In situmonitoring of X-ray strain pole figures of a biaxially deformed ultra-thin film on a flexible substrate

2014 ◽  
Vol 47 (1) ◽  
pp. 181-187 ◽  
Author(s):  
G. Geandier ◽  
D. Faurie ◽  
P.-O. Renault ◽  
D. Thiaudière ◽  
E. Le Bourhis
Keyword(s):  
Thin Film ◽  
Biaxial Loading ◽  
Mechanical Response ◽  
Flexible Substrate ◽  
X Ray ◽  
Area Detector ◽  
Pole Figures ◽  
Insight Into ◽  
Ultra Thin Film

X-ray strain pole figures (SPFs) have been capturedin situduring biaxial deformation of a gold ultra-thin film (thickness = 40 nm) deposited on a polymer substrate. An area detector was used to extract one line in the reciprocal space while the strained sample was rotated azimuthally step by step to produce the SPF. Such SPFs have been obtained for a textured anisotropic ultra-thin film under controlled non-equibiaxial loading using the SOLEIL synchrotron DIFFABS tensile device. The experimental setup allows the pole figure measurements of {111} and {200} reflections to be performed simultaneously. Interestingly, those two crystallographic directions are related to the two-extreme elastic mechanical behaviour. The full directional lattice strain dependence (SPF) is obtained within 15 min and can be monitored step by step upon loading. This procedure gives an insight into ultra-thin film mechanical response under complex biaxial loading.

Anin situatomic force microscope for normal-incidence nanofocus X-ray experiments

2016 ◽  
Vol 23 (5) ◽  
pp. 1110-1117 ◽  
Author(s):  
M. V. Vitorino ◽  
Y. Fuchs ◽  
T. Dane ◽  
M. S. Rodrigues ◽  
M. Rosenthal ◽  
...  
Keyword(s):  
Thin Film ◽  
Atomic Force Microscope ◽  
High Speed ◽  
Normal Incidence ◽  
Organic Thin Film ◽  
X Ray ◽  
Atomic Force ◽  
Synchrotron Beamlines

A compact high-speed X-ray atomic force microscope has been developed forin situuse in normal-incidence X-ray experiments on synchrotron beamlines, allowing for simultaneous characterization of samples in direct space with nanometric lateral resolution while employing nanofocused X-ray beams. In the present work the instrument is used to observe radiation damage effects produced by an intense X-ray nanobeam on a semiconducting organic thin film. The formation of micrometric holes induced by the beam occurring on a timescale of seconds is characterized.

scholarly journals A large-solid-angle X-ray Raman scattering spectrometer at ID20 of the European Synchrotron Radiation Facility

2017 ◽  
Vol 24 (2) ◽  
pp. 521-530 ◽  
Author(s):  
S. Huotari ◽  
Ch. J. Sahle ◽  
Ch. Henriquet ◽  
A. Al-Zein ◽  
K. Martel ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Raman Scattering ◽  
Solid Angle ◽  
European Synchrotron Radiation Facility ◽  
Electronic Excitations ◽  
Raman Scattering Spectroscopy ◽  
X Ray ◽  
Area Detector ◽  
Spectroscopic Tool

An end-station for X-ray Raman scattering spectroscopy at beamline ID20 of the European Synchrotron Radiation Facility is described. This end-station is dedicated to the study of shallow core electronic excitations using non-resonant inelastic X-ray scattering. The spectrometer has 72 spherically bent analyzer crystals arranged in six modular groups of 12 analyzer crystals each for a combined maximum flexibility and large solid angle of detection. Each of the six analyzer modules houses one pixelated area detector allowing for X-ray Raman scattering based imaging and efficient separation of the desired signal from the sample and spurious scattering from the often used complicated sample environments. This new end-station provides an unprecedented instrument for X-ray Raman scattering, which is a spectroscopic tool of great interest for the study of low-energy X-ray absorption spectra in materials under in situ conditions, such as in operando batteries and fuel cells, in situ catalytic reactions, and extreme pressure and temperature conditions.

