X-ray topographic dislocation contrast visible in reflections orthogonal to the Burgers vectors of axial screw dislocations in hexagonal silicon carbide

2001 ◽  
Vol 34 (1) ◽  
pp. 20-26 ◽  
Author(s):  
W. M. Vetter ◽  
M. Dudley
Keyword(s):  
Silicon Carbide ◽  
Electron Microscope ◽  
Basal Plane ◽  
High Density ◽  
Screw Dislocations ◽  
X Ray ◽  
Apparent Violation ◽  
Light Contrast

Contrast is associated with micropipes in X-ray topographs of SiC crystals obtained with prismatic reflections, representing an apparent violation of theg·b= 0 invisibility criterion. This is explained as a population of basal-plane dislocations with Burgers vectors of the setb= {\textstyle{1 \over 3}}〈11{\bar{2}}0〉 that occur in a high density within a few micrometers of the micropipes, below the resolution of X-ray topography. These basal-plane dislocations could be observed under an electron microscope. The presence of the surfaces of the micropipes influences the dislocation images in the topographs taken with prismatic reflections, often resulting in a band of light contrast along the axes of the micropipes.

Investigation of Low Angle Grain Boundaries in Hexagonal Silicon Carbide

2006 ◽  
Vol 955 ◽  
Author(s):  
Yi Chen ◽  
Hui Chen ◽  
Ning Zhang ◽  
Michael Dudley ◽  
Ronghui Ma
Keyword(s):  
Silicon Carbide ◽  
Grain Boundaries ◽  
Basal Plane ◽  
Vapor Transport ◽  
Threading Dislocations ◽  
Prismatic Plane ◽  
Screw Dislocations ◽  
X Ray ◽  
Edge Dislocations ◽  
Dislocation Walls

ABSTRACTInteraction between basal plane dislocations and single or well-spaced threading dislocations is discussed based on synchrotron white beam X-ray topographic studies carried out on physical vapor transport grown hexagonal silicon carbide single crystals. The basal plane dislocations are able to cut through single or well-spaced threading edge dislocations even if the formation of kinks/jogs is energetically unfavorable while threading screw dislocations were mostly observed to act as effective pinning points. However, basal plane dislocations can sometimes cut through a threading screw dislocation, forming a superjog and which subsequently migrates on the prismatic plane via a cross-slip process. Threading edge dislocation walls act as obstacles for the glide of basal plane dislocations and the mechanism by which this occurs is discussed. The character of low angle grain boundaries and their dislocation content are discussed.

Characterization of Defect Structures in SiC Single Crystals Using Synchrotron X-Ray Topography

1993 ◽  
Vol 307 ◽  
Author(s):  
S. Wang ◽  
M. Dudley ◽  
C. Carter ◽  
D. Asbury ◽  
C. Fazit
Keyword(s):  
Detailed Analysis ◽  
Single Crystals ◽  
Basal Plane ◽  
Defect Structures ◽  
Dislocation Generation ◽  
Screw Dislocations ◽  
X Ray ◽  
White Beam

ABSTRACTSynchrotron white beam X-ray topography has been used to characterize defect structures in 6H-SiC wafers grown on (0001) seeds. Two major types of defects are observed: super screw dislocations approximately perpendicular to the basal plane and dislocation networks lying in the basal plane. The super screw dislocations, which have open cores, are growth dislocations. These dislocations act as sources and/or sinks for the glide dislocation networks. Detailed analysis and discussion of dislocation generation phenomena and Burgers vectors will be presented.

An optical and X-ray topographic study of giant screw dislocations in silicon carbide

1985 ◽  
Vol 71 (1) ◽  
pp. 41-56 ◽  
Author(s):  
P. Krishna ◽  
S.-S. Jiang ◽  
A.R. Lang
Keyword(s):  
Silicon Carbide ◽  
Screw Dislocations ◽  
X Ray

Morphology and Chemical Composition of Silicon Carbide Surfaces Interacting with Iron, Cobalt, and Nickel in Microscratching

2018 ◽  
Vol 284 ◽  
pp. 363-368 ◽  
Author(s):  
V.A. Nosenko ◽  
A.V. Fetisov ◽  
V.Ye. Puzyrkova
Keyword(s):  
Silicon Carbide ◽  
Electron Microscope ◽  
Chemical Composition ◽  
Iron Cobalt ◽  
Beam Electron ◽  
X Ray ◽  
Metal Atoms ◽  
Dual Beam ◽  
Structure Of Metal ◽  
Cobalt And Nickel

The paper dwells upon the specifics of worn spots being formed on a silicon-carbide crystal in microscratching of iron, cobalt, and nickel. Analysis was done using a Versa 3D dual-beam electron microscope. The chemical composition of worn spots was studied by local X-ray microanalysis. It was found out that the amount of metal transferred to the silicon-carbide worn spot was associated with the electron structure of metal atoms.

Studies of the Distribution of Elementary Threading Screw Dislocations in 4H Silicon Carbide Wafer

2008 ◽  
Vol 600-603 ◽  
pp. 301-304 ◽  
Author(s):  
Yi Chen ◽  
Ning Zhang ◽  
Xian Rong Huang ◽  
David R. Black ◽  
Michael Dudley
Keyword(s):  
Silicon Carbide ◽  
Grazing Incidence ◽  
Vapor Transport ◽  
Physical Vapor Transport ◽  
Screw Dislocations ◽  
X Ray ◽  
Pyramidal Plane

The density and sense distribution of elementary threading screw dislocations in a physical vapor transport grown 3-inch 4H silicon carbide wafer have been studied. The density of TSDs ranges between 1.6×103/cm2 and 7.1×103/cm2 and the lowest density is observed at positions approximately half radius off the wafer center. The dislocation sense of elementary threading screw dislocations can be readily revealed by the asymmetric contrast of their images in grazing-incidence x-ray topographs using pyramidal plane reflections. The circumferential and radial distributions of the sense of elementary threading screw dislocations have been studied and no clear trends are observed in either distribution.

