Self-organization of Fe clusters on mesoporous TiO2templates

2014 ◽  
Vol 47 (6) ◽  
pp. 1921-1930 ◽  
Author(s):  
Patrick Ziegler ◽  
Neelima Paul ◽  
Peter Müller-Buschbaum ◽  
Birgit Wiedemann ◽  
Wolfgang Kreuzpaintner ◽  
...  
Keyword(s):  
Magnetic Measurements ◽  
Magnetic Behavior ◽  
Grazing Incidence ◽  
Self Organization ◽  
Hybrid Films ◽  
Correlation Lengths ◽  
X Ray ◽  
Stages Of Growth ◽  
X Ray Scattering ◽  
Out Of Plane

Fe layers with thicknesses between 5 and 100 nm were sputtered on mesoporous nanostructured anatase TiO2templates. The morphology of these hybrid films was probed with grazing-incidence small-angle X-ray scattering and X-ray reflectivity, complemented with magnetic measurements. Three different stages of growth were found, which are characterized by different correlation lengths for each stage. The magnetic behavior correlates with the different growth regimes. At very small thicknesses the TiO2template is coated and a porous Fe film results, with in-plane and out-of-plane magnetization components. With increasing thickness, agglomeration of Fe occurs and the magnetization gradually turns mostly in plane. At large thicknesses, the iron grows independently of the template and the magnetization is predominantly in plane with a bulk-like characteristic.

Grazing Incidence X-Ray Scattering Studies of the Structure and Morphology of the Ni/Mgo(001), Co/Nio(111) and Nife/Nio(111) Interfaces During their in Situ Growth

1999 ◽  
Vol 562 ◽  
Author(s):  
G. Renaud ◽  
A. Barbier ◽  
C. Mocuta
Keyword(s):  
High Temperature ◽  
Magnetic Measurements ◽  
Grazing Incidence ◽  
Ex Situ ◽  
Crystallographic Structure ◽  
Temperature Oxidation ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

ABSTRACTCombined in situ structural and ex situ magnetic studies of the Co/NiO(111) and Ni81Fe19/NiO(111) interfaces are presented. The Co and Permalloy films were grown on NiO(111) single crystals. Structural studies were performed by Grazing Incidence X-ray Scattering during growth. The effect of the temperature of the substrate during deposition was investigated. Under specific growth conditions, almost pure FCC Co and NiFe films can be obtained, with small quantities of twins. Magnetic measurements were performed ex situ by Magneto-Optical Kerr Effect (MOKE). A strong correlation between the magnetic properties and the crystallographic structure of the Co film is evidenced. High coercive fields are measured for all samples. High temperature annealing of the NiFe film leads to an improved crystalline quality, but the interface becomes reactive and diffuse: part of the Fe diffuses into the NiO substrate and forms an interface compound, likely to be the spinel NiFe2O4. We also report an in situ grazing incidence X-ray scattering study of the Ni/MgO(001) interface during its formation at room temperature. In-plane measurements reveal that the interface is sharp and that the epitaxial relationship is complex. Two distinct lattices are found to exist: expanded Ni(001) and Ni(110). The latter exhibits several orientations with respect to the substrate depending on the thickness. The Ni(110) orientations disappear by annealing at high temperature, leaving only the Ni cube/cube orientation. The layer was also almost fully transformed into NiO(001) by high temperature oxidation.

Principal Residual Strains as A function of Depth for Sputter Deposited Mo Thin Films

1994 ◽  
Vol 356 ◽  
Author(s):  
S. G. Malhotra ◽  
Z. U. Rek ◽  
L. J. Parfitt ◽  
S. M. Yalisove ◽  
J. C. Bilello
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Grazing Incidence ◽  
X Ray ◽  
X Ray Scattering ◽  
Out Of Plane ◽  
Residual Strains ◽  
Sputter Deposited ◽  
Film Substrate ◽  
Principal Strains

AbstractTraditionally, the magnitude of the stress in a thin film is obtained by measuring the curvature of the film-substrate couple; however, these techniques all measure the average stress throughout the film thickness. On a microscopic level, the details of the strain distribution as a function of depth through the thickness of the film can have important consequences in governing film quality and ultimate morphology. A new method for determining the magnitude of principal strains (strain eigenvalues) as a function of x-ray penetration depth using grazing incidence x-ray scattering for a polycrystalline thin film will be described. Results are reported for two Mo metallizations ˜ 500 Å and ˜1000 Å thick sputtered onto Si {100} substrates. The magnitude of the principal strains at several penetration depths was accomplished by an analysis of the diffraction peak shifts of at least six independent {hkl} scattering vectors from the Mo thin films. An out-of-plane strain gradient was identified in both Mo films and the strain eigenvalues were found to be anisotropic in nature. This new methodology should work with a variety of thin films and hence would provide quantitative insight into the evolution of thin film microstructure.

