scholarly journals Geographical indication as a market orientation strategy: An analysis of producers of high-quality wines in Southern Brazil

2012 ◽  
Vol 19 (3) ◽  
pp. 163-178 ◽  
Author(s):  
Paloma de Mattos Fagundes ◽  
Ana Claudia Machado Padilha ◽  
Thaisy Sluszz ◽  
Antonio Domingos Padula
Keyword(s):  
Market Orientation ◽  
Geographical Indication ◽  
Southern Brazil ◽  
High Quality

scholarly journals Gestão do Conhecimento e Orientação para o Mercado como Fonte de Vantagem Competitiva: uma survey em empresas do sul do Brasil (Knowledge Management and Market Orientation as a Source of Competitive Advantage: a survey on companies in southern Brazil)

Gestão org ◽  
2021 ◽  
Vol 19 (1) ◽  
Author(s):  
Eliana Andréa Severo ◽  
Julio Cesar Ferro de Guimarães ◽  
Arícia Morais de Medeiros ◽  
Ênio Vinicius Baracho Eduardo ◽  
Robson Da Silva Alves ◽  
...  
Keyword(s):  
Knowledge Management ◽  
Competitive Advantage ◽  
Market Orientation ◽  
Southern Brazil

A globalização e a turbulência de mercado exigem que as organizações busquem estratégias para a vantagem competitiva. Neste contexto, a gestão do conhecimento visa a criação, transferência e circulação do conhecimento nas organizações, bem como o investimento no capital intelectual. No entanto, a orientação para o mercado defende uma cultura orientada para o cliente, a fim de oferecer-lhes produtos de maior valor agregado de forma eficiente e efetiva. Perante o exposto, este estudo tem como objetivo analisar a influência da gestão do conhecimento e da orientação para o mercado sobre a vantagem competitiva em 426 empresas de comércio e serviços do Sul do Brasil. A metodologia utilizada tratou-se de uma pesquisa quantitativa, por meio da análise fatorial exploratória e regressão linear múltipla. Os resultados destacam que tanto a gestão do conhecimento, como a orientação para o mercado estão positivamente relacionadas com a vantagem competitiva.

Mechanism and Technics to Produce Geographical Indication Products of Chinese Blue-and-White Porcelain

2018 ◽  
Vol 281 ◽  
pp. 952-958 ◽  
Author(s):  
Gang Qin Shao ◽  
Xiao Bin Zhong ◽  
Yong Zhang ◽  
Xin Yi Feng ◽  
Can Zhu ◽  
...  
Keyword(s):  
Traditional Culture ◽  
Guangdong Province ◽  
Geographical Indication ◽  
High Quality ◽  
Local Resources ◽  
Meizhou City ◽  
White Porcelain

For over 1400 years, Dapu county, under the jurisdiction of Meizhou city, Guangdong province, one cradleland of the Hakka traditional culture, is renowned for the blue and white porcelain in China. In this work, the mechanism and technics to produce Dapu geographical indication products of blue-and-white porcelains with high quality were studied, based on the distinct characteristics of local resources.

scholarly journals PENGEMBANGAN PRODUK INDIKASI GEOGRAFIS DALAM KONTEKS SHARING ECONOMY DI ERA DISRUPSI DIGITAL

LITIGASI ◽  
2020 ◽  
pp. 128-146
Author(s):  
RANTI FAUZA MAYANA ◽  
TISNI SANTIKA
Keyword(s):  
Sharing Economy ◽  
Cultural Factors ◽  
Geographical Indications ◽  
Geographical Indication ◽  
High Quality ◽  
Economic Framework ◽  
Quality Product ◽  
Digital Disruption ◽  
Social And Cultural Factors ◽  
High Quality Product

It is such an irony that Indonesia, as one of the biggest archipelagic countries blessed with unique and vary geographical conditions along with great potential to develop high quality product combined with creativity, social and cultural factors,remains in struggle to formulate and develop local creativity and collectivity as the people’s economy pillars with significant benefits. In accordance with those facts, this research aimedto provide critical conceptual ideas for Geographical Indications utilization as the part of intellectual property rooted from locality but has been internationally accepted. The findingsshowedthat Geographical Indication products posses utter potential to play the determinant role in creating trickle-down effect and bottom-up economic development instrument through the sharing of economic framework. Furthermore, digital disruption era offersan effective platform for product development and promotion in a collaborative spacein generating income, creatingjob vacancy, povertyelevation, community empowermentand development

