scholarly journals Overview of Pacific Northwest Center for Cryo-EM (PNCC): State-of-the-art electron microscopy and computational resource access free-of-charge for bioscience community

2021 ◽  
Vol 27 (S1) ◽  
pp. 1914-1915
Author(s):  
Irina Novikova ◽  
James Evans
2013 ◽  
Vol 52 (11) ◽  
pp. 2377-2395 ◽  
Author(s):  
Imke Durre ◽  
Michael F. Squires ◽  
Russell S. Vose ◽  
Xungang Yin ◽  
Anthony Arguez ◽  
...  

AbstractThe 1981–2010 “U.S. Climate Normals” released by the National Oceanic and Atmospheric Administration’s (NOAA) National Climatic Data Center include a suite of monthly, seasonal, and annual statistics that are based on precipitation, snowfall, and snow-depth measurements. This paper describes the procedures used to calculate the average totals, frequencies of occurrence, and percentiles that constitute these normals. All parameters were calculated from a single, state-of-the-art dataset of daily observations, taking care to produce normals that were as representative as possible of the full 1981–2010 period, even when the underlying data records were incomplete. In the resulting product, average precipitation totals are available at approximately 9300 stations across the United States and parts of the Caribbean Sea and Pacific Ocean islands. Snowfall and snow-depth statistics are provided for approximately 5300 of those stations, as compared with several hundred stations in the 1971–2000 normals. The 1981–2010 statistics exhibit the familiar climatological patterns across the contiguous United States. When compared with the same calculations for 1971–2000, the later period is characterized by a smaller number of days with snow on the ground and less total annual snowfall across much of the contiguous United States; wetter conditions over much of the Great Plains, Midwest, and northern California; and drier conditions over much of the Southeast and Pacific Northwest. These differences are a reflection of the removal of the 1970s and the addition of the 2000s to the 30-yr-normals period as part of this latest revision of the normals.


2020 ◽  
Vol 10 (16) ◽  
pp. 5427
Author(s):  
Philippe Lambin

Like in many countries, research devoted to nanosciences in Belgium grew up after high-resolution electron microscopy and local probe microscopic tools became available [...]


2020 ◽  
Vol 11 (1) ◽  
Author(s):  
Dongha Kim ◽  
Young-Wan Oh ◽  
Jong Uk Kim ◽  
Soogil Lee ◽  
Arthur Baucour ◽  
...  

AbstractMagnetic and spintronic media have offered fundamental scientific subjects and technological applications. Magneto-optic Kerr effect (MOKE) microscopy provides the most accessible platform to study the dynamics of spins, magnetic quasi-particles, and domain walls. However, in the research of nanoscale spin textures and state-of-the-art spintronic devices, optical techniques are generally restricted by the extremely weak magneto-optical activity and diffraction limit. Highly sophisticated, expensive electron microscopy and scanning probe methods thus have come to the forefront. Here, we show that extreme anti-reflection (EAR) dramatically improves the performance and functionality of MOKE microscopy. For 1-nm-thin Co film, we demonstrate a Kerr amplitude as large as 20° and magnetic domain imaging visibility of 0.47. Especially, EAR-enhanced MOKE microscopy enables real-time detection and statistical analysis of sub-wavelength magnetic domain reversals. Furthermore, we exploit enhanced magneto-optic birefringence and demonstrate analyser-free MOKE microscopy. The EAR technique is promising for optical investigations and applications of nanomagnetic systems.


Author(s):  
Fu-Rong Che ◽  
A.H. King

Dislocation models for low angle grain boundaries have been widely known since 1950 and the proposed structures have been extensively confirmed by transmission electron microscopy, although most studies have been confined to the cubic metals. A generalization of the earlier geometrical work, known as the 0-lattice, represents the state of the art in predicting grain boundary structures on a purely geometrical basis, but the analysis is always predicated on the assumption that grain boundaries are basically planar defects. In some work on precipitation in the Al-Zn-Mg system Vanderwalker and Vander Sande observed non-planar low angle grain boundaries, although these may have been the results of pinning by embryonic precipitates or other solute interaction effects: we have observed non-planar boundaries in pure zinc where no such pinning effects are available to explain the puckering.


Author(s):  
Knut W. Urban ◽  
Chun-Lin Jia ◽  
Lothar Houben ◽  
Markus Lentzen ◽  
Shao-Bo Mi ◽  
...  

Aberration-corrected transmission electron microscopy allows us to image the structure of matter at genuine atomic resolution. A prominent role for the imaging of crystalline samples is played by the negative spherical aberration imaging (NCSI) technique. The physical background of this technique is reviewed. The especially high contrast observed under these conditions owes its origin to an enhancing combination of amplitude contrast due to electron diffraction channelling and phase contrast. A number of examples of the application of NCSI are reviewed in order to illustrate the applicability and the state-of-the-art of this technique.


2012 ◽  
Vol 16 (07n08) ◽  
pp. 713-740 ◽  
Author(s):  
José H. Zagal ◽  
Sophie Griveau ◽  
Mireya Santander-Nelli ◽  
Silvia Gutierrez Granados ◽  
Fethi Bedioui

We discuss here the state of the art on hybrid materials made from single (SWCNT) or multi (MWCNT) walled carbon nanotubes and MN4complexes such as metalloporphyrins and metallophthalocyanines. The hybrid materials have been characterized by several methods such as cyclic voltammetry (CV), scanning electron microscopy (SEM), transmission electron microscopy (TEM), X-ray photoelectron spectroscopy (XPS), atomic force microscopy (AFM) and scanning electrochemical microscropy (SECM). The materials are employed for electrocatalysis of reactions such as oxygen and hydrogen peroxide reduction, nitric oxide oxidation, oxidation of thiols and other pollutants.


1996 ◽  
Vol 4 (7) ◽  
pp. 12-13
Author(s):  
David C. Joy ◽  
Carolyn S. Joy

Although the benefits of operating the scanning electron microscope at low beam energies have been evident since the earliest days of the instrument, the successful utilization of the SEM under these conditions has required the development of high brightness field emission electron source, advanced lenses, and clean vacuums. As these technologies became available the level at which imaging became regarded as “low energy” has fallen from 10 keV, first to 5 keV, and more recently to 1 keV. At this energy state of the art, instruments can now provide an excellent balance between resolution - which becomes worse with decreasing energy - and desirable goals such as the minimization of sample charging and the reduction of macroscopic radiation damage - which tend to become more challenging as the energy is increased.


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