Phase Retrieval from Two Defocused Images by the Transport-Ofintensity Equation Formalism with Fast Fourier Transform

2001 ◽  
Vol 7 (S2) ◽  
pp. 430-431
Author(s):  
V.V. Volkov ◽  
Y. Zhu

The problem of phase retrieval from intensity measurements plays an important role in many fields of physical research, e.g. optics, electron and x-ray microscopy, crystallography, diffraction tomography and others. in practice the recorded images contain information only on the intensity distribution I(x,y) = ψ*ψ*= |A|2 of the imaging wave function ψ = A*exp(-iϕ) and the phase information (ϕ(x,y) is usually lost. in general, the phase problem can be solved either by special holographic/interferometric methods, or by noninterferometric approaches based on intensity measurements in far Fraunhofer zone or in the Fresnel zone at two adjacent planes orthogonal to the optical axis. The latter approach uses the transport-of-intensity equation (TIE) formalism, introduced originally by Teague [1] and developed later in [2]. Applications of TIE to nonmagnetic materials and magnetic inductance mapping were successfully made in [3,4]. However, this approach still needs further improvement both in mathematics and in practical solutions, since the result is very sensitive to many experimental parameters.

1971 ◽  
Vol 41 ◽  
pp. 233-250 ◽  
Author(s):  
R. Tousey

Following a brief historical review, new observations of the sun in the wavelength range 3000 to 20 Å are surveyed for the period since about 1958. Vehicles employed have been sounding rockets, the OSO (Orbiting Solar Observatories), balloons for the window 2300–1900 Å and for λ > 2700 Å, and small orbiting observatories such as Solrad, for XUV solar monitoring. Advances have been made in spectral resolution, using echelle gratings and also Fabry-Pérot interferometers. Much progress has been made towards increased spatial resolution, to obtain spectra of specific solar features and to analyse the chromosphere and corona. Methods employed include spectrographs that are stigmatic, or that have a stabilized solar image projected onto the slit; slitless objective-type spectrographs; and observations during a total eclipse. Spectra have been obtained of a solar flare, showing its form and intensity in the emission lines between 171 and 630 Å. From OSO 4–6 many XUV spectroheliograms and spectra have been obtained over the range 300 to 1350 Å, with spatial resolution 35 × 35 arc sec in OSO 6. Photographic XUV spectroheliograms have provided solar images with spatial resolution as great as 3 arc sec in some cases. Although much effort has been spent to increase the accuracy of XUV intensity measurements, a great deal remains to be done before the requirements of solar physics theory are satisfied. Line identification, however, is proceeding well, although more laboratory spectroscopy is needed. Not included in the survey is the Bragg Spectrometer X-ray range below about 20 Å.


Electronics ◽  
2021 ◽  
Vol 10 (8) ◽  
pp. 969
Author(s):  
Alok K. Gupta ◽  
Praveen Kumar ◽  
Naveen K. Nishchal ◽  
Ayman Alfalou

In this study, we propose a novel method to encrypt fully-phase information combining the concepts of the transport of intensity equation and spatially variant polarization encoding. The transport of intensity equation is a non-iterative and non-interferometric phase-retrieval method which recovers the phase information from defocused intensities. Spatially variant polarization encoding employs defocused intensity measurements. The proposed cryptosystem uses a two-step optical experimentation process—primarily, a simple set-up for defocused intensities recording for phase retrieval and then a set-up for encoding. Strong security, convenient intensity-based measurements, and noise-free decryption are the main features of the proposed method. The simulation results have been presented in support of the proposed idea. However, the TIE section of the cryptosystem, as of now, has been experimentally demonstrated for micro-lens.


2020 ◽  
Vol 27 (3) ◽  
pp. 852-859 ◽  
Author(s):  
Leon M. Lohse ◽  
Anna-Lena Robisch ◽  
Mareike Töpperwien ◽  
Simon Maretzke ◽  
Martin Krenkel ◽  
...  

