The growth behaviour of the intermetallic compounds (IMCs) in Pb-free solder
bump is investigated. The Pb-free micro-bump, Sn-50%Bi, was fabricated by binary electroplating
for flip-chip bond. The diameter of the bump is about 506m and the height is about 60 6m. In order
to increase the reliability of the bonding, it is necessary to protect the growth of the IMCs in
interface between Cu pad and the solder bump. For control of IMCs growth, SiC particles were
distributed in the micro-solder bump during electroplating. The thickness of the IMCs in the
interface was estimated by FE-SEM, EDS, XRF and TEM. From the results, The IMCs were found
as Cu6Sn5 and Cu3Sn. The thickness of the IMCs decreases with increase the amount of SiC
particles until 4 g/cm2. The one candidate of the reasons is that the SiC particles could decrease the
area which be reacted between the solder and Cu layer. And another candidate is that the particle
can make to difficult inter-diffusion within the interface.