Quantitative Contact Spectroscopy and Imaging by Atomic-Force Acoustic Microscopy

1999 ◽  
Vol 591 ◽  
Author(s):  
W. Arnold ◽  
S. Amelio ◽  
S. Hirsekorn ◽  
U. Rabe
Keyword(s):  
Young’S Modulus ◽  
Lead Zirconate Titanate ◽  
Young's Modulus ◽  
Contact Stiffness ◽  
Near Field ◽  
Lead Zirconate ◽  
Acoustic Microscopy ◽  
Atomic Force ◽  
Resonance Frequencies ◽  
Nanocrystalline Ferrite

ABSTRACTAtomic Force Acoustic Microscopy is a near-field technique which combines the ability in using ultrasonics to image elastic properties with the high lateral resolution of scanning probe microscopes. We present a technique to measure the contact stiffness and the Young's modulus of sample surfaces quantitatively with a resolution of approximately 20 rum exploiting the contact resonance frequencies of standard cantilevers used in Atomic Force Microscopy. The Young's modulus of nanocrystalline ferrite films have been measured as a function of oxidation temperature. Furthermore images showing the domain structure of piezoelectric lead zirconate titanate ceramics have been taken.

scholarly journals Measurement of Young's modulus of clay minerals using atomic force acoustic microscopy

2002 ◽  
Vol 29 (8) ◽  
pp. 13-1-13-4 ◽  
Author(s):  
Manika Prasad ◽  
Malgorzata Kopycinska ◽  
Ute Rabe ◽  
Walter Arnold
Keyword(s):  
Young’S Modulus ◽  
Clay Minerals ◽  
Young's Modulus ◽  
Acoustic Microscopy ◽  
Atomic Force

Analysis on the Contact Mechanics between Tip and Sample in Atomic Force Acoustic Microscope Method

2013 ◽  
Vol 800 ◽  
pp. 325-329
Author(s):  
Gai Mei Zhang ◽  
Li Ping Yang ◽  
Chen Qiang ◽  
Yuan Wei ◽  
Jian Dong Lu ◽  
...  
Keyword(s):  
Contact Stiffness ◽  
Sample Surface ◽  
Acoustic Microscopy ◽  
Contact Model ◽  
Contact Theory ◽  
Ultrasonic Technique ◽  
Contact Mode ◽  
Atomic Force ◽  
Resonance Frequencies ◽  
Afm Probe

Atomic force acoustic microscopy (AFAM) is a technique combining the atomic force microscope (AFM) and ultrasonic technique, where the cantilever or the sample surface is vibrated at ultrasonic frequencies while a sample surface is scanned with the sensor tip contacting the sample. At a consequence, the amplitude of the cantilever vibration as well as the shift of the cantilever resonance frequencies contain information about local tip-sample contact stiffness and can be used as imaging quantities. It has been demonstrated to be a powerful tool for the investigation of the local elastic prosperities of sample surface. The sample is tested in the contact mode, the resonant frequency of the cantilever is measured, by which the contact stiffness is calculated based on the model of vibration of the cantilever, and then the elastic property of sample is evaluated according to the contact theory. Therefore, the contact model has an important impact on the calculation of elastic modulus. This paper analyzes the contact model between the AFM probe and the sample, and it is investigated based on finite element method (FEM) that the results of the test are affected by parameters.

NANOMECHANICAL CHARACTERIZATION OF MULTIFERROIC THIN FILMS FOR MICRO-ELECTROMECHANICAL SYSTEMS

2011 ◽  
Vol 10 (04n05) ◽  
pp. 1039-1043 ◽  
Author(s):  
K. PRASHANTHI ◽  
M. MANDAL ◽  
S. P. DUTTAGUPTA ◽  
V. RAMGOPAL RAO ◽  
P. PANT ◽  
...  
Keyword(s):  
Mechanical Properties ◽  
Young’S Modulus ◽  
Lead Zirconate Titanate ◽  
Young's Modulus ◽  
Lead Zirconate ◽  
Si Substrate ◽  
Electromechanical Systems ◽  
Multiferroic Films ◽  
First Time

In this paper, the elastic properties of Dy modified BiFeO3 (BDFO) multiferroic films deposited on Si substrate are reported for the first time. The mechanical properties are extracted using nanoindentation technique. The Young's modulus and hardness of the BDFO films are found to be 140 ± 3 GPa and 7.5 ± 0.3 GPa respectively. In this study the properties in the region of penetration depth up to 20% of BDFO film thickness, are found out. For these indentation depths, Young's modulus and hardness are almost constant indicating that substrate effects are not significant. It is also confirmed that neither cracks, nor pile-ups can be observed for indentation loads up to 10 mN. However, at higher indentation loads (>10 mN), bulging and spallation are observed suggesting delamination and buckling of the film. The mechanical properties of BDFO films are similar to that reported for lead zirconate titanate (PZT), while offering many novel properties. This report is accordingly expected to facilitate the design of BDFO-based micro-electromechanical systems devices.