Colloidal PbS quantum dot stacking kinetics during deposition via printing

2020 ◽  
Vol 5 (5) ◽  
pp. 880-885 ◽  
Author(s):  
Wei Chen ◽  
Haodong Tang ◽  
Nian Li ◽  
Manuel A. Scheel ◽  
Yue Xie ◽  
...  
Keyword(s):  
Quantum Dots ◽  
Grazing Incidence ◽  
Self Organization ◽  
Drying Process ◽  
Two Phase ◽  
Organization Behavior ◽  
X Ray ◽  
X Ray Scattering ◽  
Pbs Quantum Dot

The particle self-organization behavior of small-sized quantum dots is studied in situ with grazing-incidence small-angle X-ray scattering and during the drying process two phase transitions are found.

scholarly journals In-Plane Texturing in Sputtered Films

2000 ◽  
Vol 34 (2-3) ◽  
pp. 91-103 ◽  
Author(s):  
J. F. Whitacre ◽  
S. M. Yalisove ◽  
J. C. Bilello
Keyword(s):  
Electron Microscopy ◽  
Texture Evolution ◽  
Grazing Incidence ◽  
X Ray ◽  
Sputtered Films ◽  
X Ray Scattering ◽  
Transmission Electron ◽  
Out Of Plane ◽  
And Control ◽  
Average Angle

Films consisting of Mo, Cr, and Ta have all been found to display well-defined biaxial textures when grown under certain conditions. A well-defined out-of-plane texture evolves within the first ~ 100 nm of the film, followed by the evolution of a preferred crystallographic orientation in the plane of the film. These effect were studied using X-ray pole figure analysis, scanning electron microscopy (SEM), transmission electron microscopy (TEM), transmission electron diffraction (TED), and high resolution grazing incidence X-ray scattering (GIXS). It has been found that in-plane texture evolves only when there is, on average, oblique adatom flux incident onto the substrate. Further, the type of out-of-plane texture can be controlled by altering the deposition conditions. Parameters including cathode-to-substrate distance, deposition rate, average angle of adatom incidence, and sputter gas pressure, have been shown to determine the type out-of-plane texture, as well as the rate of in-plane texture evolution. The studies conducted have shown that it is possible to create and control biaxially textured films and multilayers made of a variety of materials. A recent model which describes this phenomena is discussed.

Studies of Interfacial Roughness of GaAs/AlAs Superlattices by Grazing Incidence X-Ray Scattering

1997 ◽  
Vol 11 (24) ◽  
pp. 1057-1067 ◽  
Author(s):  
S. Huang ◽  
Z. H. Ming ◽  
Y. L. Soo ◽  
Y. H. Kao ◽  
T. Chang ◽  
...  
Keyword(s):  
Quantum Well ◽  
Imaging Techniques ◽  
Structural Parameters ◽  
Grazing Incidence ◽  
Type Ii ◽  
Interfacial Roughness ◽  
Correlation Lengths ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

A series of type-II GaAs/AlAs superlattices epitaxially grown with different interrupts have been investigated using the techniques of grazing incidence X-ray scattering and diffraction. The interrupts are specifically designed to alter the interfacial roughness in the superlattices for the present study. Various structural parameters including the layer thickness, interfacial roughness, and intra-layer correlation lengths of fluctuations in the quantum-well widths have been determined. These results are compared with measurements made on the same set of samples using photoluminescence and optical imaging techniques.

High Resolution X-Ray Scattering Studies of Strain in Epitaxial Thin Films of Yttrium Silicide Grown on Silicon(111)

1989 ◽  
Vol 160 ◽  
Author(s):  
L. J. Martinez-Miranda ◽  
M. P. Siegal ◽  
P. A. Heiney ◽  
J. J. Santiago-Aviles ◽  
W. R. Graham
Keyword(s):  
Thin Films ◽  
High Resolution ◽  
Grazing Incidence ◽  
Lattice Parameters ◽  
Epitaxial Thin Films ◽  
X Ray ◽  
X Ray Scattering ◽  
Areal Coverage ◽  
Out Of Plane ◽  
Ray Scattering

AbstractWe have used high resolution grazing incidence x-ray scattering (GIXS) to study the in-plane and out-of-plane structure of epitaxial YSi2-x films grown on Si (111), with thicknesses ranging from 85Å to 510Å. Our results indicate that the films are strained, and that film strain increases as a function of thickness, with lattice parameters varying from a = 3.846Å/c = 4.142Å for the 85Å film to a = 3.877Å/c = 4.121Å for the 510Å film. We correlate these results with an increase in pinhole areal coverage as a function of thickness. In addition, our measurements show no evidence for the existence of ordered silicon vacancies in the films.

