scholarly journals Lattice strain distribution resolved by X-ray Bragg-surface diffraction in an Si matrix distorted by embedded FeSi2nanoparticles

2013 ◽  
Vol 46 (6) ◽  
pp. 1796-1804 ◽  
Author(s):  
Rossano Lang ◽  
Alan S. de Menezes ◽  
Adenilson O. dos Santos ◽  
Shay Reboh ◽  
Eliermes A. Meneses ◽  
...  
Keyword(s):  
Strain Distribution ◽  
Beam Energy ◽  
Lattice Strain ◽  
Ion Beam ◽  
Silicon Layer ◽  
Semiconductor Substrate ◽  
X Ray ◽  
Out Of Plane ◽  
Diffraction Peaks ◽  
Surface Diffraction

Out-of-plane and primarily in-plane lattice strain distributions, along the two perpendicular crystallographic directions on the subsurface of a silicon layer with embedded FeSi2nanoparticles, were analyzed and resolved as a function of the synchrotron X-ray beam energy by using ω:φ mappings of the ({\overline 1}11) and (111) Bragg-surface diffraction peaks. The nanoparticles, synthesized by ion-beam-induced epitaxial crystallization of Fe+-implanted Si(001), were observed to have different orientations and morphologies (sphere- and plate-like nanoparticles) within the implanted/recrystallized region. The results show that the shape of the synthesized material singularly affects the surrounding Si lattice. The lattice strain distribution elucidated by the nonconventional X-ray Bragg-surface diffraction technique clearly exhibits an anisotropic effect, predominantly caused by plate-shaped nanoparticles. This type of refined detection reflects a key application of the method, which could be used to allow discrimination of strains in distorted semiconductor substrate layers.

The Effect of Self-Implantation on the Interdiffusion in Amorphous Si/Ge Multilayers

1986 ◽  
Vol 74 ◽  
Author(s):  
B. Park ◽  
F. Spaepen ◽  
J. M. Poate ◽  
D. C. Jacobson
Keyword(s):  
Ion Beam ◽  
Ion Beam Sputtering ◽  
X Ray Diffraction ◽  
Average Composition ◽  
X Ray ◽  
Composition Modulation ◽  
Beam Sputtering ◽  
Mixing Distance ◽  
Diffraction Peaks ◽  
Amorphous Si

AbstractArtificial amorphous Si/Ge multilayers of equiatomic average composition with a repeat length around 60 Å have been prepared by ion beam sputtering. Implantation with 29Si led to a decrease in the intensity of the X-ray diffraction peaks arising from the composition modulation, which could be used for an accurate measurement of the implantation-induced mixing distance. Subsequent annealing showed no difference between the interdiffusivity in an implanted and unimplanted sample.

X-Ray Profile Analysis of 12% Chromium Stainless Steel

1993 ◽  
Vol 37 ◽  
pp. 351-358
Author(s):  
Zenjxo Yajima ◽  
Ken-ichi Ishikawa ◽  
Toshihiko Sasaki ◽  
Yukio Hirose
Keyword(s):  
Particle Size ◽  
Structural Changes ◽  
Lattice Strain ◽  
Profile Analysis ◽  
Good Method ◽  
Small Particle Size ◽  
Line Broadening ◽  
X Ray ◽  
Diffraction Peaks ◽  
Chromium Stainless Steel

X-ray line broadening is caused by variations in lattice strain and small particle size. When hydrogen is introduced into the steel by the electrolytica! method, structural changes are observed. X-ray line broadening is a suitable measurement in such cases. The Warren and Averbach Fourier analysis is a good method for line broadening studies. In this method, strain and particle size effects can be separated because broadening due to particle size is independent of order of the diffraction peaks, while broadening due to strain is not.

X-ray Topography of Strain Fields Induced by 100 MeV Ti7+ Ion Irradiated Si(100)

1995 ◽  
Vol 378 ◽  
Author(s):  
B. B. Sharma ◽  
S. R. Gupta ◽  
R. K. Sharma ◽  
V. Kumar ◽  
U. Tiwari ◽  
...  
Keyword(s):  
Plane Strain ◽  
Strain Field ◽  
Ion Irradiation ◽  
Ion Beam ◽  
Lattice Deformation ◽  
Beam Direction ◽  
Strain Fields ◽  
X Ray ◽  
Projected Range ◽  
Out Of Plane

AbstractThe lattice deformation caused by 100 MeV Ti7+ ion irradiation in Si (100) has been studied using X-ray topographic techniques. An important finding is the appearance of a strain field perpendicular to the ion beam direction in the irradiated region well separated from the projected range of implanted ions. This in-plane strain extends in the bulk of the sample and is not merely confined to the surface. The implanted region has been found to experience an out of plane strain which is expected to be tensile in nature.

