Photoelectron spectroscopy of thin films of PEDOT–PSS conjugated polymer blend: a mini-review and some new results

ABSTRACTThe surface electronic structures of conjugated regio regular and regio random poly (3- hexylthiophene) (rr-P3HT and rra-P3HT) thin films were studied by near edge X-ray absorption fine structure spectroscopy, ultraviolet photoelectron spectroscopy and Penning ionization electron spectroscopy (PIES). The distribution of the surface electronic states was controlled on rr-P3HT and rra-P3HT thin films with different molecular ordering by varying the coating process and PIES was adopted to observe the electronic states existing outside the surface.

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Characterization of spray-coating methods for conjugated polymer blend thin films

Journal of Materials Science ◽

10.1007/s10853-014-8123-5 ◽

2014 ◽

Vol 49 (12) ◽

pp. 4279-4287 ◽

Cited By ~ 8

Author(s):

Matthias Noebels ◽

Rachel E. Cross ◽

D. A. Evans ◽

Chris E. Finlayson

Keyword(s):

Thin Films ◽

Polymer Blend ◽

Conjugated Polymer ◽

Spray Coating ◽

Coating Methods

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Two-photon photoelectron spectroscopy of conjugated polymer thin films on gold

Applied Physics Letters ◽

10.1063/1.1638897 ◽

2004 ◽

Vol 84 (1) ◽

pp. 76-78 ◽

Cited By ~ 14

Author(s):

Y. Sohn ◽

J. Richter ◽

J. Ament ◽

J. Todd Stuckless

Keyword(s):

Thin Films ◽

Photoelectron Spectroscopy ◽

Conjugated Polymer ◽

Polymer Thin Films ◽

Two Photon

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Preparation and Characterization of Polymer Blend (PVA/PEO) Filled with Methyl Orange Thin Films

Diyala Journal for Pure Science ◽

10.24237/djps.1402.410c ◽

2018 ◽

Vol 14 (2) ◽

pp. 221-234

Author(s):

Ahmed Namah Mohamed ◽

◽

Jafer Fahdel Odah ◽

Haider Tawfiq Naeem

Keyword(s):

Thin Films ◽

Methyl Orange ◽

Polymer Blend

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Endgroup and Sidechain Functionalization of Surface-Initiated ROMP Thin Films: Progress Towards ROMP-Based Molecular Wires

10.26434/chemrxiv.5954518 ◽

2018 ◽

Author(s):

Nicholas Marshall

Keyword(s):

Thin Films ◽

Contact Angle ◽

Cyclic Voltammetry ◽

Polymer Films ◽

Conjugated Polymer ◽

Ring Opening ◽

Molecular Wires ◽

Metathesis Polymerization ◽

Cross Metathesis ◽

Active Ester

A set of experiments in surface-initiated ring-opening metathesis polymerization, including end-functionalization of growing brushes and contact angle/cyclic voltammetry measurements. We report preparation and CV of two different conjugated polymer films, and several endgroup and sidechain functionalization experiments using cross-metathesis and active ester substitution.<br>

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Phase configuration, nanostructure, and mechanical behaviors in Ti-B-C-N thin films

Journal of Materials Research ◽

10.1557/jmr.2009.0310 ◽

2009 ◽

Vol 24 (8) ◽

pp. 2520-2527 ◽

Cited By ~ 2

Author(s):

Yonghao Lu ◽

Junping Wang ◽

Yaogen Shen ◽

Dongbai Sun

Keyword(s):