Insight into the capacity decay mechanism of cycled LiNi0.5Co0.2Mn0.3O2 cathodes via in situ x-ray diffraction

2021 ◽  
Vol 32 (29) ◽  
pp. 295701
Author(s):  
Yalan Huang ◽  
He Zhu ◽  
Hekang Zhu ◽  
Jian Zhang ◽  
Yang Ren ◽  
...  
Keyword(s):  
X Ray Diffraction ◽  
Decay Mechanism ◽  
X Ray ◽  
Insight Into ◽  
Capacity Decay

Multipurpose diffractometer for in situ X-ray crystallography of functional materials

2021 ◽  
Vol 54 (3) ◽  
Author(s):  
Semën Gorfman ◽  
David Spirito ◽  
Netanela Cohen ◽  
Peter Siffalovic ◽  
Peter Nadazdy ◽  
...  
Keyword(s):  
Electric Field ◽  
Materials Science ◽  
Functional Materials ◽  
X Ray Diffraction ◽  
Reciprocal Space Mapping ◽  
X Ray ◽  
X Ray Crystallography ◽  
Area Detector ◽  
Characterization Of Materials

Laboratory X-ray diffractometers play a crucial role in X-ray crystallography and materials science. Such instruments still vastly outnumber synchrotron facilities and are responsible for most of the X-ray characterization of materials around the world. The efforts to enhance the design and performance of in-house X-ray diffraction instruments benefit a broad research community. Here, the realization of a custom-built multipurpose four-circle diffractometer in the laboratory for X-ray crystallography of functional materials at Tel Aviv University, Israel, is reported. The instrument is equipped with a microfocus Cu-based X-ray source, collimating X-ray optics, four-bounce monochromator, four-circle goniometer, large (PILATUS3 R 1M) pixel area detector, analyser crystal and scintillating counter. It is suitable for a broad range of tasks in X-ray crystallography/structure analysis and materials science. All the relevant X-ray beam parameters (total flux, flux density, beam divergence, monochromaticity) are reported and several applications such as determination of the crystal orientation matrix and high-resolution reciprocal-space mapping are demonstrated. The diffractometer is suitable for measuring X-ray diffraction in situ under an external electric field, as demonstrated by the measurement of electric-field-dependent rocking curves of a quartz single crystal. The diffractometer can be used as an independent research instrument, but also as a training platform and for preparation for synchrotron experiments.

In situ X-ray Studies of (La,Sr)MnO3_δ, (La,Sr)CoO3_δ, and La0.6Sr0.4Co0.2Fe0.8O3-δ Thin Film SOFC Cathodes Grown by Pulse Laser Deposition

2013 ◽  
Vol 1495 ◽  
Author(s):  
Kee-Chul Chang ◽  
Brian Ingram ◽  
Paul Salvador ◽  
Bilge Yildiz ◽  
Hoydoo You
Keyword(s):  
Thin Film ◽  
Solid Oxide Fuel Cells ◽  
Pulse Laser Deposition ◽  
Pulse Laser ◽  
Solid Oxide ◽  
Laser Deposition ◽  
Pulse Laser Deposition Technique ◽  
Oxide Fuel ◽  
X Ray

ABSTRACTWe will briefly review in situ synchrotron x-ray investigation of model thin film cathode systems for solid oxide fuel cells. The film cathodes examined in this study are (La,Sr)MnO3_δ (LSM), (La,Sr)CoO3_δ (LSC), and La0.6Sr0.4Co0.2Fe0.8O3-δ (LSCF) thin films epitaxially grown on YSZ single crystal substrates by the pulse laser deposition technique. We find in all cases that Sr is enriched or segregated to the surface of the film cathodes. We concluded that the Sr enrichments or segregations are mainly the results of annealing because they do not depend on whether the cathodes are electrochemically biased or not during annealing. However, at least in the case of LSCF, we find that B-site Co segregates rather uniformly to the surface and the segregation responds sensitively and reversibly to the electrochemical bias.

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