Compositional imaging in the Electron Microscope

Author(s):  
C. E. Lyman

Imaging of elemental distributions on a fine scale is one of the triumphs of electron microscopy. Compositional imaging frees the operator from the necessity of making decisions about which features contain the elements of interest. Elements in unexpected locations, or in unexpected association with other elements, may be found easily without operator bias as to where to locate the electron probe for compositional data collection. This technique may be applied to bulk or thin specimens using a variety of composition-sensitive signals as shown in Figure 1.Cosslett and Duncumb obtained the first such compositional image in an electron microprobe modified to scan the electron beam and collect a characteristic x-ray signal as a function of beam position. Early images of this type were called x-ray “dot maps” and provided a qualitative indication of the location of elements on a flat polished bulk specimen to a spatial resolution of about 1 μm.

Author(s):  
David Joy ◽  
James Pawley

The scanning electron microscope (SEM) builds up an image by sampling contiguous sub-volumes near the surface of the specimen. A fine electron beam selectively excites each sub-volume and then the intensity of some resulting signal is measured. The spatial resolution of images made using such a process is limited by at least three factors. Two of these determine the size of the interaction volume: the size of the electron probe and the extent to which detectable signal is excited from locations remote from the beam impact point. A third limitation emerges from the fact that the probing beam is composed of a finite number of discrete particles and therefore that the accuracy with which any detectable signal can be measured is limited by Poisson statistics applied to this number (or to the number of events actually detected if this is smaller).


Author(s):  
Richard S. Thomas ◽  
Mabel I. Corlett

Ash patterns produced by oxygen plasma microincineration(OPM) of thin-sectioned biological materials and examined with the transmission electron microscope (TEM) can show unambiguously the distribution of mineral substances in the specimen with resolutions down to 100 Å. The chemical nature of the mineral is not demonstrated, however. Electron-probe X-ray microanalysis (EXM), on the other hand, can determine precisely the nature of the mineral in ashgd or unashed sections but its spatial resolution is limited to 1000-10,000 A at best. Also its sensitivity of analysis on unashed specimens is limited by intolerance of the specimen to high beam intensities. Using both TEM and EXM together on ash patterns of suitable specimens can overcome their independent spatial and chemical limitations. Furthermore, use of OPM produces a highly stable mineral specimen for EXM, thereby improving sensitivity.


2006 ◽  
Vol 21 (12) ◽  
pp. 3109-3123 ◽  
Author(s):  
S. Gupta ◽  
R.J. Patel ◽  
R.E. Giedd

Influence of low and medium energy electron beam (E-beam) irradiation on the single-walled (SW) and multiwalled (MW) carbon nanotube films grown by microwave chemical vapor deposition are investigated. These films were subjected to electron beam energy of 50 keV from scanning electron microscope for 2.5, 5.5, 8.0, and 15 h and 100, 200, and 300 keV from transmission electron microscope electron gun for a few minutes to approximately 2 h continuously. To assess the surface modifications/structural degradation, the films were analyzed prior to and post-irradiation using x-ray diffraction and micro-Raman spectroscopy in addition to in situ monitoring by scanning and high-resolution transmission electron microscopy. A minimal increase in intertube or interplanar spacing (i.e., d002) for MW nanotubes ranging from 3.25–3.29 Å (∼3%) can be analogized to change in c-axis of graphite lattice due to thermal effects measured using x-ray diffraction. Resonance Raman spectroscopy revealed that irradiation generated defects in the lattice evaluated through variation of: the intensity of radial breathing mode (RBM), intensity ratio of D to G band (ID/IG), position of D and G bands and their harmonics (D* and G*). The increase in the defect-induced D band intensity, quenching of RBM intensity, and only a slight increase in G band intensity are some of the implications. The MW nanotubes tend to reach a state of saturation for prolonged exposures, while SW transforming semiconducting to quasi-metallic character. Softening of the q = 0 selection rule is suggested as a possible way to explain these results. It is also suggestive that knock-on collision may not be the primary cause of structural degradation, rather a local gradual reorganization, i.e., sp2+δ ⇔ sp2+δ, sp2 C seems quite possible. Experiments showed that with extended exposures, both kinds of nanotubes displayed various local structural instabilities including pinching, graphitization/amorphization, and forming intra-molecular junction (IMJ) within the area of electron beam focus possibly through amorphous carbon aggregates. They also displayed curling and closure forming nano-ring and helix-like structures while mending their dangling bonds. High-resolution transmission electron microscopy electrons corroborated these conclusions. Manufacturing of nanoscale structures “nano-engineering” of carbon-based systems is tentatively ascribed to irradiation-induced solid-state phase transformation, in contrast to conventional nanotube synthesis from the gas phase.