Thin Films ◽

Photoelectron Spectroscopy ◽

Solid Solution Hardening ◽

Mechanical Behaviors ◽

Additional Increase ◽

N Content ◽

X Ray ◽

Nanocomposite Thin Films ◽

The Cost ◽

Nano Grains

A series of Ti-B-C-N thin films were deposited on Si (100) at 500 °C by incorporation of different amounts of N into Ti-B-C using reactive unbalanced dc magnetron sputtering in an Ar-N2 gas mixture. The effect of N content on phase configuration, nanostructure evolution, and mechanical behaviors was studied by x-ray diffraction, x-ray photoelectron spectroscopy, Raman spectroscopy, high-resolution transmission electron microscopy, and microindentation. It was found that the pure Ti-B-C was two-phased quasi-amorphous thin films comprising TiCx and TiB2. Incorporation of a small amount of N not only dissolved into TiCx but also promoted growth of TiCx nano-grains. As a result, nanocomposite thin films of nanocrystalline (nc-) TiCx(Ny) (x + y < 1) embedded into amorphous (a-) TiB2 were observed until nitrogen fully filled all carbon vacancy lattice (at that time x + y = 1). Additional increase of N content promoted formation of a-BN at the cost of TiB2, which produced nanocomposite thin films of nc-Ti(Cx,N1-x) embedded into a-(TiB2, BN). Formation of BN also decreased nanocrystalline size. Both microhardness and elastic modulus values were increased with an increase of N content and got their maximums at nanocomposite thin films consisting of nc-Ti(Cx,N1-x) and a-TiB2. Both values were decreased after formation of BN. Residual compressive stress value was successively decreased with an increase of N content. Enhancement of hardness was attributed to formation of nanocomposite structure and solid solution hardening.

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Optical Constant and Conformality Analysis of SiO2 Thin Films Deposited on Linear Array Microstructure Substrate by PECVD

Coatings ◽

10.3390/coatings11050510 ◽

2021 ◽

Vol 11 (5) ◽

pp. 510

Author(s):

Yongqiang Pan ◽

Huan Liu ◽

Zhuoman Wang ◽

Jinmei Jia ◽

Jijie Zhao

Keyword(s):

Thin Films ◽

Film Thickness ◽

Deposition Rate ◽

Optical Constant ◽

Photoelectron Spectroscopy ◽

Linear Array ◽

Chemical Vapor ◽

Rf Plasma ◽

X Ray ◽

Sio2 Thin Film

SiO2 thin films are deposited by radio frequency (RF) plasma-enhanced chemical vapor deposition (PECVD) technique using SiH4 and N2O as precursor gases. The stoichiometry of SiO2 thin films is determined by the X-ray photoelectron spectroscopy (XPS), and the optical constant n and k are obtained by using variable angle spectroscopic ellipsometer (VASE) in the spectral range 380–1600 nm. The refractive index and extinction coefficient of the deposited SiO2 thin films at 500 nm are 1.464 and 0.0069, respectively. The deposition rate of SiO2 thin films is controlled by changing the reaction pressure. The effects of deposition rate, film thickness, and microstructure size on the conformality of SiO2 thin films are studied. The conformality of SiO2 thin films increases from 0.68 to 0.91, with the increase of deposition rate of the SiO2 thin film from 20.84 to 41.92 nm/min. The conformality of SiO2 thin films decreases with the increase of film thickness, and the higher the step height, the smaller the conformality of SiO2 thin films.

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A novel and potentially scalable CVD-based route towards SnO2:Mo thin films as transparent conducting oxides

Journal of Materials Science ◽

10.1007/s10853-021-06269-3 ◽

2021 ◽

Author(s):

Tianlei Ma ◽

Marek Nikiel ◽

Andrew G. Thomas ◽

Mohamed Missous ◽

David J. Lewis

Keyword(s):

