Monte Carlo calculation of A 3 B (111) ordering transition and surface X-ray intensities

1990 ◽  
Vol 46 (2) ◽  
pp. 86-94 ◽  
Author(s):  
X.-M. Zhu ◽  
H. Zabel
Keyword(s):  
Monte Carlo ◽  
Monte Carlo Calculation ◽  
Incident Angle ◽  
Surface Region ◽  
Conducting Surface ◽  
X Ray ◽  
Main Emphasis ◽  
Simulation Results ◽  
Ordering Transition ◽  
Surface Diffraction

A Monte Carlo simulation of an ordering phase transition in the surface region of a f.c.c.-type A 3 B binary alloy is reported. The main emphasis of this simulation is the evaluation of short and long-range-order correlations near the surface which are used for calculating X-ray intensities under grazing-incident-angle conditions. These calculations suggest effective ways of conducting surface diffraction experiments on order-disorder phase transitions. The simulation results are also compared with available experimental data.

scholarly journals Monte Carlo Modeling and Design of Photon Energy Attenuation Layers for >10× Quantum Yield Enhancement in Si-Based Hard X-ray Detectors

Instruments ◽  
2021 ◽  
Vol 5 (2) ◽  
pp. 17
Author(s):  
Eldred Lee ◽  
Kaitlin M. Anagnost ◽  
Zhehui Wang ◽  
Michael R. James ◽  
Eric R. Fossum ◽  
...  
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Quantum Yield ◽  
Photon Energy ◽  
High Efficiency ◽  
High Energy ◽  
Yield Enhancement ◽  
X Ray ◽  
Simulation Results ◽  
Conversion Efficiencies

High-energy (>20 keV) X-ray photon detection at high quantum yield, high spatial resolution, and short response time has long been an important area of study in physics. Scintillation is a prevalent method but limited in various ways. Directly detecting high-energy X-ray photons has been a challenge to this day, mainly due to low photon-to-photoelectron conversion efficiencies. Commercially available state-of-the-art Si direct detection products such as the Si charge-coupled device (CCD) are inefficient for >10 keV photons. Here, we present Monte Carlo simulation results and analyses to introduce a highly effective yet simple high-energy X-ray detection concept with significantly enhanced photon-to-electron conversion efficiencies composed of two layers: a top high-Z photon energy attenuation layer (PAL) and a bottom Si detector. We use the principle of photon energy down conversion, where high-energy X-ray photon energies are attenuated down to ≤10 keV via inelastic scattering suitable for efficient photoelectric absorption by Si. Our Monte Carlo simulation results demonstrate that a 10–30× increase in quantum yield can be achieved using PbTe PAL on Si, potentially advancing high-resolution, high-efficiency X-ray detection using PAL-enhanced Si CMOS image sensors.

Monte Carlo Calculation of X-Rays Deposited Energy in CdZnTe Detector

2007 ◽  
Vol 555 ◽  
pp. 141-146 ◽  
Author(s):  
Srboljub J. Stanković ◽  
M. Petrović ◽  
M. Kovačević ◽  
A. Vasić ◽  
P. Osmokrović ◽  
...  
Keyword(s):  
Monte Carlo ◽  
Monte Carlo Calculation ◽  
Absorbed Dose ◽  
Detector Response ◽  
X Rays ◽  
X Ray ◽  
Cdznte Detector ◽  
Deposited Energy ◽  
Photon Direction ◽  
Cdznte Detectors

CdZnTe detectors have been employed in diagnostic X-ray spectroscopy. This paper presents the Monte Carlo calculation of X-ray deposited energy in a CdZnTe detector for different energies of photon beam. In incident photon direction, the distribution of absorbed dose as deposited energy in detector is determined. Based on the dependence of the detector response on the thickness and different Zn fractions, some conclusions about changes of the material characteristics could be drawn. Results of numerical simulation suggest that the CdZnTe detector could be suitable for X-ray low energy.

A Monte Carlo calculation of the x-ray production from multilayer samples

1991 ◽  
Vol 49 ◽  
pp. 532-533
Author(s):  
T. D. Ly ◽  
D. G. Howitt
Keyword(s):  
Monte Carlo ◽  
Layered Structure ◽  
Electron Microprobe ◽  
Monte Carlo Calculation ◽  
Monte Carlo Program ◽  
Step Size ◽  
Homogeneous Sample ◽  
X Ray ◽  
Microstructural Effects ◽  
Signal Production

The X ray generation and absorption from a sample in an SEM or Electron Microprobe depends upon the geometry as well as the composition. Various schemes for calculating the X-ray signal from a homogeneous sample have been developed but few have addressed the problem associated with the presence of distinct microstructures. We have developed a Monte Carlo program to calculate the signal production from a multilayer sample as a first step to the incorporation of microstructural effects.The X-ray production from a layered structure is different from a homogeneous sample because the signal production and absorption are discontinuous. The differences can be calculated if the layer thicknesses and positions can be taken into account. The principle behind the calculation we have undertaken is the continuously monitor the energy and position of the electron in the specimen. Each trajectory is calculated in the usual stepwise manner except that the step size and scattering probability are continuously adjusted to accommodate the scale of the microstructure.

scholarly journals Monte Carlo calculation of quality correction factors based on air kerma and absorbed dose to water in medium energy x-ray beams

2020 ◽  
Vol 65 (24) ◽  
pp. 245042
Author(s):  
Damian Czarnecki ◽  
Klemens Zink ◽  
Maria Pimpinella ◽  
Jorge Borbinha ◽  
Pedro Teles ◽  
...  
Keyword(s):  
Monte Carlo ◽  
Monte Carlo Calculation ◽  
Absorbed Dose ◽  
Correction Factors ◽  
Medium Energy ◽  
X Ray ◽  
Air Kerma ◽  
Absorbed Dose To Water

Monte Carlo simulations for XIDer, a novel digital integration X-ray detector for the next generation of synchrotron radiation sources

2022 ◽  
Vol 17 (01) ◽  
pp. C01037
Author(s):  
M. Collonge ◽  
P. Busca ◽  
P. Fajardo ◽  
M. Williams
Keyword(s):  
Monte Carlo ◽  
Synchrotron Radiation ◽  
High Energy ◽  
Design Parameters ◽  
Next Generation ◽  
X Ray ◽  
Digital Integration ◽  
Radiation Sources ◽  
Simulation Results ◽  
Readout Scheme

Abstract This work presents the first simulation results of the incremental digital integration readout, a charge-integrating front-end scheme with in-pixel digitisation and accumulation. This novel readout concept is at the core of the XIDer (X-ray Integrating Detector) project, which aims to design 2D pixelated X-ray detectors optimised for high energy scattering and diffraction applications for the next generation of synchrotron radiation sources such as the ESRF Extremely Brilliant Source (EBS). The digital integration readout and the XIDer detector open the possibilities for high-duty-cycle operation under very high photon flux, fast frame-rate and high dynamic range with single-photon sensitivity in the 30–100 keV energy range. The readout method allows for noise-free effective X-ray detection. The digital integration concept is currently under investigation to evaluate the impact of main critical design parameters to identify the strengths and weaknesses of the readout scheme and consequently to propose refinements in the final implementation. Simulations have been performed with a dedicated Monte Carlo simulation tool, X-DECIMO, a modular Python package designed to recreate the complete detection chain of X-ray detectors for synchrotron radiation experiments. Losses and non-linearities of the readout scheme are simulated and quantified. In addition to presenting simulation results for this novel readout scheme, this work underlines the potential of the approach and some of its limitations.

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