Combining experiment and optical simulation in coherent X-ray nanobeam characterization of Si/SiGe semiconductor heterostructures
2002 ◽
Vol 237-239
◽
pp. 330-337
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1973 ◽
Vol 31
◽
pp. 132-133
◽
1987 ◽
Vol 45
◽
pp. 974-975
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