Subtest Level Profile Analysis of Intelligence Tests: Editor's Remarks and Introduction

2007 ◽  
Vol 14 (1) ◽  
pp. 1-1 ◽  
Author(s):  
Cecil R. Reynolds
2020 ◽  
Vol 29 (11) ◽  
pp. 3153-3168
Author(s):  
Wendy M. Rote ◽  
Melanie Olmo ◽  
Lovia Feliscar ◽  
Marc M. Jambon ◽  
Courtney L. Ball ◽  
...  

Author(s):  
S.F. Corcoran

Over the past decade secondary ion mass spectrometry (SIMS) has played an increasingly important role in the characterization of electronic materials and devices. The ability of SIMS to provide part per million detection sensitivity for most elements while maintaining excellent depth resolution has made this technique indispensable in the semiconductor industry. Today SIMS is used extensively in the characterization of dopant profiles, thin film analysis, and trace analysis in bulk materials. The SIMS technique also lends itself to 2-D and 3-D imaging via either the use of stigmatic ion optics or small diameter primary beams.By far the most common application of SIMS is the determination of the depth distribution of dopants (B, As, P) intentionally introduced into semiconductor materials via ion implantation or epitaxial growth. Such measurements are critical since the dopant concentration and depth distribution can seriously affect the performance of a semiconductor device. In a typical depth profile analysis, keV ion sputtering is used to remove successive layers the sample.


Crisis ◽  
2020 ◽  
Vol 41 (4) ◽  
pp. 288-295 ◽  
Author(s):  
Nadia Bounoua ◽  
Jasmeet P. Hayes ◽  
Naomi Sadeh

Abstract. Background: Suicide among veterans has increased in recent years, making the identification of those at greatest risk for self-injurious behavior a high research priority. Aims: We investigated whether affective impulsivity and risky behaviors distinguished typologies of self-injurious thoughts and behaviors in a sample of trauma-exposed veterans. Method: A total of 95 trauma-exposed veterans (ages 21–55; 87% men) completed self-report measures of self-injurious thoughts and behaviors, impulsivity, and clinical symptoms. Results: A latent profile analysis produced three classes that differed in suicidal ideation, suicide attempts and nonsuicidal self-injury (NSSI): A low class that reported little to no self-injurious thoughts or behaviors; a self-injurious thoughts (ST) class that endorsed high levels of ideation but no self-harm behaviors; and a self-injurious thoughts and behaviors (STaB) class that reported ideation, suicide attempts and NSSI. Membership in the STaB class was associated with greater affective impulsivity, disinhibition, and distress/arousal than the other two classes. Limitations: Limitations include an overrepresentation of males in our sample, the cross-sectional nature of the data, and reliance on self-report measures. Conclusion: Findings point to affective impulsivity and risky behaviors as important characteristics of veterans who engage in self-injurious behaviors.


2013 ◽  
Vol 34 (2) ◽  
pp. 82-89 ◽  
Author(s):  
Sophie von Stumm

Intelligence-as-knowledge in adulthood is influenced by individual differences in intelligence-as-process (i.e., fluid intelligence) and in personality traits that determine when, where, and how people invest their intelligence over time. Here, the relationship between two investment traits (i.e., Openness to Experience and Need for Cognition), intelligence-as-process and intelligence-as-knowledge, as assessed by a battery of crystallized intelligence tests and a new knowledge measure, was examined. The results showed that (1) both investment traits were positively associated with intelligence-as-knowledge; (2) this effect was stronger for Openness to Experience than for Need for Cognition; and (3) associations between investment and intelligence-as-knowledge reduced when adjusting for intelligence-as-process but remained mostly significant.


2013 ◽  
Author(s):  
Randy G. Floyd ◽  
Ryan L. Farmer ◽  
Sarah Irby ◽  
Phil Norfolk ◽  
Haley Hawkins ◽  
...  

1920 ◽  
Author(s):  
M. E. Haggerty ◽  
L. M. Terman ◽  
E. L. Thorndike ◽  
G. M. Whipple ◽  
R. M. Yerkes
Keyword(s):  

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