In-Plane Magnetic and Structural Anisotropies in NI and FE Films Produced by Ion-Assisted Deposition

1993 ◽  
Vol 316 ◽  
Author(s):  
W. A. Lewis ◽  
M. Farle ◽  
B. M. Clemens ◽  
R. L. White
Keyword(s):  
Ion Beam ◽  
Anisotropy Field ◽  
Angle Of Incidence ◽  
Induced Anisotropy ◽  
Ion Beam Sputtering ◽  
X Ray Diffraction ◽  
X Ray ◽  
Ion Beam Assisted Deposition ◽  
Out Of Plane ◽  
Beam Sputtering

ABSTRACTWe report the results of our microstructural investigations into the origin of in-plane uniaxial magnetic anisotropies induced in Ni and Fe thin films by low energy ion beam assisted deposition. 1000 Å films were prepared by ion beam sputtering onto amorphous silica substrates under simultaneous bombardment by 100 eV Xe+ ions under an oblique angle of incidence. The induced anisotropy is studied as a function of ion-to-adsorbate atom arrival ratio, R, from values of 0 to 0.35. The maximum anisotropy field is 150 Oe for Ni and 80 Oe for Fe, but their hard axes are oriented orthogonal to each other. Asymmetric x-ray diffraction is employed to study both in-plane and out-of-plane lattice spacings and crystallographic orientation. In agreement with previous work, we find evidence of a anisotropic in-plane strain of magnitude 0.2-0.5%. In all films, the direction perpendicular to the ion bombardment is compressed relative to parallel. The uniaxial magnetic anisotropy is correlated with this in-plane anisotropic strain using a simple magnetoelastic model.

scholarly journals Lattice Strain Evolutions in Ni-W Alloys during a Tensile Test Combined with Synchrotron X-ray Diffraction

Materials ◽  
2020 ◽  
Vol 13 (18) ◽  
pp. 4027
Author(s):  
Tarik Sadat ◽  
Damien Faurie ◽  
Dominique Thiaudière ◽  
Cristian Mocuta ◽  
David Tingaud ◽  
...  
Keyword(s):  
Solid Solution ◽  
Tensile Test ◽  
Single Phase ◽  
Lattice Strain ◽  
Tensile Tests ◽  
X Ray Diffraction ◽  
X Ray ◽  
Significant Difference ◽  
Diffraction Peaks

Ni and Ni(W) solid solution of bulk Ni and Ni-W alloys (Ni-10W, Ni-30W, and Ni-50W) (wt%) were mechanically compared through the evolution of their {111} X-ray diffraction peaks during in situ tensile tests on the DiffAbs beamline at the Synchrotron SOLEIL. A significant difference in terms of strain heterogeneities and lattice strain evolution occurred as the plastic activity increased. Such differences are attributed to the number of brittle W clusters and the hardening due to the solid solution compared to the single-phase bulk Ni sample.

scholarly journals In Situ Biaxial Texture Analysis of Mgo Films During Growth on Amorphous Substrates by Ion Beam-Assisted Deposition

2001 ◽  
Vol 672 ◽  
Author(s):  
Rhett T. Brewer ◽  
Paul N. Arendt ◽  
James R. Groves ◽  
Harry A. Atwater
Keyword(s):  
Film Thickness ◽  
Ion Beam ◽  
Orientation Distribution ◽  
X Ray ◽  
Biaxial Texture ◽  
Plane Orientation ◽  
Transmission Electron ◽  
Out Of Plane ◽  
Amorphous Substrates

ABSTRACTWe used a previously reported kinematical electron scattering model1 to develop a RHEED based method for performing quantitative analysis of mosaic polycrystalline thin film in-plane and out-of-plain grain orientation distributions. RHEED based biaxial texture measurements are compared to X-Ray and transmission electron microscopy measurements to establish the validity of the RHEED analysis method. In situ RHEED analysis reveals that the out-of-plane orientation distribution starts out very broad, and then decreases during IBAD MgO growth. Other results included evidence that the in-plane orientation distribution narrows, the grain size increases, and the film roughens as film thickness increases during IBAD MgO growth. Homoepitaxy of MgO improves the biaxial texture of the IBAD layer, making X-ray measurements of IBAD films with an additional homoepitaxial layer not quantitatively representative of the IBAD layer. Systematic offsets between RHEED analysis and X-ray measurements of biaxial texture, coupled with evidence that biaxial texture improves with increasing film thickness, indicate that RHEED is a superior technique for probing surface biaxial texture.