Author(s):  
A J Craven ◽  
W A P Nicholson

When using an energy dispersive x-ray (EDX) detector on an electron microscope, it is important that the region of the specimen irradiated by the electron beam lies in the centre of the field of view of the collimator, which itself must be correctly positioned with respect to the detector crystal. When the microscope column is vented to atmospheric pressure, it is possible to observe the position of the collimator through ports that give access to the specimen region, provided that the detector has a window that can withstand atmospheric pressure. With a windowless detector, this is not possible although it may be possible to align the collimator assembly in this manner. After initial alignment, the detector is often mounted and de-mounted without such a visual check on the alignment, particularly if the microscope is equipped with a gate valve which allows mounting and de-mounting of the detector without venting the microscope column to atmospheric pressure.


Author(s):  
Carl Nail

Abstract Elementally characterizing intermetallic compounds (IMCs) to identify phases has routinely required relatively expensive transmission electron microscopy (TEM) analysis. A study was done characterizing IMCs using less expensive energydispersive x-ray (EDX) spectroscopy tools to investigate it as a practical alternative to TEM. The study found that EDX line scanning can differentiate phases by tracking changes in count rate as the electron beam of a scanning electron microscope (SEM) passes from one phase to another.


2009 ◽  
Vol 8 ◽  
pp. 141-146 ◽  
Author(s):  
Claude Mirguet ◽  
Christian Roucau ◽  
Philippe Sciau

Optical microscopy allows observation of details of the order of micrometers. In an electron microscope that uses an electron beam to make an image, the resolution is a thousand times better. It becomes possible to observe details of the nanometer (nm) in conventional mode and order of the Angstrom (1 Å = 0.1 nm) in high resolution mode. This technique requires a delicate preparation of samples to be sufficiently thin (≤ 100 nm) to allow the passage of electrons to an observation in transmission. The transfer of energy between incident electrons and atoms in the sample are operated through energy loss spectroscopy (EELS) and X-ray emission (EDX) to perform a chemical analysis of the observed object. The purpose of this paper is to show, through some examples, the potential of transmission electron microscopy and related techniques in the study of structure and composition of heritage materials.


Author(s):  
R. Sinclair ◽  
B.E. Jacobson

INTRODUCTIONThe prospect of performing chemical analysis of thin specimens at any desired level of resolution is particularly appealing to the materials scientist. Commercial TEM-based systems are now available which virtually provide this capability. The purpose of this contribution is to illustrate its application to problems which would have been intractable until recently, pointing out some current limitations.X-RAY ANALYSISIn an attempt to fabricate superconducting materials with high critical currents and temperature, thin Nb3Sn films have been prepared by electron beam vapor deposition [1]. Fine-grain size material is desirable which may be achieved by codeposition with small amounts of Al2O3 . Figure 1 shows the STEM microstructure, with large (∽ 200 Å dia) voids present at the grain boundaries. Higher quality TEM micrographs (e.g. fig. 2) reveal the presence of small voids within the grains which are absent in pure Nb3Sn prepared under identical conditions. The X-ray spectrum from large (∽ lμ dia) or small (∽100 Ǻ dia) areas within the grains indicates only small amounts of A1 (fig.3).


Author(s):  
W. Brünger

Reconstructive tomography is a new technique in diagnostic radiology for imaging cross-sectional planes of the human body /1/. A collimated beam of X-rays is scanned through a thin slice of the body and the transmitted intensity is recorded by a detector giving a linear shadow graph or projection (see fig. 1). Many of these projections at different angles are used to reconstruct the body-layer, usually with the aid of a computer. The picture element size of present tomographic scanners is approximately 1.1 mm2.Micro tomography can be realized using the very fine X-ray source generated by the focused electron beam of a scanning electron microscope (see fig. 2). The translation of the X-ray source is done by a line scan of the electron beam on a polished target surface /2/. Projections at different angles are produced by rotating the object.During the registration of a single scan the electron beam is deflected in one direction only, while both deflections are operating in the display tube.


1999 ◽  
Vol 14 (7) ◽  
pp. 3169-3174 ◽  
Author(s):  
Reiko Murao ◽  
Masae Kikuchi ◽  
Kiyoto Fukuoka ◽  
Eiji Aoyagi ◽  
Toshiyuki Atou ◽  
...  

Shock compression experiments on powder mixtures of niobium metal and quartz were conducted for the pressure range of 30–40 GPa by a 25-mm single-stage propellant gun. Chemical reaction occurred above 35 GPa, and products were found to be mainly so-called “Cu3Au-type” Nb3Si, which contained a small amount of oxygen. Microtextures of the specimen were examined by scanning and transmission electron microscopy. A field-emission transmission electron microscope was used for energy-dispersive x-ray analysis of microtextures in small particles found in the SiO2 matrix, and various species with different Nb/Si ratio and oxygen content were shown to be produced through the nonequilibrium process of shock compression.


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