TEM characterization of SiGe heterolayers grown on SIMOX

Author(s):  
N. David Theodore ◽  
Peter Fejes ◽  
Mamoru Tomozane ◽  
Ming Liaw

SiGe heterolayers are of interest for use in heterojunction transistors, infrared detectors and field-effect transistors. SIMOX (Separation of silicon by IMplanted OXygen) is useful for fabrication of silicon-on-insulator (SOI) structures (electrically isolated from the substrate). SIMOX could potentially be used for isolation of SiGe structures from the substrate. Epitaxial-Si grown on SIMOX (required for some device structures) can have grown-in dislocations that arise due to STMOX-related damage. If SiGe heterolayers were grown on silicon, dislocations could interact with the strain fields associated with the SiGe layers. Such interaction could possibly lead to a reduction in defect densities in upper layers of the structures. In the present study, SiGe heterolayers grown on SIMOX by chemical vapor deposition were characterized using TEM. The structures consisted of epi-silicon grown on a Si/Sii-xGex superlattice which was in turn grown on a Si/SiO2 (SIMOX) structure. The behavior of defects in the structures was of interest.

2010 ◽  
Vol 121 (3) ◽  
pp. 397-401 ◽  
Author(s):  
Rajat Kanti Paul ◽  
Miroslav Penchev ◽  
Jiebin Zhong ◽  
Mihrimah Ozkan ◽  
Maziar Ghazinejad ◽  
...  

2020 ◽  
Vol 67 (4) ◽  
pp. 1839-1844 ◽  
Author(s):  
M. Asghari Heidarlou ◽  
P. Paletti ◽  
B. Jariwala ◽  
J. A. Robinson ◽  
S. K. Fullerton-Shirey ◽  
...  

2011 ◽  
Vol 2011 ◽  
pp. 1-7 ◽  
Author(s):  
Chin-Lung Cheng ◽  
Chien-Wei Liu ◽  
Bau-Tong Dai ◽  
Ming-Yen Lee

Carbon nanotubes (CNTs) have been explored in nanoelectronics to realize desirable device performances. Thus, carbon nanotube network field-effect transistors (CNTNFETs) have been developed directly by means of alcohol catalytic chemical vapor deposition (ACCVD) method using Co-Mo catalysts in this work. Various treated temperatures, growth time, and Co/Mo catalysts were employed to explore various surface morphologies of carbon nanotube networks (CNTNs) formed on the SiO2/n-type Si(100) stacked substrate. Experimental results show that most semiconducting single-walled carbon nanotube networks with 5–7 nm in diameter and low disorder-induced mode (D-band) were grown. A bipolar property of CNTNFETs synthesized by ACCVD and using HfO2as top-gate dielectric was demonstrated. Various electrical characteristics, including drain current versus drain voltage(Id-Vd), drain current versus gate voltage(Id-Vg), mobility, subthreshold slope (SS), and transconductance(Gm), were obtained.


RSC Advances ◽  
2020 ◽  
Vol 10 (2) ◽  
pp. 1127-1131 ◽  
Author(s):  
Morteza Hassanpour Amiri ◽  
Jonas Heidler ◽  
Ahmar Hasnain ◽  
Saleem Anwar ◽  
Hao Lu ◽  
...  

The paper addresses the technical challenge of producing doping-free transferred graphene layers produced by catalytic chemical vapor deposition (CVD), thereby preventing uncontrolled shift of the Dirac point in comprising field-effect transistors.


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