Combined out-of-plane and in-plane texture control in thin films using ion beam assisted deposition

2001 ◽  
Vol 16 (1) ◽  
pp. 210-216 ◽  
Author(s):  
L. Dong ◽  
D. J. Srolovitz ◽  
G. S. Was ◽  
Q. Zhao ◽  
A. D. Rollett
Keyword(s):  
Thin Films ◽  
Computer Simulation ◽  
Ion Beam ◽  
Ion Beams ◽  
High Symmetry ◽  
Complete Control ◽  
X Ray ◽  
Ion Beam Assisted Deposition ◽  
Pole Figures ◽  
Out Of Plane

Complete control of the texture of a film during growth requires the ability to determine the in-plane and out-of-plane texture simultaneously. We present both computer simulation and experimental evidence for the simultaneous establishment of out-of-plane and in-plane texture during ion beam assisted deposition of aluminum. Channeling along 〈110〉 directions (60° from the normal) creates a {220} out-of-plane orientation rather than the thermodynamically preferred {111} orientation. The ion beam also aligned 〈220〉 directions within the plane of the film. Measured x-ray pole figures confirmed the presence of a strong out-of-plane texture and the presence of two main, twin-related, in-plane texture components. We theoretically demonstrated that it is impossible to completely control both the in-plane and out-of-plane texture with a single ion beam in high-symmetry crystals and two ion beams must be employed to ensure complete texture control.

scholarly journals Micro-beam Laue alignment of multi-reflection Bragg coherent diffraction imaging measurements

2017 ◽  
Vol 24 (5) ◽  
pp. 1048-1055 ◽  
Author(s):  
Felix Hofmann ◽  
Nicholas W. Phillips ◽  
Ross J. Harder ◽  
Wenjun Liu ◽  
Jesse N. Clark ◽  
...  
Keyword(s):  
Focused Ion Beam ◽  
Lattice Strain ◽  
Ion Beam ◽  
Strain Tensor ◽  
Three Dimensional ◽  
Stress Fields ◽  
X Ray Diffraction ◽  
X Ray ◽  
Coherent Diffraction Imaging ◽  
Diffraction Imaging

Multi-reflection Bragg coherent diffraction imaging has the potential to allow three-dimensional (3D) resolved measurements of the full lattice strain tensor in specific micro-crystals. Until now such measurements were hampered by the need for laborious, time-intensive alignment procedures. Here a different approach is demonstrated, using micro-beam Laue X-ray diffraction to first determine the lattice orientation of the micro-crystal. This information is then used to rapidly align coherent diffraction measurements of three or more reflections from the crystal. Based on these, 3D strain and stress fields in the crystal are successfully determined. This approach is demonstrated on a focused ion beam milled micro-crystal from which six reflections could be measured. Since information from more than three independent reflections is available, the reliability of the phases retrieved from the coherent diffraction data can be assessed. Our results show that rapid, reliable 3D coherent diffraction measurements of the full lattice strain tensor in specific micro-crystals are now feasible and can be successfully carried out even in heavily distorted samples.

X-ray Bragg-Surface Diffraction: A Tool to Study In-Plane Strain Anisotropy Due to Ion-Beam-Induced Epitaxial Crystallization in Fe+-Implanted Si(001)

2010 ◽  
Vol 10 (10) ◽  
pp. 4363-4369 ◽  
Author(s):  
Rossano Lang ◽  
Alan S. de Menezes ◽  
Adenilson O. dos Santos ◽  
Shay Reboh ◽  
Eliermes A. Meneses ◽  
...  
Keyword(s):  
Plane Strain ◽  
Ion Beam ◽  
Strain Anisotropy ◽  
X Ray ◽  
Epitaxial Crystallization ◽  
Surface Diffraction

Thickness Dependent Structure and Magnetic Properties in 57Fe/Ti/Co Multilayers

2013 ◽  
Vol 24 ◽  
pp. 85-95 ◽  
Author(s):  
Vishal Jain ◽  
Snehal Jani ◽  
N. Lakshmi ◽  
V.R. Reddy ◽  
K. Venugopalan ◽  
...  
Keyword(s):  
Magnetic Properties ◽  
Ion Beam ◽  
Anisotropy Field ◽  
Exchange Interactions ◽  
Antiferromagnetic Coupling ◽  
Ion Beam Sputtering ◽  
X Ray ◽  
High Anisotropy ◽  
Out Of Plane ◽  
Beam Sputtering

Structural and magnetic properties of57Fe/Ti/Co multilayers (MLs), prepared by Ion beam sputtering on Si substrate have been studied as a function of trilayers (TLs) thickness and modulation periods. X-ray reflectivity (XRR) shows the successful growth of high-quality layered structures along with up to 3rdorder Bragg peaks with distinct Kiessig oscillation. X-ray diffraction (XRD) and Mössbauer studies evidence the formation of different phases mainly at the interfaces. Soft magnetic properties with high saturation values (~800emu/cm3) and high anisotropy field (~20kOe) are observed in the room temperature magnetization curve. The in plane value of coercivities are 18Oe and 60Oe for the 12 and 24 TLs respectively while in the out-of plane direction it increases to nearly 8 and 12 times respectively. The 12 TLs sample shows the presence of two fold anisotropy whereas the 24 TLs sample shows an isotropic behaviour. Low temperature DC magnetization studies evidence the presence of weak antiferromagnetic coupling while the Kelly Henkel plots for these samples show that the dominant exchange interactions between the grains are ferromagnetic.

Sign in / Sign up

Export Citation Format

Share Document