Some problems of objective-prism spectra classification

1966 ◽  
Vol 24 ◽  
pp. 51-52
Author(s):  
E. K. Kharadze ◽  
R. A. Bartaya
Keyword(s):  
Short Wave ◽  
High Quality ◽  
Stellar Spectra ◽  
Objective Prism

The unique 70-cm meniscus-type telescope of the Abastumani Astrophysical Observatory supplied with two objective prisms and the seeing conditions characteristic at Mount Kanobili (Abastumani) permit us to obtain stellar spectra of a high quality. No additional design to improve the “climate” immediately around the telescope itself is being applied. The dispersions and photographic magnitude limits are 160 and 660Å/mm, and 12–13, respectively. The short-wave end of spectra reaches 3500–3400Å.

A non-cyanide method of electropolishing silver

1978 ◽  
Vol 36 (1) ◽  
pp. 146-147
Author(s):  
R. L. Lyles ◽  
S. J. Rothman ◽  
W. Jäger
Keyword(s):  
Electron Microscopy ◽  
Sulphuric Acid ◽  
Methyl Alcohol ◽  
Health Hazards ◽  
Silver Alloy ◽  
High Quality ◽  
Silver Alloys ◽  
Free Sample ◽  
Specimen Quality ◽  
Standard Techniques

Standard techniques of electropolishing silver and silver alloys for electron microscopy in most instances have relied on various CN recipes. These methods have been characteristically unsatisfactory due to difficulties in obtaining large electron transparent areas, reproducible results, adequate solution lifetimes, and contamination free sample surfaces. In addition, there are the inherent health hazards associated with the use of CN solutions. Various attempts to develop noncyanic methods of electropolishing specimens for electron microscopy have not been successful in that the specimen quality problems encountered with the CN solutions have also existed in the previously proposed non-cyanic methods.The technique we describe allows us to jet polish high quality silver and silver alloy microscope specimens with consistant reproducibility and without the use of CN salts.The solution is similar to that suggested by Myschoyaev et al. It consists, in order of mixing, 115ml glacial actic acid (CH3CO2H, specific wt 1.04 g/ml), 43ml sulphuric acid (H2SO4, specific wt. g/ml), 350 ml anhydrous methyl alcohol, and 77 g thiourea (NH2CSNH2).

A High Resolution Scanning Microscope

1968 ◽  
Vol 26 ◽  
pp. 356-357
Author(s):  
A. V. Crewe ◽  
J. Wall ◽  
L. M. Welter
Keyword(s):  
High Resolution ◽  
Field Emission ◽  
Spherical Aberration ◽  
Focal Length ◽  
Spot Size ◽  
Emission Source ◽  
Field Of View ◽  
Scanning Microscope ◽  
Magnetic Lens ◽  
High Quality

A scanning microscope using a field emission source has been described elsewhere. This microscope has now been improved by replacing the single magnetic lens with a high quality lens of the type described by Ruska. This lens has a focal length of 1 mm and a spherical aberration coefficient of 0.5 mm. The final spot size, and therefore the microscope resolution, is limited by the aberration of this lens to about 6 Å.The lens has been constructed very carefully, maintaining a tolerance of + 1 μ on all critical surfaces. The gun is prealigned on the lens to form a compact unit. The only mechanical adjustments are those which control the specimen and the tip positions. The microscope can be used in two modes. With the lens off and the gun focused on the specimen, the resolution is 250 Å over an undistorted field of view of 2 mm. With the lens on,the resolution is 20 Å or better over a field of view of 40 microns. The magnification can be accurately varied by attenuating the raster current.

Quantitative defect studies in semiconductor TEM samples prepared by low angle ion milling

1995 ◽  
Vol 53 ◽  
pp. 512-513
Author(s):  
L. Mulestagno ◽  
J.C. Holzer ◽  
P. Fraundorf
Keyword(s):  
Sample Preparation ◽  
Milling Time ◽  
High Density ◽  
Low Density ◽  
Ion Milling ◽  
High Quality ◽  
Variable Angle ◽  
Major Disadvantage ◽  
Induced Defects

Due to the wealth of information, both analytical and structural that can be obtained from it TEM always has been a favorite tool for the analysis of process-induced defects in semiconductor wafers. The only major disadvantage has always been, that the volume under study in the TEM is relatively small, making it difficult to locate low density defects, and sample preparation is a somewhat lengthy procedure. This problem has been somewhat alleviated by the availability of efficient low angle milling.Using a PIPS® variable angle ion -mill, manufactured by Gatan, we have been consistently obtaining planar specimens with a high quality thin area in excess of 5 × 104 μm2 in about half an hour (milling time), which has made it possible to locate defects at lower densities, or, for defects of relatively high density, obtain information which is statistically more significant (table 1).

