Surface Characterization of the Spinel LixMn2O4Cathode before and after Storage at Elevated Temperatures

2001 ◽  
Vol 13 (11) ◽  
pp. 4207-4212 ◽  
Author(s):  
Forest T. Quinlan ◽  
Keiichiro Sano ◽  
Trevor Willey ◽  
Ruxandra Vidu ◽  
Ken Tasaki ◽  
...  
Keyword(s):  
Surface Characterization ◽  
Elevated Temperatures ◽  
Before And After

Surface Characterization of Monolithic Zirconia Following Treatment with Different Polishing Techniques

2020 ◽  
Vol 980 ◽  
pp. 176-186
Author(s):  
Zhen Yu Tang ◽  
Xin Yi Zhao ◽  
Anderson T. Hara
Keyword(s):  
Phase Transformation ◽  
Surface Characterization ◽  
Point Of View ◽  
Xps Analysis ◽  
Diamond Bur ◽  
Before And After ◽  
Monolithic Zirconia ◽  
Polishing Procedures ◽  
Xrd Patterns

The purpose of this study was to evaluate the effects of different polishing techniques on the topographical features and phase transformation of monolithic zirconia. Four brands of zirconia were ground and polished using one of four systems. All zirconia specimens were ground with a fine-grit diamond bur (GB) prior to polishing procedures. The surface roughness and phase transition (XRD) were evaluated, and surface characterizations (SEM and XPS) were performed. The highest roughness was obtained with the Tob system. The strongest diffraction peak in the obtained XRD patterns was at 2θ=30.246°. No monoclinic phase change was found in any group. The XPS analysis showed that the atomic percentages of yttrium in the specimens of Cercon before and after polishing were the highest of any sample. All the polishing systems tested may not adversely affect the phase transformation of monolithic zirconia. The Tob system resulted in the highest roughness. The XPS analysis showed that grinding and polishing had some effects on the properties of zirconia from a microscopic point of view.

Post Metallization Annealing Characterization of Interface Properties of High-κ Dielectrics Stack on Silicon Carbide

2008 ◽  
Vol 600-603 ◽  
pp. 771-774 ◽  
Author(s):  
Ming Hung Weng ◽  
Rajat Mahapatra ◽  
Nicolas G. Wright ◽  
Alton B. Horsfall
Keyword(s):  
Elevated Temperatures ◽  
Gate Dielectric ◽  
Flat Band ◽  
Interface Properties ◽  
Temperature Dependent ◽  
Oxide Charge ◽  
Before And After ◽  
Mis Capacitors ◽  
The Ideal

The interface properties of TiO2/SiO2/SiC metal-insulator-semiconductor (MIS) capacitors were investigated by C-V and G-V measurements over a range of frequencies between 10 kHz and 1 MHz from room temperature up to 500°C. Ledges from multiple traps were observed during high frequency (1 MHz) sweeps from inversion to accumulation during measurements at elevated temperatures. The high measuring temperature resulted in the annealing of the sample, where the existence of trap ledges was observed to be temperature dependent. For n-type substrate negative Qf causes the shift of the C-V curve to more negative gate bias with respect to the ideal C-V curve. These fixed oxide charge is substantially reduced after post metallization annealing (PMA). We report the flat band voltage, detail in reducing fixed oxide charge and temperature dependence of density of interface traps before and after annealing of TiO2 high-κ gate dielectric stacks on a 4H-SiC based device.

Surface characterization of titanium implant healing abutments before and after placement

2017 ◽  
Vol 20 (2) ◽  
pp. 180-190 ◽  
Author(s):  
Sutton E. Wheelis ◽  
Thomas G. Wilson ◽  
Pilar Valderrama ◽  
Danieli C. Rodrigues
Keyword(s):  
Surface Characterization ◽  
Titanium Implant ◽  
Before And After

Surface Characterization of Gallium Nitride Modified with Peptides before and after Exposure to Ionizing Radiation in Solution

