A `beam-selection' high-resolution X-ray diffractometer

2004 ◽  
Vol 37 (4) ◽  
pp. 565-574 ◽  
Author(s):  
Paul F. Fewster
Keyword(s):  
High Resolution ◽  
High Intensity ◽  
Double Crystal ◽  
Low Background ◽  
X Ray ◽  
Minimal Sample ◽  
Beam Selection ◽  
Routine Basis ◽  
Sample Alignment ◽  
Double Crystal Diffractometer

A new diffractometer that can be described as a high-intensity low-background high-resolution diffractometer for analysing perfect, nearly perfect and highly imperfect materials on a routine basis is presented. The instrumentation is very simple and uncomplicated, yet the way in which it works is less obvious. The sample requires minimal sample alignment, the resolution can be adjusted to optimize the experiment and the wavelength dispersion can be controlled. This diffractometer can produce near perfect profiles from bent and imperfect samples. The illuminated area can easily be varied from greater than 3 mm down to 50 µm diameter, offering great opportunities in microdiffraction with high resolution. The instrument appears similar to a double-crystal diffractometer in reverse,i.e.the sample and collimating crystal of a conventional double-crystal diffractometer are reversed; however, the concept is quite different.

HAXPES beamline PES-BL14 at the Indus-2 synchrotron radiation source

2018 ◽  
Vol 25 (5) ◽  
pp. 1541-1547 ◽  
Author(s):  
Jagannath ◽  
U. K. Goutam ◽  
R. K. Sharma ◽  
J. Singh ◽  
K. Dutta ◽  
...  
Keyword(s):  
Thin Film ◽  
High Resolution ◽  
Electron Spectroscopy ◽  
High Energy ◽  
Solid Samples ◽  
Double Crystal ◽  
X Ray ◽  
Double Crystal Monochromator ◽  
Ccd Detector ◽  
Scientific Results

The Hard X-ray Photo-Electron Spectroscopy (HAXPES) beamline (PES-BL14), installed at the 1.5 T bending-magnet port at the Indian synchrotron (Indus-2), is now available to users. The beamline can be used for X-ray photo-emission electron spectroscopy measurements on solid samples. The PES beamline has an excitation energy range from 3 keV to 15 keV for increased bulk sensitivity. An in-house-developed double-crystal monochromator [Si (111)] and a platinum-coated X-ray mirror are used for the beam monochromatization and manipulation, respectively. This beamline is equipped with a high-energy (up to 15 keV) high-resolution (meV) hemispherical analyzer with a microchannel plate and CCD detector system with SpecsLab Prodigy and CasaXPS software. Additional user facilities include a thin-film laboratory for sample preparation and a workstation for on-site data processing. In this article, the design details of the beamline, other facilities and some recent scientific results are described.

Defect structure analysis of polycrystalline materials by computer-controlled double-crystal diffractometer with position-sensitive detector

1983 ◽  
Vol 16 (1) ◽  
pp. 89-95 ◽  
Author(s):  
R. Yazici ◽  
W. Mayo ◽  
T. Takemoto ◽  
S. Weissmann
Keyword(s):  
Position Sensitive Detector ◽  
Polycrystalline Materials ◽  
Sensitive Detector ◽  
Double Crystal ◽  
Rocking Curve ◽  
X Ray ◽  
Local Lattice ◽  
Position Sensitive ◽  
The Individual ◽  
Double Crystal Diffractometer

The method represents an extension of a previously developed X-ray double-crystal diffractometer method when a film was used to record the crystallite reflections, each reflecting crystallite being regarded as the second crystal of a double-crystal diffractometer. By utilizing a position-sensitive detector (PSD) with interactive computer controls, the tedious and limiting task of data acquisition and analysis is greatly simplified. The specimen is irradiated with crystal-monochromated radiation and the numerous microscopic spots emanating from the reflecting crystallites are recorded separately by the position-sensitive detector and its associated multichannel analyzer at each increment of specimen rotation. An on-line minicomputer simultaneously collects these data and applies the necessary corrections. This process is then automatically repeated through the full rocking-curve range. The computer carries out the rocking-curve analysis of the individual crystallite reflections as well as that of the entire reflecting crystallite population. The instrument is provided with a specimen translation device which permits analysis of large sections of solid specimens. Thus, sites of local lattice defects induced either mechanically, chemically or by radiation can rapidly be established and quantitatively determined in terms of rocking-curve parameters as well as imaged by X-ray topography, by inserting a film in front of the PSD. The versatility and usefulness of the method is demonstrated by examples given from studies of fracture, fatigue and stress-corrosion cracking of commercial alloys.

