scholarly journals Measurement of Young's modulus of clay minerals using atomic force acoustic microscopy

2002 ◽  
Vol 29 (8) ◽  
pp. 13-1-13-4 ◽  
Author(s):  
Manika Prasad ◽  
Malgorzata Kopycinska ◽  
Ute Rabe ◽  
Walter Arnold
Keyword(s):  
Young’S Modulus ◽  
Clay Minerals ◽  
Young's Modulus ◽  
Acoustic Microscopy ◽  
Atomic Force

Quantitative Contact Spectroscopy and Imaging by Atomic-Force Acoustic Microscopy

1999 ◽  
Vol 591 ◽  
Author(s):  
W. Arnold ◽  
S. Amelio ◽  
S. Hirsekorn ◽  
U. Rabe
Keyword(s):  
Young’S Modulus ◽  
Lead Zirconate Titanate ◽  
Young's Modulus ◽  
Contact Stiffness ◽  
Near Field ◽  
Lead Zirconate ◽  
Acoustic Microscopy ◽  
Atomic Force ◽  
Resonance Frequencies ◽  
Nanocrystalline Ferrite

ABSTRACTAtomic Force Acoustic Microscopy is a near-field technique which combines the ability in using ultrasonics to image elastic properties with the high lateral resolution of scanning probe microscopes. We present a technique to measure the contact stiffness and the Young's modulus of sample surfaces quantitatively with a resolution of approximately 20 rum exploiting the contact resonance frequencies of standard cantilevers used in Atomic Force Microscopy. The Young's modulus of nanocrystalline ferrite films have been measured as a function of oxidation temperature. Furthermore images showing the domain structure of piezoelectric lead zirconate titanate ceramics have been taken.

Ultrasonically synthesized organic liquid-filled chitosan microcapsules: part 2: characterization using AFM (atomic force microscopy) and combined AFM–confocal laser scanning fluorescence microscopy

Soft Matter ◽  
2018 ◽  
Vol 14 (16) ◽  
pp. 3192-3201 ◽  
Author(s):  
Srinivas Mettu ◽  
Qianyu Ye ◽  
Meifang Zhou ◽  
Raymond Dagastine ◽  
Muthupandian Ashokkumar
Keyword(s):  
Atomic Force Microscopy ◽  
Fluorescence Microscopy ◽  
Young’S Modulus ◽  
Laser Scanning ◽  
Young's Modulus ◽  
Organic Liquid ◽  
Confocal Laser Scanning ◽  
Confocal Laser ◽  
Force Microscopy ◽  
Atomic Force

Atomic Force Microscopy (AFM) is used to measure the stiffness and Young's modulus of individual microcapsules that have a chitosan cross-linked shell encapsulating tetradecane.

scholarly journals Characterisation of the Material and Mechanical Properties of Atomic Force Microscope Cantilevers with a Plan-View Trapezoidal Geometry

2019 ◽  
Vol 9 (13) ◽  
pp. 2604 ◽  
Author(s):  
Ashley D. Slattery ◽  
Adam J. Blanch ◽  
Cameron J. Shearer ◽  
Andrew J. Stapleton ◽  
Renee V. Goreham ◽  
...  
Keyword(s):  
Mechanical Properties ◽  
Atomic Force Microscope ◽  
Young’S Modulus ◽  
Correction Factor ◽  
Young's Modulus ◽  
Spring Constant ◽  
Beam Equation ◽  
Euler Beam ◽  
Plan View ◽  
Atomic Force

Cantilever devices have found applications in numerous scientific fields and instruments, including the atomic force microscope (AFM), and as sensors to detect a wide range of chemical and biological species. The mechanical properties, in particular, the spring constant of these devices is crucial when quantifying adhesive forces, material properties of surfaces, and in determining deposited mass for sensing applications. A key component in the spring constant of a cantilever is the plan-view shape. In recent years, the trapezoidal plan-view shape has become available since it offers certain advantages to fast-scanning AFM and can improve sensor performance in fluid environments. Euler beam equations relating cantilever stiffness to the cantilever dimensions and Young’s modulus have been proven useful and are used extensively to model cantilever mechanical behaviour and calibrate the spring constant. In this work, we derive a simple correction factor to the Euler beam equation for a beam-shaped cantilever that is applicable to any cantilever with a trapezoidal plan-view shape. This correction factor is based upon previous analytical work and simplifies the application of the previous researchers formula. A correction factor to the spring constant of an AFM cantilever is also required to calculate the torque produced by the tip when it contacts the sample surface, which is also dependent on the plan-view shape. In this work, we also derive a simple expression for the torque for triangular plan-view shaped cantilevers and show that for the current generation of trapezoidal plan-view shaped AFM cantilevers, this will be a good approximation. We shall apply both these correction factors to determine Young’s modulus for a range of trapezoidal-shaped AFM cantilevers, which are specially designed for fast-scanning. These types of AFM probes are much smaller in size when compared to standard AFM probes. In the process of analysing the mechanical properties of these cantilevers, important insights are also gained into their spring constant calibration and dimensional factors that contribute to the variability in their spring constant.

Evaluation of WB Coatings by Scanned Imaging Microscopy

2003 ◽  
Author(s):  
Jikai Du ◽  
Bernhard R. Tittmann
Keyword(s):  
Young’S Modulus ◽  
Young's Modulus ◽  
Attenuation Coefficients ◽  
High Attenuation ◽  
Nano Indentation ◽  
Atomic Force ◽  
Acoustic Evaluation ◽  
Acoustic Velocities ◽  
Thick Coatings ◽  
Scanning Acoustic Microscope

Organic thick coatings (epoxy, polyurethane, and acrylic-urethane) have been widely applied to high modulus substrates (e.g., steel) for anticorrosion protection. To improve performance, reinforced components (clay, bochmite, nanopaticles, etc.) are usually added to these coatings. However, the acoustic evaluation of these coatings is difficult due to their low acoustic velocities and high attenuation coefficients. In this paper, first, the scanning acoustic microscope (SAM) is used to image sub-surfaces, coating/substrate interfaces, and to measure acoustic velocities. Different phases can be observed on some coatings and defects can be found at some interfaces. Secondly, the atomic force microscope (AFM) is applied to image surfaces at high resolution (compared to SAM). These results agree with SAM images. Thirdly, a nano-indentation technique is utilized to measure the reduced Young’s modulus and absolute hardness of the coatings. The results show that epoxy has the highest Young’s modulus and acrylic-urethane has the lowest. Reinforced components can either increase or decrease Young’s modulus, and hardness depending on the coating material. Finally, results from the SAM, AFM and nano-indentation are compared and analyzed to optimize the evaluation.

Elastic properties and breaking strengths of GaS, GaSe and GaTe nanosheets

Nanoscale ◽  
2018 ◽  
Vol 10 (27) ◽  
pp. 13022-13027 ◽  
Author(s):  
Basant Chitara ◽  
Assaf Ya'akobovitz
Keyword(s):  
Atomic Force Microscopy ◽  
Young’S Modulus ◽  
Elastic Properties ◽  
Young's Modulus ◽  
Force Microscopy ◽  
Atomic Force ◽  
Maximal Strain

The present study highlights the elastic properties of suspended GaS, GaSe and GaTe nanosheets using atomic force microscopy. GaS exhibited the highest Young's modulus (∼173 GPa) among these nanosheets. These materials can withstand maximal stresses of up to 8 GPa and a maximal strain of 7% before breaking, making them suitable for stretchable electronic and optomechanical devices.

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