S/N Ratio Characteristics of the Imaging Plate System for A TEM
The fundamental characteristics of the Imaging Plate System for a TEM (TEM-IP System) have already been ascertained and the system has began to be put to practical use in various fields of transmission electron microscopy. When considering the practicability of any image recording device, the “image quality” is an important factor.In this study, the S/N ratio of the TEM-IP System, one of the evaluation factors for the “image quality” of the system is estimated.Signal measurement was carried out under two readout conditions high resolution mode (HR-Mode) and high sensitivity mode (HS-Mode), which are available in the IP-reader of the PIXsysTEM. In order to distinguish between instrumental noise (system noise) and noninstrumental noise (quantum noise), the S/N ratio was measured as a function of the electron dose, and the dose was widely varied in the dynamic range of the system.