Digital X-Ray Rocking Curve Topography

1986 ◽  
Vol 82 ◽  
Author(s):  
T. S. Ananthanarayanan ◽  
R. G. Rosemeier ◽  
W. E. Mayo ◽  
J. H. Dinan
Keyword(s):  
Bragg Reflection ◽  
Strain Tensor ◽  
Epitaxial Films ◽  
Double Crystal ◽  
Rocking Curve ◽  
X Ray ◽  
Density Maps ◽  
First Time ◽  
Considerable Body ◽  
Double Crystal Diffractometer

SUMMARYThere is a considerable body of work available illustrating the significance of X-ray rocking curve measurements in micro-electronic applications. For the first time a high resolution (100-150µm) 2-dimensional technique called DARC (Digital Autcmated Rocking Curve) topography has been implemented. This method is an enhancement of the conventional double crystal diffractometer using a real time 2-dimensional X-ray detector.Several materials have been successfully examined using DARC topography. Same of these include: Si, GaAs, AlGaAs, InGaAs, HgMnTe, Al, Inconel, steels, etc. By choosing the appropriate Bragg reflection multi-layered micro-electronic structures have been analyzed nondestructively. Several epitaxial films, including HgCdTe and ZnCdTe, grown by molecular beam epitaxy, have also been characterized using iARC topography. The rocking curve half width maps can be translated to dislocation density maps with relative ease. This technique also allows the deconvolution of the micro-plastic lattice strain ccaponent from the total strain tensor.

X-ray monochromator combining high resolution with high intensity

2002 ◽  
Vol 35 (1) ◽  
pp. 41-48 ◽  
Author(s):  
M. Servidori
Keyword(s):  
High Resolution ◽  
High Intensity ◽  
Asymmetry Factor ◽  
Photon Flux ◽  
Wavelength Band ◽  
Germanium Crystal ◽  
X Ray ◽  
Band Pass ◽  
And Performance ◽  
Exit Beam

A two-germanium-crystal four-220-reflection (+ - - \,+) monochromator, combining high intensity with high resolution, is proposed in this work. The main characteristic is that only the first reflection is asymmetric. The asymmetry factor was chosen so as to allow mixing of asymmetric and symmetric reflections in a monolithic channel-cut crystal without the need for rotation of the two monolith components to correct for the different refraction-induced angular shifts of the reflection pair. It is demonstrated that the exit-beam divergence in the diffraction plane and the fractional wavelength band-pass are smaller by 40% than those of the widely used germanium 220 Bartels monochromator, while the photon flux collected from the source is larger by a factor of five. The optical features and performance of the monochromator are discussed and compared with those of other (+ - - \,+) monochromators reported in the literature.

High-resolution X-ray topographic images of dislocations in a silicon crystal recorded using an X-ray zooming tube

1998 ◽  
Vol 5 (3) ◽  
pp. 1079-1081
Author(s):  
Shigeru Kimura ◽  
Tatsuya Matsumura ◽  
Katsuyuki Kinoshita ◽  
Keiichi Hirano ◽  
Hiroshi Kihara
Keyword(s):  
High Resolution ◽  
Digital Imaging ◽  
Imaging System ◽  
Silicon Crystal ◽  
Stage Structure ◽  
Magnification Factor ◽  
Double Crystal ◽  
X Ray ◽  
Imaging Detector ◽  
High Resolution Images

A Be-window-type X-ray zooming tube is an X-ray digital imaging system whose magnification factor of X-ray images can be easily varied from 10 to 200, and whose spatial resolution is less than 0.5 µm. This zooming tube was used as an imaging detector in double-crystal X-ray topography to obtain high-resolution images of dislocations in a silicon crystal. X-ray interference images of about 5 µm were observed even though optimal performance of the X-ray zooming tube could not be achieved. The results indicate that the X-ray zooming tube might make a good detector for X-ray topography with minor improvements in its stage structure.

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