scholarly journals Effect of anomalous diffusion of fluctuating Cooper pairs on the density of states of superconducting NbN thin films

2019 ◽  
Vol 100 (17) ◽  
Author(s):  
Pietro Brighi ◽  
Marco Grilli ◽  
Brigitte Leridon ◽  
Sergio Caprara
2000 ◽  
Vol 84 (1) ◽  
pp. 147-150 ◽  
Author(s):  
T. Cren ◽  
D. Roditchev ◽  
W. Sacks ◽  
J. Klein ◽  
J.-B. Moussy ◽  
...  

2014 ◽  
Vol 92 (7/8) ◽  
pp. 629-633 ◽  
Author(s):  
Derek Mortensen ◽  
George Belev ◽  
Kirill (Cyril) Koughia ◽  
Robert E. Johanson ◽  
S.O. Kasap

Electron transport in vacuum-deposited a-Se films with thicknesses varying from 13 to 501 μm has been investigated by conventional time-of-flight (TOF) and interrupted field TOF experiments. To separate the influences of electric field and the thickness, all TOF experiments were performed at a constant electric field. It has been found that the electron mobility is relatively constant in thick films (L > 50 μm) and increases in thinner films (L < 50 μm) with decreasing thickness. On the other hand, the electron lifetime is relatively thickness independent in films with thickness L > 50 μm, but drops sharply in thin films when L < 50 μm. These observations can be explained based on the density of states model that includes three types of traps forming Gaussian-like distributions within the mobility gap as reported in Koughia et al. (J. Appl. Phys. 97, 033706 (2005)).


1999 ◽  
Vol 263-264 ◽  
pp. 581-583 ◽  
Author(s):  
R Röhlsberger ◽  
W Sturhahn ◽  
T.S Toellner ◽  
K.W Quast ◽  
E.E Alp ◽  
...  

2008 ◽  
Vol 205 (5) ◽  
pp. 1023-1025 ◽  
Author(s):  
Yasuhiro Asano ◽  
Takehito Yokoyama ◽  
Yukio Tanaka ◽  
Alexander A. Golubov

1990 ◽  
Vol 192 ◽  
Author(s):  
C. Godet ◽  
V. Chu ◽  
B. Equer ◽  
Y. Bouizem ◽  
L. Chahed ◽  
...  

ABSTRACTThe disorder in a-Ge:H thin films produced by the plasma-enhanced chemical vapor deposition (PECVD) technique is strongly reduced when the GeH4 gas is diluted at 1% in H2 and the radiofrequency power density is increased to 0.1 W.cm−2. This improvement is attributed to a better surface passivation by the hydrogen atoms during the growth. However, the poor transport properties indicate a still high defect density. The midgap defect absorption and the Urbach energy, obtained from the photothermal deflection spectra calibrated with optical data, both decrease as a function of the film thickness. The optical defect density is calibrated with EPR spin measurements. For a-Ge:H films thicker than 2 μm, obtained at a deposition temperature Ts ranging from 150 to 250°C, the Urbach tail parameter E° is lower than 50 meV and not sensitive to Ts ; the dangling bond density is around 4.107 cm−3, which is higher by a factor of 100 than in a-Si:H. Preliminary transport measurements indicate that the Fermi level density of states is larger than 1018 cm−3.eV−1.


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