Spectral Fourier-microscopy of the periodic structures based on Ge2Sb2Te5
2021 ◽
Vol 2103
(1)
◽
pp. 012173
Keyword(s):
Abstract The method of spectral Fourier microscopy was used to study the reflection spectra with an angular resolution of submicron periodic gratings based on amorphous and crystalline Ge2Sb2Te5. The form of the dispersion curves of quasi-waveguide modes in the structures under study was established. The experimental data were compared with the calculations of dispersion curves in synthesized diffraction gratings. Reasonable agreement between theoretical and experimental data was obtained.
1984 ◽
Vol 62
(8)
◽
pp. 796-802
◽
Keyword(s):
Keyword(s):
2007 ◽
Vol 21
(12)
◽
pp. 737-743
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2010 ◽
Vol 645-648
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pp. 1203-1206