Theoretical and experimental studies of vibrations of optical fiber cantilevers for atomic force microscopy

AbstractExperimental studies on patterning hexagonal Ge nanostructures have been conducted on Si substrates through deposition of Ge with colloidal particles as a mask. The deposited Ge thin film possesses, according to the X-ray diffraction measurements, in plane texture, being epitaxial and aligned with the (111) Si substrate. The size distribution of the patterned Ge nanostructures is narrow, as indicated by the atomic force microscopy and scanning electron microscopy measurements. We have obtained Ge nanostructures with lateral dimension of 490 nm (height 12 nm), 200 nm (height 6 nm) and 82 nm (height 6 nm) by using different sizes of polystyrene spheres. We have performed in depth studies of the Ge nanostructures’ behavior due to thermal and rapid thermal post-annealing processes. FT micro-Raman spectroscopy shows that there is no Si intermixing during the annealing process. In order to quantify the changes in the height and lateral dimension, we have performed atomic force microscopy and white light interferometry analysis. The changes in shape and the decrease in the area of a cross-section of Ge nanostructure will be discussed in respect to similar results shown in the literature for Ge thin films during the annealing process.

Download Full-text

Atomic Force Microscopy (AFM) for Rubber

Rubber Chemistry and Technology ◽

10.5254/1.3548214 ◽

2008 ◽

Vol 81 (3) ◽

pp. 359-383 ◽

Cited By ~ 8

Author(s):

Lili L. Johnson

Keyword(s):

Atomic Force Microscopy ◽

Crosslink Density ◽

Experimental Studies ◽

Surface Force ◽

Experimental Investigations ◽

Practical Applications ◽

Force Microscopy ◽

Atomic Force ◽

Linear Correction ◽

Resolution Imaging

Abstract In this review, first, the development of atomic force microscopy as an imaging technique, as a surface force apparatus, and as a nanoindenter was illustrated using experimental studies. The experimental analysis of atomic force microscopy emphasizes the empirical methods of achieving high resolution imaging through controlled forces between tip and sample interactions. Second, mapping mechanical properties on nanometer scale by atomic force microscopy is presented with both experimental investigations and selection of elastic models. Elastomer crosslink density was mapped using atomic force microscopy combined with elastic theories. The force — penetration depth investigation of crosslink density for elastomer by AFM shows linear correction with both experimental studies using Dynamic Mechanical Thermal Analysis (DMTA) and classic swelling method and calculation using statistical rubber elasticity theory. Last, the focus is on the understanding of atomic force microscopy for practical applications. Filler dispersion and blends structure are demonstrated for automotive applications. Micro phase separation was intensely studied for film industries. Morphology of composites is investigated for the applications of tire, automotive and foaming industries.

Download Full-text

Fabrication of sharp-needled conical polymer tip on the cross-section of optical fiber via two-photon polymerization for tuning-fork-based atomic force microscopy

Optics Communications ◽

10.1016/j.optcom.2012.09.003 ◽

2013 ◽

Vol 286 ◽

pp. 197-203 ◽

Cited By ~ 6

Author(s):

Byung Je Jung ◽

Hong Jin Kong ◽

Yong-Hoon Cho ◽

Kyu-Seung Lee ◽

Chung Hyun Park ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Optical Fiber ◽

Cross Section ◽

Tuning Fork ◽

Force Microscopy ◽

Two Photon ◽

Atomic Force ◽

The Cross ◽

Two Photon Polymerization

Download Full-text

Atomic Force Microscopy of Structural-Mechanical Properties of Polyethylene Reinforced by Silicate Needle-Shaped Filler

Advances in Materials Science and Engineering ◽

10.1155/2016/8945978 ◽

2016 ◽

Vol 2016 ◽

pp. 1-8 ◽

Cited By ~ 2

Author(s):

Ilya A. Morozov ◽

Oleg K. Garishin ◽

Vladimir V. Shadrin ◽

Victor A. Gerasin ◽

Maria A. Guseva

Keyword(s):

Mechanical Properties ◽

Atomic Force Microscopy ◽

Mass Fraction ◽

Experimental Studies ◽

Smooth Surfaces ◽

Force Microscopy ◽

Atomic Force ◽

High Elongation ◽

Cooling Procedure ◽

Properties Of Composites

The paper presents the results of experimental studies of polyethylene-based composites reinforced with silicate needle-shaped filler (palygorskite) of different mass fraction (0, 5, 10, and 15%). These composites are less flammable and fire toxic than unfilled polyethylene. The structure (size, shape, and agglomeration of filler) and local mechanical properties of composites in nonstretched and elongated states were investigated by AFM. In stretched samples palygorskite takes a wavy shape, and at extremely high elongation the filler is orthogonal to the axis of tension. The smooth surfaces of the samples, required for AFM, were prepared using the heating/cooling procedure.

Download Full-text

Investigation of the Nanodiagnostics Probe Modes for Semiconductor Resistivity Measurements by Atomic Force Microscopy

Advanced Materials Research ◽

10.4028/www.scientific.net/amr.894.374 ◽

2014 ◽

Vol 894 ◽

pp. 374-378 ◽

Cited By ~ 4

Author(s):

Oleg A. Ageev ◽

Natalie I. Alyabieva ◽

Boris G. Konoplev ◽

Vladimir A. Smirnov ◽

Vladislav V. Tkachuk

Keyword(s):

Atomic Force Microscopy ◽

Substrate Surface ◽

Experimental Studies ◽

Experimental Investigations ◽

Force Microscopy ◽

Resistivity Measurements ◽

Atomic Force ◽

Current Technique ◽

Local Anodic Oxidation ◽

Measured Resistivity

The work presents the results of theoretical and experimental investigations of the features and nanodiagnostics probe modes for semiconductors resistivity measurements by current technique of atomic force microscopy and by using test silicon samples with known resistivities (0.01 Ωcm, 1 Ωcm, 5 Ωcm, 10 Ωcm). It is shown that the measured resistivity data in air and in ultrahigh vacuum (10-8 Pa) is 166 Ωcm and 10 Ωcm, respectively, for the sample with ρ = 10 Ωcm of theoretically predicted resistivity. We showed that reducing of the measurements reliability in air, due to the local anodic oxidation of the substrate surface. Experimental studies of the influence of cantilever load forces (0.3 to 6.0 μN) to the samples surface on the current distribution are presented. Based on the experimental results we developed a mathematical model for determining the resistivity of semiconductor materials by current technique of atomic force microscopy. The results are useful to the development of probe methods for nanoelectronic devices analysis by atomic force microscopy.

Download Full-text