 ◽  
Author(s):  
Victor Ryzhii ◽  
Maxim Ryzhii ◽  
Taiichi Otsuji
Keyword(s):  
Field Effect ◽  
Field Effect Transistors ◽  
Transport Mechanisms ◽  
Tunneling Transport

Conduction Mechanism of Leakage Current in Thermal Oxide on 4H-SiC

2014 ◽  
Vol 778-780 ◽  
pp. 579-582 ◽  
Author(s):  
Mitsuru Sometani ◽  
Dai Okamoto ◽  
Shinsuke Harada ◽  
Hitoshi Ishimori ◽  
Shinji Takasu ◽  
...  
Keyword(s):  
Temperature Dependence ◽  
Leakage Current ◽  
Conduction Mechanism ◽  
Emission Current ◽  
Thermal Oxide ◽  
Current Voltage ◽  
Carrier Separation ◽  
Nordheim Tunneling

The conduction mechanism of the leakage current in thermal oxide on 4H-SiC was identified. The carrier separation current-voltage method clarified that electrons are the dominant carriers of the leakage current. The temperature dependence of the currentvoltage characteristics indicated that the conduction mechanism of the leakage current involved not only Fowler-Nordheim tunneling (FN) but also Poole-Frenkel (PF) emission. The PF emission current due to the existence of defects in the oxide increased with temperature.

Transport mechanisms of leakage current in Al 2 O 3 /InAlAs MOS capacitors

2016 ◽  
Vol 123 ◽  
pp. 106-110 ◽  
Author(s):  
Chengji Jin ◽  
Hongliang Lu ◽  
Yimen Zhang ◽  
Yuming Zhang ◽  
He Guan ◽  
...  
Keyword(s):  
Leakage Current ◽  
Transport Mechanisms ◽  
Mos Capacitors

Annealing effect and leakage current transport mechanisms of high k ternary GdAlOx gate dielectrics

2019 ◽  
Vol 791 ◽  
pp. 839-846 ◽  
Author(s):  
Shuan Li ◽  
Yanqing Wu ◽  
Hongen Yu ◽  
Kai Fu ◽  
Jie Zheng ◽  
...  
Keyword(s):  
Leakage Current ◽  
Gate Dielectrics ◽  
Annealing Effect ◽  
Current Transport ◽  
Transport Mechanisms ◽  
High K
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