Quick Sample Preparation and EFTEM Elemental Characterization of FAB Based Defects
Keyword(s):
A purpose of microscopy is to magnify and enhance contrast between different regions of a sample, whether those regions may be different structures, different orientations of the same structure, regions of different atomic weight, or different chemistries. In the present case, elemental mapping in the energy filtered transmission electron microscope (EFTEM) is used to enhance contrast between elements in an apparent bundle of fibers previously seen through scanning electron microscopy (SEM) and a particle that appears to be a catalytic source for the fibers.
1969 ◽
Vol 27
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pp. 38-39
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2012 ◽
Vol 174-177
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pp. 508-511
2010 ◽
Vol 434-435
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pp. 850-852
1973 ◽
Vol 31
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pp. 438-439