Thin Films ◽

Photoelectron Spectroscopy ◽

Mixed Valence ◽

Chemical Vapour ◽

X Ray Diffraction ◽

X Ray ◽

Conducting Oxides ◽

Valence States ◽

3 Omega ◽

First Time

AbstractIn this report, we prepared transparent and conducting undoped and molybdenum-doped tin oxide (Mo–SnO2) thin films by aerosol-assisted chemical vapour deposition (AACVD). The relationship between the precursor concentration in the feed and in the resulting films was studied by energy-dispersive X-ray spectroscopy, suggesting that the efficiency of doping is quantitative and that this method could potentially impart exquisite control over dopant levels. All SnO2 films were in tetragonal structure as confirmed by powder X-ray diffraction measurements. X-ray photoelectron spectroscopy characterisation indicated for the first time that Mo ions were in mixed valence states of Mo(VI) and Mo(V) on the surface. Incorporation of Mo6+ resulted in the lowest resistivity of $$7.3 \times 10^{{ - 3}} \Omega \,{\text{cm}}$$ 7.3 × 10 - 3 Ω cm , compared to pure SnO2 films with resistivities of $$4.3\left( 0 \right) \times 10^{{ - 2}} \Omega \,{\text{cm}}$$ 4.3 0 × 10 - 2 Ω cm . Meanwhile, a high transmittance of 83% in the visible light range was also acquired. This work presents a comprehensive investigation into impact of Mo doping on SnO2 films synthesised by AACVD for the first time and establishes the potential for scalable deposition of SnO2:Mo thin films in TCO manufacturing. Graphical abstract

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X-ray Photoelectron Spectroscopy Analysis of Chitosan–Graphene Oxide-Based Composite Thin Films for Potential Optical Sensing Applications

Polymers ◽

10.3390/polym13030478 ◽

2021 ◽

Vol 13 (3) ◽

pp. 478

Author(s):

Wan Mohd Ebtisyam Mustaqim Mohd Daniyal ◽

Yap Wing Fen ◽

Silvan Saleviter ◽

Narong Chanlek ◽

Hideki Nakajima ◽

...

Keyword(s):

Thin Film ◽

Thin Films ◽

Graphene Oxide ◽

Photoelectron Spectroscopy ◽

Functional Group ◽

Optical Sensing ◽

Composite Thin Films ◽

Cobalt Ions ◽

X Ray ◽

Sensing Applications

In this study, X-ray photoelectron spectroscopy (XPS) was used to study chitosan–graphene oxide (chitosan–GO) incorporated with 4-(2-pyridylazo)resorcinol (PAR) and cadmium sulfide quantum dot (CdS QD) composite thin films for the potential optical sensing of cobalt ions (Co2+). From the XPS results, it was confirmed that carbon, oxygen, and nitrogen elements existed on the PAR–chitosan–GO thin film, while for CdS QD–chitosan–GO, the existence of carbon, oxygen, cadmium, nitrogen, and sulfur were confirmed. Further deconvolution of each element using the Gaussian–Lorentzian curve fitting program revealed the sub-peak component of each element and hence the corresponding functional group was identified. Next, investigation using surface plasmon resonance (SPR) optical sensor proved that both chitosan–GO-based thin films were able to detect Co2+ as low as 0.01 ppm for both composite thin films, while the PAR had the higher binding affinity. The interaction of the Co2+ with the thin films was characterized again using XPS to confirm the functional group involved during the reaction. The XPS results proved that primary amino in the PAR–chitosan–GO thin film contributed more important role for the reaction with Co2+, as in agreement with the SPR results.

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The Growth and Characterization of Germanium-Carbon Alloy Thin Films

MRS Proceedings ◽

10.1557/proc-270-91 ◽

1992 ◽

Vol 270 ◽

Author(s):

Haojie Yuan ◽

R. Stanley Williams

Keyword(s):

Thin Films ◽

Photoelectron Spectroscopy ◽

Vacuum Chamber ◽

Optical Band Gap ◽

High Vacuum ◽

Optical Absorption Spectroscopy ◽

Alloy Thin Film ◽

New Materials ◽

X Ray

ABSTRACTThin films of pure germanium-carbon alloys (GexC1−x with x ≈ 0.0, 0.2, 0.4, 0.5, 0.6, 0.8, 1.0) have been grown on Si(100) and A12O3 (0001) substrates by pulsed laser ablation in a high vacuum chamber. The films were analyzed by x-ray θ-2θ diffraction (XRD), x-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), conductivity measurements and optical absorption spectroscopy. The analyses of these new materials showed that films of all compositions were amorphous, free of contamination and uniform in composition. By changing the film composition, the optical band gap of these semiconducting films was varied from 0.00eV to 0.85eV for x = 0.0 to 1.0 respectively. According to the AES results, the carbon atoms in the Ge-C alloy thin film samples has a bonding configuration that is a mixture of sp2 and sp3 hybridizations.

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