DEVELOPING A NEW DEFECT CLUSTER INDEX

2008 ◽  
Vol 25 (1) ◽  
pp. 18-30 ◽  
Author(s):  
Wen-Jie Tsai ◽  
Lee-Ing Tong ◽  
Chung-Ho Wang
Keyword(s):  
1999 ◽  
Vol 39 (4) ◽  
pp. 451-456 ◽  
Author(s):  
Chi-Hyuck Jun ◽  
Yushin Hong ◽  
Soo Young Kim ◽  
Kwang-Su Park ◽  
Hangyeob Park

2018 ◽  
Vol 30 (40) ◽  
pp. 405701 ◽  
Author(s):  
A De Backer ◽  
C Domain ◽  
C S Becquart ◽  
L Luneville ◽  
D Simeone ◽  
...  

2022 ◽  
Author(s):  
Dingrong Liu ◽  
Zenghua Cai ◽  
Yu-Ning Wu ◽  
Shiyou Chen

Abstract The γ-phase Cuprous Iodide (CuI) emerges as a promising transparent p-type semiconductor for next-generation display technology because of its wide direct band gap, intrinsic p-type conductivity, and high carrier mobility. Two main peaks are observed in its photoluminescence (PL). One is short wavelength (410-430 nm) emission, which is well attributed to the electronic transitions at Cu vacancy, whereas the other long wavelength emission (680-720 nm) has not been fully understood. In this paper, through first-principles simulations, we investigate the formation energies and emission line shape for various defects, and discover that the intrinsic point defect cluster V_I+Cu_i^(2+) is the source of the long wavelength emission. Our finding is further supported by the prediction that the defect concentration decreases dramatically as the chemical condition changes from Cu-rich to I-rich, explaining the significant reduction in the red light emission if CuI is annealed in abundant I environment.


2013 ◽  
Vol 442 (1-3) ◽  
pp. S773-S775 ◽  
Author(s):  
Y. Yamamoto ◽  
J. Yoshimatsu ◽  
K. Morishita

2011 ◽  
Vol 1290 ◽  
Author(s):  
J. K. Mishra ◽  
S. Dhar ◽  
M. A. Khaderabad ◽  
O. Brandt

ABSTRACTGd:GaN layers grown with different Gd concentrations by molecular beam epitaxy (MBE) are studied using photoconductivity and photo-thermoelectric power spectroscopy. Our study reveals that the incorporation of Gd produces a large concentration of acceptor-like defects in the GaN lattice. The defect band is found to be located ~450meV above the valence band. Moreover, the concentration of defects is found to increase with the Gd concentration. The effect of annealing on the structural and the magnetic properties of GaN implanted with Gd is also investigated. A clear correlation between the saturation magnetization and the defect density is observed in implanted samples. The colossal magnetic moment per Gd ion and the ferromagnetism observed in this material is explained in terms of the formation of giant defect cluster around each Gd ion.


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