Structural changes in silicon-on-insulator material during post-implantation annealing

1986 ◽  
Vol 44 ◽  
pp. 736-737
Author(s):  
C. O. Jung ◽  
S. J. Krause ◽  
S.R. Wilson
Keyword(s):  
Integrated Circuits ◽  
Oxide Layer ◽  
High Speed ◽  
Structural Changes ◽  
Device Fabrication ◽  
Silicon On Insulator ◽  
High Quality ◽  
Radiation Hardened ◽  
Post Implantation ◽  
Very High

Silicon-on-insulator (SOI) structures have excellent potential for future use in radiation hardened and high speed integrated circuits. For device fabrication in SOI material a high quality superficial Si layer above a buried oxide layer is required. Recently, Celler et al. reported that post-implantation annealing of oxygen implanted SOI at very high temperatures would eliminate virtually all defects and precipiates in the superficial Si layer. In this work we are reporting on the effect of three different post implantation annealing cycles on the structure of oxygen implanted SOI samples which were implanted under the same conditions.

Performance and applications of a field-emission gun TEM/STEM

1992 ◽  
Vol 50 (2) ◽  
pp. 942-943
Author(s):  
Judith M. Brock ◽  
Max T. Otten ◽  
Marc. J.C. de Jong
Keyword(s):  
Field Emission ◽  
High Resolution Imaging ◽  
High Quality ◽  
Small Energy ◽  
High Brightness ◽  
Small Probe ◽  
Resolution Imaging ◽  
Convergent Beam ◽  
Beam Patterns ◽  
Beam Diffraction

A Field Emission Gun (FEG) on a TEM/STEM instrument provides a major improvement in performance relative to one equipped with a LaB6 emitter. The improvement is particularly notable for small-probe techniques: EDX and EELS microanalysis, convergent beam diffraction and scanning. The high brightness of the FEG (108 to 109 A/cm2srad), compared with that of LaB6 (∼106), makes it possible to achieve high probe currents (∼1 nA) in probes of about 1 nm, whilst the currents for similar probes with LaB6 are about 100 to 500x lower. Accordingly the small, high-intensity FEG probes make it possible, e.g., to analyse precipitates and monolayer amounts of segregation on grain boundaries in metals or ceramics (Fig. 1); obtain high-quality convergent beam patterns from heavily dislocated materials; reliably detect 1 nm immuno-gold labels in biological specimens; and perform EDX mapping at nm-scale resolution even in difficult specimens like biological tissue.The high brightness and small energy spread of the FEG also bring an advantage in high-resolution imaging by significantly improving both spatial and temporal coherence.

Epitaxial growth manner and structure of superconducting oxide films

1990 ◽  
Vol 48 (4) ◽  
pp. 2-3
Author(s):  
Yoshichika Bando ◽  
Takahito Terashima ◽  
Kenji Iijima ◽  
Kazunuki Yamamoto ◽  
Kazuto Hirata ◽  
...  
Keyword(s):  
Ultrathin Films ◽  
Film Surface ◽  
High Energy ◽  
Epitaxial Films ◽  
Layer By Layer ◽  
Initial Growth ◽  
In Situ Growth ◽  
High Quality ◽  
Activated Reactive Evaporation

The high quality thin films of high-Tc superconducting oxide are necessary for elucidating the superconducting mechanism and for device application. The recent trend in the preparation of high-Tc films has been toward “in-situ” growth of the superconducting phase at relatively low temperatures. The purpose of “in-situ” growth is to attain surface smoothness suitable for fabricating film devices but also to obtain high quality film. We present the investigation on the initial growth manner of YBCO by in-situ reflective high energy electron diffraction (RHEED) technique and on the structural and superconducting properties of the resulting ultrathin films below 100Å. The epitaxial films have been grown on (100) plane of MgO and SrTiO, heated below 650°C by activated reactive evaporation. The in-situ RHEED observation and the intensity measurement was carried out during deposition of YBCO on the substrate at 650°C. The deposition rate was 0.8Å/s. Fig. 1 shows the RHEED patterns at every stage of deposition of YBCO on MgO(100). All the patterns exhibit the sharp streaks, indicating that the film surface is atomically smooth and the growth manner is layer-by-layer.

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