Nanoscale Elastic-Property Mapping with Contact-Resonance-Frequency AFM

2004 ◽  
Vol 838 ◽  
Author(s):  
D. C. Hurley ◽  
A. B. Kos ◽  
P. Rice
Keyword(s):  
Resonance Frequency ◽  
Elastic Properties ◽  
Digital Signal Processor ◽  
Contact Stiffness ◽  
Acoustic Microscopy ◽  
Indentation Modulus ◽  
Atomic Force ◽  
Resonance Frequencies ◽  
Vertical Contact ◽  
Contact Resonance

ABSTRACTWe describe a dynamic atomic force microscopy (AFM) method to map the nanoscale elastic properties of surfaces, thin films, and nanostructures. Our approach is based on atomic force acoustic microscopy (AFAM) techniques previously used for quantitative measurements of elastic properties at a fixed sample position. AFAM measurements determine the resonant frequencies of an AFM cantilever in contact mode to calculate the tip-sample contact stiffness k*. Local values for elastic properties such as the indentation modulus M can be determined from k* with the appropriate contact-mechanics models. To enable imaging at practical rates, we have developed a frequency-tracking circuit based on digital signal processor architecture to rapidly locate the contact-resonance frequencies at each image position. We present contact-resonance frequency images obtained using both flexural and torsional cantilever images as well as the corresponding vertical contact-stiffness (k*) image calculated from flexural frequency images. Methods to obtain elastic-modulus images of M from vertical contact-stiffness images are also discussed.

scholarly journals Measurement of the Indentation Modulus and the Local Internal Friction in Amorphous SiO2 Using Atomic Force Acoustic Microscopy

2016 ◽  
Vol 61 (1) ◽  
pp. 9-12
Author(s):  
B. Zhang ◽  
H. Wagner ◽  
M. Büchsenschütz-Göbeler ◽  
Y. Luo ◽  
S. Küchemann ◽  
...  
Keyword(s):  
Internal Friction ◽  
Amorphous Materials ◽  
Contact Stiffness ◽  
Ultrasonic Transducer ◽  
Amorphous Material ◽  
Acoustic Microscopy ◽  
Damping Factor ◽  
Indentation Modulus ◽  
Amorphous Sio2 ◽  
Atomic Force

Abstract For the past two decades, atomic force acoustic microscopy (AFAM), an advanced scanning probe microscopy technique, has played a promising role in materials characterization with a good lateral resolution at micro/nano dimensions. AFAM is based on inducing out-of-plane vibrations in the specimen, which are generated by an ultrasonic transducer. The vibrations are sensed by the AFM cantilever when its tip is in contact with the material under test. From the cantilver’s contactresonance spectra, one determines the real and the imaginary part of the contact stiffness k*, and then from these two quantities the local indentation modulus M' and the local damping factor Qloc-1 can be obtained with a spatial resolution of less than 10 nm. Here, we present measured data of M' and of Qloc-1 for the insulating amorphous material, a-SiO2. The amorphous SiO2 layer was prepared on a crystalline Si wafer by means of thermal oxidation. There is a spatial distribution of the indentation modulus M' and of the internal friction Qloc-1. This is a consequence of the potential energy landscape for amorphous materials.

Lorentz Contact Resonance Imaging for Atomic Force Microscopes: Probing Mechanical and Thermal Properties on the Nanoscale

2013 ◽  
Vol 21 (6) ◽  
pp. 18-24 ◽  
Author(s):  
Eoghan Dillon ◽  
Kevin Kjoller ◽  
Craig Prater
Keyword(s):  
Viscoelastic Properties ◽  
Contact Stiffness ◽  
Mechanical And Thermal Properties ◽  
Resonance Modes ◽  
Atomic Force ◽  
Resonance Frequencies ◽  
Other Information ◽  
Afm Cantilever ◽  
Stiffness And Damping ◽  
Contact Resonance

Atomic force microscopy (AFM) has been widely used in both industry and academia for imaging the surface topography of a material with nanoscale resolution. However, often little other information is obtained. Contact resonance AFM (CR-AFM) is a technique that can provide information about the viscoelastic properties of a material in contact with an AFM probe by measuring the contact stiffness between the probe and sample. In CR-AFM, an AFM cantilever is oscillated, and the amplitude and frequency of the resonance modes of the cantilever are monitored. When a probe or sample is oscillated, the tip sample interaction can be approximated as an ideal spring-dashpot system using the Voigt-Kelvin model shown in Figure 1. Contact resonance frequencies of the AFM cantilever will shift depending on the contact stiffness, k, between the tip and sample. The damping effect on the system comes from dissipative tip sample forces such as viscosity and adhesion. Damping, η, is observed in a CR-AFM system by monitoring the amplitude and Q factor of the resonant modes of the cantilever. This contact stiffness and damping information can then be used to obtain information about the viscoelastic properties of the material when fit to an applicable model.

Ultrasonically synthesized organic liquid-filled chitosan microcapsules: part 2: characterization using AFM (atomic force microscopy) and combined AFM–confocal laser scanning fluorescence microscopy

Soft Matter ◽  
2018 ◽  
Vol 14 (16) ◽  
pp. 3192-3201 ◽  
Author(s):  
Srinivas Mettu ◽  
Qianyu Ye ◽  
Meifang Zhou ◽  
Raymond Dagastine ◽  
Muthupandian Ashokkumar
Keyword(s):  
Atomic Force Microscopy ◽  
Fluorescence Microscopy ◽  
Young’S Modulus ◽  
Laser Scanning ◽  
Young's Modulus ◽  
Organic Liquid ◽  
Confocal Laser Scanning ◽  
Confocal Laser ◽  
Force Microscopy ◽  
Atomic Force

Atomic Force Microscopy (AFM) is used to measure the stiffness and Young's modulus of individual microcapsules that have a chitosan cross-linked shell encapsulating tetradecane.

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