Preparation of Silicon Carbide Nanowires and Nanochains Using Chemical Vapor Deposition Method

2016 ◽  
Vol 697 ◽  
pp. 841-845 ◽  
Author(s):  
Jia Xing Chang ◽  
Rong Zheng Liu ◽  
Ma Lin Liu ◽  
You Lin Shao ◽  
Bing Liu
Keyword(s):  
Silicon Carbide ◽  
Chemical Vapor Deposition ◽  
Electron Microscope ◽  
Vapor Deposition ◽  
Chemical Vapor ◽  
Raw Material ◽  
Chemical Vapor Deposition Method ◽  
Deposition Method ◽  
X Ray ◽  
Wide Range

Silicon carbide nanowires have been extensively studied because of their unique physical and chemical properties. They can be applied in high temperature, high frequency, high power, and corrosive environments, and have a wide range of applications in electronics, chemical industry, energy and other fields. In this paper, SiC nanowires with high output were synthesized by chemical vapor deposition method using methyltrichlorosilane as raw material. The influences of the catalyst and temperature were studied. SiC nanochains were also obtained by adding Al2O3 powder under appropriate temperature controlled strategy. These two kinds of one-dimensional SiC nanomaterials were characterized by X-ray diffraction (XRD), scanning electron microscope (SEM), energy dispersive X-ray spectrometer (EDS) and transmission electron microscope (TEM) methods.

Behavior of Basal Plane Dislocations and Low Angle Grain Boundary Formation in Hexagonal Silicon Carbide

2007 ◽  
Vol 556-557 ◽  
pp. 231-234 ◽  
Author(s):  
Yi Chen ◽  
Govindhan Dhanaraj ◽  
William M. Vetter ◽  
Rong Hui Ma ◽  
Michael Dudley
Keyword(s):  
Silicon Carbide ◽  
Grain Boundary ◽  
Grain Boundaries ◽  
Basal Plane ◽  
Opposite Sign ◽  
Three Dimensional ◽  
Cross Slip ◽  
X Ray ◽  
Tilt Boundaries ◽  
Edge Dislocations

The interactions between basal plane dislocations (BPDs) and threading screw and edge dislocations (TSDs and TEDs) in hexagonal SiC have been studied using synchrotron white beam x-ray topography (SWBXT). TSDs are shown to strongly interact with advancing basal plane dislocations (BPDs) while TEDs do not. A BPD can cut through an individual TED without the formation of jogs or kinks. The BPDs were observed to be pinned by TSDs creating trailing dislocation dipoles. If these dipoles are in screw orientation segments can cross-slip and annihilate also potentially leaving isolated trailing loops. The three-dimensional (3D) distribution of BPDs can lead to aggregation of opposite sign edge segments leading to the creation of low angle grain boundaries (LAGBs) characterized by pure basal plane tilt of magnitude determined by the net difference in densities of the opposite sign dislocations. Similar aggregation can also occur against pre-existing prismatic tilt boundaries made up of TED walls with the net difference in densities of the opposite sign dislocations contributing some basal plane tilt character to the LAGB.

High-Density Ceramic Materials on the Basis of Silicon Carbide

2013 ◽  
Vol 592-593 ◽  
pp. 397-400
Author(s):  
Dinara Sultanovna Dallaeva ◽  
Gulnara Darvinovna Kardashova ◽  
Gadjimet Kerimovich Safaraliev ◽  
Pavel Tománek
Keyword(s):  
Solid Solution ◽  
Silicon Carbide ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Aluminum Nitride ◽  
Hot Pressing ◽  
Manufacturing Process ◽  
Ceramic Materials ◽  
High Density ◽  
Scanning Electron

This study describes the principles of synthesis and technological features of composition ceramics formation on the basis of silicon carbide and aluminum nitride by hot-pressing. The structural properties and composition of the ceramics were investigated by scanning electron microscope and the formation of the solid solution is confirmed. The elements distribution on the surface of failure pattern is shown. The results of the study are useful for optimization of manufacturing process of structural and functional high-density ceramics.

Characterization of 100 mm Diameter 4H-Silicon Carbide Crystals with Extremely Low Basal Plane Dislocation Density

2010 ◽  
Vol 645-648 ◽  
pp. 291-294 ◽  
Author(s):  
Michael Dudley ◽  
Ning Zhang ◽  
Yu Zhang ◽  
Balaji Raghothamachar ◽  
Sha Yan Byrapa ◽  
...  
Keyword(s):  
Silicon Carbide ◽  
Dislocation Density ◽  
Basal Plane ◽  
X Ray ◽  
Repetitive Process ◽  
Basal Plane Dislocation ◽  
And Behavior ◽  
New Generation ◽  
Edge Dislocations

Synchrotron White Beam X-ray Topography (SWBXT) studies are presented of basal plane dislocation (BPD) configurations and behavior in a new generation of 100mm diameter, 4H-SiC wafers with extremely low BPD densities (3-4 x 102 cm-2). The conversion of non-screw oriented, glissile BPDs into sessile threading edge dislocations (TEDs) is observed to provide pinning points for the operation of single ended Frank-Read sources. In some regions, once converted TEDs are observed to re-convert back into BPDs in a repetitive process which provides multiple BPD pinning points.

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