Langmuir ◽  
2014 ◽  
Vol 30 (51) ◽  
pp. 15477-15485 ◽  
Author(s):  
Nora G. Berg ◽  
Michael W. Nolan ◽  
Tania Paskova ◽  
Albena Ivanisevic
Keyword(s):  
Gallium Nitride ◽  
Ionizing Radiation ◽  
Surface Characterization ◽  
Before And After

scholarly journals Surface Characterization of Absorbing Polymer Films Deposited on Transparent Glasses

e-Polymers ◽  
2008 ◽  
Vol 8 (1) ◽  
Author(s):  
Débora Gonçalves ◽  
Silmar A. Travain ◽  
José A. Giacometti ◽  
Eugene A. Irene
Keyword(s):  
Polymer Films ◽  
Surface Characterization ◽  
Transparent Glass ◽  
Force Microscopy ◽  
Glass Substrates ◽  
Atomic Force ◽  
Vis Spectroscopy ◽  
Before And After

AbstractPANI films were deposited on glass substrates by in-situ polymerization and characterized by UV-VIS spectroscopy and atomic force microscopy. A method is developed to accurately analyze ellipsometric data obtained for transparent glass substrates before and after modification with absorbing polymer films. Surface modification was made with an overlayer such as polyaniline (PANI), which exhibits different optical properties by varying its oxidation state. First, the issue of using transparent substrates for ellipsometry studies was examined and then, spectroscopic ellipsometry was used to characterize absorbing overlayers on transparent glasses. The same methodologies of data analysis can be also applied to other absorbing films on transparent substrates, and deposited by different techniques

scholarly journals SURFACE CHARACTERIZATION OF TITANIUM ALLOYS FOR NITROGEN ION IMPLANTATION

2017 ◽  
Vol 9 ◽  
pp. 39
Author(s):  
Petr Vertat ◽  
Jan Drahokoupil ◽  
Petr Vlcak
Keyword(s):  
Surface Modification ◽  
Ion Implantation ◽  
Surface Characterization ◽  
X Ray Diffraction ◽  
Nitrogen Ion Implantation ◽  
X Ray ◽  
Commercially Pure ◽  
Before And After ◽  
Nitrogen Ion

Ion implantation is one of the modern methods of the surface modification of various materials. Industrially used Ti–6Al–4V titanium alloy and commercially pure Ti grade 2 were characterized using the X–ray diffraction methods. Texture of the material and dependence of the microstructural properties on the method of the surface modification were examined in order to determine suitable conditions for application of the process in the industry. The structure of Ti–6Al–4V alloy before and after the nitrogen ion implantation process is discussed and observed surface hardening is explained.

scholarly journals Oxidation of MBE-Grown ZnTe and ZnTe/Zn Nanowires and Their Structural Properties

Materials ◽  
2021 ◽  
Vol 14 (18) ◽  
pp. 5252
Author(s):  
Katarzyna Gas ◽  
Slawomir Kret ◽  
Wojciech Zaleszczyk ◽  
Eliana Kamińska ◽  
Maciej Sawicki ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Elevated Temperatures ◽  
Atmospheric Conditions ◽  
Zno Nanocrystals ◽  
Transmission Electron ◽  
Before And After ◽  
Fine Crystalline Structure ◽  
And Performance ◽  
Comparative Structural Characterization

Results of comparative structural characterization of bare and Zn-covered ZnTe nanowires (NWs) before and after thermal oxidation at 300 °C are presented. Scanning electron microscopy, energy-dispersive X-ray spectroscopy, high-resolution transmission electron microscopy, and Raman scattering not only unambiguously confirm the conversion of the outer layer of the NWs into ZnO, but also demonstrate the influence of the oxidation process on the structure of the inner part of the NWs. Our study shows that the morphology of the resulting ZnO can be improved by the deposition of thin Zn shells on the bare ZnTe NWs prior to the oxidation. The oxidation of bare ZnTe NWs results in the formation of separated ZnO nanocrystals which decorate crystalline Te cores of the NWs. In the case of Zn-covered NWs, uniform ZnO shells are formed, however they are of a fine-crystalline structure or partially amorphous. Our study provides an important insight into the details of the oxidation processes of ZnTe nanostructures, which could be of importance for the preparation and performance of ZnTe based nano-devices operating under normal atmospheric conditions and at elevated temperatures.

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