Propagation-based phase-contrast X-ray imaging is by now a well established imaging technique, which – as a full-field technique – is particularly useful for tomography applications. Since it can be implemented with synchrotron radiation and at laboratory micro-focus sources, it covers a wide range of applications. A limiting factor in its development has been the phase-retrieval step, which was often performed using methods with a limited regime of applicability, typically based on linearization. In this work, a much larger set of algorithms, which covers a wide range of cases (experimental parameters, objects and constraints), is compiled into a single toolbox – the HoloTomoToolbox – which is made publicly available. Importantly, the unified structure of the implemented phase-retrieval functions facilitates their use and performance test on different experimental data.


2012 ◽  
Vol 20 (21) ◽  
pp. 24038 ◽  
Author(s):  
Xiaojing Huang ◽  
Michael Wojcik ◽  
Nicolas Burdet ◽  
Isaac Peterson ◽  
Graeme R. Morrison ◽  
...  

Author(s):  
J.M. Titchmarsh

The advances in recent years in the microanalytical capabilities of conventional TEM's fitted with probe forming lenses allow much more detailed investigations to be made of the microstructures of complex alloys, such as ferritic steels, than have been possible previously. In particular, the identification of individual precipitate particles with dimensions of a few tens of nanometers in alloys containing high densities of several chemically and crystallographically different precipitate types is feasible. The aim of the investigation described in this paper was to establish a method which allowed individual particle identification to be made in a few seconds so that large numbers of particles could be examined in a few hours.A Philips EM400 microscope, fitted with the scanning transmission (STEM) objective lens pole-pieces and an EDAX energy dispersive X-ray analyser, was used at 120 kV with a thermal W hairpin filament. The precipitates examined were extracted using a standard C replica technique from specimens of a 2¼Cr-lMo ferritic steel in a quenched and tempered condition.


Author(s):  
M.D. Ball ◽  
H. Lagace ◽  
M.C. Thornton

The backscattered electron coefficient η for transmission electron microscope specimens depends on both the atomic number Z and the thickness t. Hence for specimens of known atomic number, the thickness can be determined from backscattered electron coefficient measurements. This work describes a simple and convenient method of estimating the thickness and the corrected composition of areas of uncertain atomic number by combining x-ray microanalysis and backscattered electron intensity measurements.The method is best described in terms of the flow chart shown In Figure 1. Having selected a feature of interest, x-ray microanalysis data is recorded and used to estimate the composition. At this stage thickness corrections for absorption and fluorescence are not performed.


Author(s):  
Imre Pozsgai ◽  
Klara Erdöhalmi-Torok

The paintings by the great Hungarian master Mihaly Munkacsy (1844-1900) made in an 8-9 years period of his activity are deteriorating. The most conspicuous sign of the deterioration is an intensive darkening. We have made an attempt by electron beam microanalysis to clarify the causes of the darkening. The importance of a study like this is increased by the fact that a similar darkening can be observed on the paintings by Munkacsy’s contemporaries e.g Courbet and Makart. A thick brown mass the so called bitumen used by Munkacsy for grounding and also as a paint is believed by the art historians to cause the darkening.For this study, paint specimens were taken from the following paintings: “Studio”, “Farewell” and the “Portrait of the Master’s Wife”, all of them are the property of the Hungarian National Gallery. The paint samples were embedded in a polyester resin “Poly-Pol PS-230” and after grinding and polishing their cross section was used for x-ray mapping.


Author(s):  
Judith M. Brock ◽  
Max T. Otten

A knowledge of the distribution of chemical elements in a specimen is often highly useful. In materials science specimens features such as grain boundaries and precipitates generally force a certain order on mental distribution, so that a single profile away from the boundary or precipitate gives a full description of all relevant data. No such simplicity can be assumed in life science specimens, where elements can occur various combinations and in different concentrations in tissue. In the latter case a two-dimensional elemental-distribution image is required to describe the material adequately. X-ray mapping provides such of the distribution of elements.The big disadvantage of x-ray mapping hitherto has been one requirement: the transmission electron microscope must have the scanning function. In cases where the STEM functionality – to record scanning images using a variety of STEM detectors – is not used, but only x-ray mapping is intended, a significant investment must still be made in the scanning system: electronics that drive the beam, detectors for generating the scanning images, and monitors for displaying and recording the images.


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