Morphology of Fe nanolayers with Pt overlayers on low-temperature annealing

2016 ◽  
Vol 49 (5) ◽  
pp. 1682-1692 ◽  
Author(s):  
Jing Gong ◽  
Neelima Paul ◽  
Béla Nagy ◽  
Miklós Dolgos ◽  
László Bottyán ◽  
...  
Keyword(s):  
Low Temperature ◽  
Grain Morphology ◽  
Grazing Incidence ◽  
Correlation Lengths ◽  
X Ray ◽  
Grain Sizes ◽  
Agglomeration Process ◽  
Low Temperature Annealing ◽  
X Ray Scattering ◽  
Transmission Electron

Agglomeration or dewetting is technologically important in the microelectronics industry as it is one of the methods of producing arrays of nanosized metal clusters. This report investigates the grain morphology evolution due to low-temperature annealing (473 K) in Fe layers with Pt overlayers. X-ray diffuse scattering and grazing-incidence small-angle X-ray scattering (GISAXS) have been used to access different correlation lengths and correlate them with grain sizes from transmission electron microscopy. Overall, the GISAXS data indicate that the nanoparticles or nanoclusters in the samples appear as bimodal distributions. It is shown that, for an Fe layer with vertical grain sizes of 5 and 11 nm, irrespective of cluster size, there is no signature of agglomeration between the Fe and Pt layers even with very long annealing times (3000 min). The vertical grain sizes are mediated by the film thickness. Furthermore, an alternating variation with grain sizes of 4 and 7 nm is achieved by Al doping, but without a restriction on the Fe layer thickness. Even in this case, the agglomeration process is seen to remain unaffected by annealing for the same time durations, but only for the larger sized nanoclusters. The smaller ones are seen to grow in size, with increased correlation lengths for the maximum annealing time owing to higher surface energy.

New Structure of CTAB Templated Silica Films as revealed by GISAXS coupled to HRTEM

2000 ◽  
Vol 628 ◽  
Author(s):  
Sophie Besson ◽  
Catherine Jacquiod ◽  
Thierry Gacoin ◽  
André Naudon ◽  
Christian Ricolleau ◽  
...  
Keyword(s):  
Cetyltrimethylammonium Bromide ◽  
Grazing Incidence ◽  
Hexagonal Structure ◽  
X Ray Diffraction ◽  
Electronic Microscopy ◽  
Silica Films ◽  
X Ray ◽  
X Ray Scattering ◽  
Hexagonal Arrangement ◽  
Spherical Micelles

ABSTRACTA microstructural study on surfactant templated silica films is performed by coupling traditional X-Ray Diffraction (XRD) and Transmission Electronic Microscopy (TEM) to Grazing Incidence Small Angle X-Ray Scattering (GISAXS). By this method it is shown that spin-coating of silicate solutions with cationic surfactant cetyltrimethylammonium bromide (CTAB) as a templating agent provides 3D hexagonal structure (space group P63/mmc) that is no longer compatible with the often described hexagonal arrangement of tubular micelles but rather with an hexagonal arrangement of spherical micelles. The extent of the hexagonal ordering and the texture can be optimized in films by varying the composition of the solution.

Quantifying Multiple Crystallite Orientations and Crystal Heterogeneities in Complex Thin Film Materials

2019 ◽  
Author(s):  
Jonathan Ogle ◽  
Daniel Powell ◽  
Eric Amerling ◽  
Detlef Matthias Smilgies ◽  
Luisa Whittaker-Brooks
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Structural Design ◽  
Grazing Incidence ◽  
Crystallite Orientation ◽  
Miller Index ◽  
X Ray ◽  
X Ray Scattering ◽  
Orientation Distributions ◽  
Orientation Information

<p>Thin film materials have become increasingly complex in morphological and structural design. When characterizing the structure of these films, a crucial field of study is the role that crystallite orientation plays in giving rise to unique electronic properties. It is therefore important to have a comparative tool for understanding differences in crystallite orientation within a thin film, and also the ability to compare the structural orientation between different thin films. Herein, we designed a new method dubbed the mosaicity factor (MF) to quantify crystallite orientation in thin films using grazing incidence wide-angle X-ray scattering (GIWAXS) patterns. This method for quantifying the orientation of thin films overcomes many limitations inherent in previous approaches such as noise sensitivity, the ability to compare orientation distributions along different axes, and the ability to quantify multiple crystallite orientations observed within the same Miller index. Following the presentation of MF, we proceed to discussing case studies to show the efficacy and range of application available for the use of MF. These studies show how using the MF approach yields quantitative orientation information for various materials assembled on a substrate.<b></b></p>

Sign in / Sign up

Export Citation Format

Share Document