Backscattered electron imaging of cultured cells: application to electron probe X‐ray microanalysis using a scanning electron microscope
1997 ◽
Vol 188
(1)
◽
pp. 72-78
◽
1984 ◽
Vol 70
(2)
◽
pp. 269-271
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1998 ◽
Vol 47
(4)
◽
pp. 351-354
◽
1993 ◽
Vol 38
(1)
◽
pp. 1-4
◽
1987 ◽
Vol 35
(2)
◽
pp. 267-269
◽
2017 ◽
Vol 160
◽
pp. 182-192
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2017 ◽
Vol 53
(1)
◽
pp. 9-12
◽
2001 ◽
Vol 40
(Part 1, No. 5A)
◽
pp. 3457-3462