Measuring radioactive powder samples on the high-resolution powder diffraction beamline at the European Synchrotron Radiation Facility

2013 ◽  
Vol 46 (2) ◽  
pp. 567-569
Author(s):  
Adrian H. Hill ◽  
Tomasz Klimczuk ◽  
Ross Springell ◽  
Helen C. Walker
Keyword(s):  
High Resolution ◽  
Synchrotron Radiation ◽  
Sample Preparation ◽  
Powder Diffraction ◽  
Active Material ◽  
European Synchrotron Radiation Facility ◽  
Preparation Technique ◽  
Sample Preparation Technique ◽  
Powder Samples ◽  
Laboratory Note

This laboratory note describes a new sample preparation technique to enable high-resolution powder diffraction experiments at the European Synchrotron Radiation Facility on radioactive samples. The sample preparation involves setting the active material in resin and several layers of encapsulation suitable for measurement at the beamline. This has allowed low-temperature measurements on very small quantities of samples, providing new insights into materials that are notoriously difficult to measure elsewhere.

A new gas system for automatedin situpowder diffraction studies at the European Synchrotron Radiation Facility

2013 ◽  
Vol 46 (2) ◽  
pp. 570-572 ◽  
Author(s):  
Adrian H. Hill
Keyword(s):  
High Resolution ◽  
Synchrotron Radiation ◽  
Powder Diffraction ◽  
European Synchrotron Radiation Facility ◽  
Structural Studies ◽  
Control Software ◽  
Gas System

A new gas dosing rig built for the high-resolution powder diffraction beamline (ID31) at the ESRF is described. The rig is fully controlled and monitored by the beamline control software, enabling automated absorption and desorption of fixed pressures of gases up to 100 bar (107 Pa) forin situstructural studies. The rig has successfully been used on ID31 as well as other beamlines at the ESRF.

SEM evaluation of the TEM cold-stage double-film specimen

1984 ◽  
Vol 42 ◽  
pp. 272-273
Author(s):  
Jayesh Bellare
Keyword(s):  
Spatial Distribution ◽  
Sample Preparation ◽  
Sample Thickness ◽  
Specimen Preparation ◽  
Preparation Technique ◽  
Liquid Sample ◽  
Thin Specimen ◽  
Sample Preparation Technique ◽  
Cold Stage ◽  
Film Specimen

Seeing is believing, but only after the sample preparation technique has received a systematic study and a full record is made of the treatment the sample gets.For microstructured liquids and suspensions, fast-freeze thermal fixation and cold-stage microscopy is perhaps the least artifact-laden technique. In the double-film specimen preparation technique, a layer of liquid sample is trapped between 100- and 400-mesh polymer (polyimide, PI) coated grids. Blotting against filter paper drains excess liquid and provides a thin specimen, which is fast-frozen by plunging into liquid nitrogen. This frozen sandwich (Fig. 1) is mounted in a cooling holder and viewed in TEM.Though extremely promising for visualization of liquid microstructures, this double-film technique suffers from a) ireproducibility and nonuniformity of sample thickness, b) low yield of imageable grid squares and c) nonuniform spatial distribution of particulates, which results in fewer being imaged.

Introduction of a Novel Sample Preparation Technique for the Failure Analysis of Silicon Integrated Photonics Modules

2019 ◽  
Author(s):  
Pradip Sairam Pichumani ◽  
Fauzia Khatkhatay
Keyword(s):  
Sample Preparation ◽  
Failure Analysis ◽  
Silicon Photonics ◽  
Cmos Technology ◽  
Single Step ◽  
Oxide Semiconductor ◽  
Disruptive Technology ◽  
Preparation Technique ◽  
Test Vehicle ◽  
Sample Preparation Technique

Abstract Silicon photonics is a disruptive technology that aims for monolithic integration of photonic devices onto the complementary metal-oxide-semiconductor (CMOS) technology platform to enable low-cost high-volume manufacturing. Since the technology is still in the research and development phase, failure analysis plays an important role in determining the root cause of failures seen in test vehicle silicon photonics modules. The fragile nature of the test vehicle modules warrants the development of new sample preparation methods to facilitate subsequent non-destructive and destructive analysis methods. This work provides an example of a single step sample preparation technique that will reduce the turnaround time while simultaneously increasing the scope of analysis techniques.

Applications of High-Resolution Powder X-Ray Diffraction

2007 ◽  
Vol 130 ◽  
pp. 7-14 ◽  
Author(s):  
Andrew N. Fitch
Keyword(s):  
High Resolution ◽  
Synchrotron Radiation ◽  
Powder Diffraction ◽  
X Rays ◽  
X Ray Diffraction ◽  
Crystalline Materials ◽  
X Ray ◽  
Structural Characterisation ◽  
Pdf Analysis

The highly-collimated, intense X-rays produced by a synchrotron radiation source can be harnessed to build high-resolution powder diffraction instruments with a wide variety of applications. The general advantages of using synchrotron radiation for powder diffraction are discussed and illustrated with reference to the structural characterisation of crystalline materials, atomic PDF analysis, in-situ and high-throughput studies where the structure is evolving between successive scans, and the measurement of residual strain in engineering components.

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