Interfacial void formation during vapor phase growth of 3C-SiC on Si(0 0 1) and Si(1 1 1) substrates. Characterization by transmission electron microscopy

1997 ◽  
Vol 182 (3-4) ◽  
pp. 379-388 ◽  
Author(s):  
L.-O. Björketun ◽  
L. Hultman ◽  
I.P. Ivanov ◽  
Q. Wahab ◽  
J.-E. Sundgren
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Vapor Phase ◽  
Void Formation ◽  
Phase Growth ◽  
Vapor Phase Growth ◽  
Transmission Electron

Void Morphology In NiAl

2000 ◽  
Vol 646 ◽  
Author(s):  
M. Zakaria ◽  
P.R. Munroe
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Surface Energy ◽  
Annealing Temperature ◽  
Void Formation ◽  
Dislocation Climb ◽  
Annealing Temperatures ◽  
Relative Incidence ◽  
Transmission Electron ◽  
Void Shape

ABSTRACTVoid formation in stoichiometric NiAl was studied through controlled heat treatments and transmission electron microscopy. Voids formed at temperatures as low as 400°C, but dissolved during annealing at 900°C. Both cuboidal and rhombic dodecahedral voids were observed, often at the same annealing temperature. At higher annealing temperatures (>800°C) extensive dislocation climb was noted. The relative incidence of void formation and dislocation climb can be related to the mobility of vacancies at each annealing temperature. Further, differences in void shape can be described in terms of their relative surface energy and mode of nucleation.

Alpha-Si3N4 Precipitation in C/C-SiC Composites from inherent Fiber Impurity Sources

1994 ◽  
Vol 365 ◽  
Author(s):  
Roland Pleger ◽  
Wolfgang Braue
Keyword(s):  
Electron Microscopy ◽  
Heat Treatment ◽  
Transmission Electron Microscopy ◽  
Carbon Fibers ◽  
Vapor Phase ◽  
Reaction Front ◽  
Reactive Nitrogen ◽  
Transmission Electron ◽  
Silicon Vapor ◽  
Sic Composites

ABSTRACTThe formation of crystalline α-Si3N4 filaments grown inside the pore channels of HT-carbon fibers from a 2D C/C-SiC composite is investigated by transmission electron microscopy. Precipitation of α-Si3N4 is promoted by a low carbonization heat treatment of the C/C material prior to liquid silicon infiltration and results from the interaction of a highly reactive nitrogen-rich vapor phase released from the fiber and silicon vapor diffusing ahead of the SiC reaction front into the porous microtexture of the fiber.

Micro and Nano Silver-Graphene Composite Manufacturing via Horizontal Vapor Phase Growth (HVPG) Technique

2017 ◽  
Vol 901 ◽  
pp. 3-7 ◽  
Author(s):  
Muhammad Akhsin Muflikhun ◽  
Gwen B. Castillon ◽  
Gil Nonato C. Santos ◽  
Alvin Y. Chua
Keyword(s):  
Electron Microscopy ◽  
Vapor Phase ◽  
Horizontal Temperature Gradient ◽  
Phase Growth ◽  
Composite Manufacturing ◽  
X Ray ◽  
Layer Graphene ◽  
Graphene Composite ◽  
Vapor Phase Growth ◽  
Scanning Electron

In this study, nanosilver-graphene composites were successfully manufactured via the horizontal vapor phase growth (HVPG) technique. A quartz tube loaded with the starting material, equal masses silver (Ag) powder and multi-layer graphene (Ge), was evacuated to ~10-6 Torr, sealed, and then baked at 1200°C for 6 hours, with its orientation such that a horizontal temperature gradient was generated across the tube. Scanning electron microscopy (SEM) and energy dispersive X-ray spectroscopy (EDX) analysis revealed variations in the structure and composition of the nanomaterials deposited on different regions of the tube, and the diameter of the nanomaterials was found to decrease with decreasing temperature.

Nanorods of CoP, CdS, and ZnS

2006 ◽  
Vol 78 (9) ◽  
pp. 1651-1665 ◽  
Author(s):  
P. John Thomas ◽  
Paul Christian ◽  
Steven Daniels ◽  
Yang Li ◽  
Y. S. Wang ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Structural Properties ◽  
Solution Phase ◽  
X Ray Diffraction ◽  
Phase Growth ◽  
Extrinsic Factors ◽  
X Ray ◽  
Transmission Electron

Simple thermolysis routes to CdS, ZnS, and CoP nanorods have been developed in our laboratory. The structural properties of the nanorods obtained were elucidated by means of X-ray diffraction (XRD) and high-resolution transmission electron microscopy (HR-TEM). Arguments and calculations in support of the contention that intrinsic rather than extrinsic factors influence the solution-phase growth of nanorods are presented.

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