scholarly journals Micrometer-resolution imaging using MÖNCH: towards G2-less grating interferometry

2016 ◽  
Vol 23 (6) ◽  
pp. 1462-1473 ◽  
Author(s):  
Sebastian Cartier ◽  
Matias Kagias ◽  
Anna Bergamaschi ◽  
Zhentian Wang ◽  
Roberto Dinapoli ◽  
...  
Keyword(s):  
High Resolution ◽  
Silicon Detector ◽  
Limiting Factor ◽  
X Rays ◽  
X Ray ◽  
Charge Cloud ◽  
High Resolution Images ◽  
Resolution Imaging ◽  
Hybrid Silicon ◽  
Small Pixel

MÖNCH is a 25 µm-pitch charge-integrating detector aimed at exploring the limits of current hybrid silicon detector technology. The small pixel size makes it ideal for high-resolution imaging. With an electronic noise of about 110 eV r.m.s., it opens new perspectives for many synchrotron applications where currently the detector is the limiting factor,e.g.inelastic X-ray scattering, Laue diffraction and soft X-ray or high-resolution color imaging. Due to the small pixel pitch, the charge cloud generated by absorbed X-rays is shared between neighboring pixels for most of the photons. Therefore, at low photon fluxes, interpolation algorithms can be applied to determine the absorption position of each photon with a resolution of the order of 1 µm. In this work, the characterization results of one of the MÖNCH prototypes are presented under low-flux conditions. A custom interpolation algorithm is described and applied to the data to obtain high-resolution images. Images obtained in grating interferometry experiments without the use of the absorption grating G2are shown and discussed. Perspectives for the future developments of the MÖNCH detector are also presented.

scholarly journals The Effect of Image Resolution on Automated Classification of Chest X-rays

2021 ◽  
Author(s):  
Md Inzamam Ul Haque ◽  
Abhishek K Dubey ◽  
Jacob D Hinkle
Keyword(s):  
High Resolution ◽  
Automated Analysis ◽  
Image Resolution ◽  
Free Text ◽  
X Rays ◽  
Training Time ◽  
X Ray ◽  
Radiology Reports ◽  
Chest X Ray ◽  
High Resolution Images

Deep learning models have received much attention lately for their ability to achieve expert-level performance on the accurate automated analysis of chest X-rays. Although publicly available chest X-ray datasets include high resolution images, most models are trained on reduced size images due to limitations on GPU memory and training time. As compute capability continues to advance, it will become feasible to train large convolutional neural networks on high-resolution images. This study is based on the publicly available MIMIC-CXR-JPG dataset, comprising 377,110 high resolution chest X-ray images, and provided with 14 labels to the corresponding free-text radiology reports. We find, interestingly, that tasks that require a large receptive field are better suited to downscaled input images, and we verify this qualitatively by inspecting effective receptive fields and class activation maps of trained models. Finally, we show that stacking an ensemble across resolutions outperforms each individual learner at all input resolutions while providing interpretable scale weights, suggesting that multi-scale features are crucially important to information extraction from high-resolution chest X-rays.

HRTEM and chemical analysis of NiAl-5Ti

1996 ◽  
Vol 54 ◽  
pp. 230-231
Author(s):  
A. W. Wilson ◽  
J. M. Howe ◽  
A. Garg ◽  
R. D. Noebe
Keyword(s):  
High Resolution ◽  
Chemical Analysis ◽  
Alloy Composition ◽  
X Ray ◽  
Alloying Additions ◽  
Mechanical And Physical Properties ◽  
Bulk Chemical ◽  
High Resolution Images ◽  
Resolution Imaging ◽  
Low Levels

NiAl-based alloys are currently being studied to determine the effects of alloying additions on the mechanical and physical properties of NiAl. Microstructural changes due to varying alloy composition have been determined and related to the mechanical properties, but high-resolution imaging and compositional profiles of the nanophases and interfaces in these alloys have not been performed. The current study involves the use of a JEOL 2010F field-emission analytical TEM operating at 200 kV equipped with an ultra-thin window energy dispersive X-ray (EDX) detector to obtain high resolution images and compositional information from various nanophases. A single crystal of NiAl containing 5 at.% Ti was examined in this study. EDX spectroscopy of the specimen revealed the presence of low levels of impurities such as Si and P, as shown below. Bulk chemical analysis revealed that Si was present at 190 ppm while P was present at levels below detectability limits.

Principle and practice of high-resolution imaging with a field-emission TEM

1992 ◽  
Vol 50 (1) ◽  
pp. 138-139
Author(s):  
Max T. Otten ◽  
Wim M.J. Coene
Keyword(s):  
High Resolution ◽  
Field Emission ◽  
Incidence Angle ◽  
Temporal Coherence ◽  
Energy Spread ◽  
High Resolution Imaging ◽  
Major Improvement ◽  
High Resolution Images ◽  
Resolution Imaging

High-resolution imaging with a LaB6 instrument is limited by the spatial and temporal coherence, with little contrast remaining beyond the point resolution. A Field Emission Gun (FEG) reduces the incidence angle by a factor 5 to 10 and the energy spread by 2 to 3. Since the incidence angle is the dominant limitation for LaB6 the FEG provides a major improvement in contrast transfer, reducing the information limit to roughly one half of the point resolution. The strong improvement, predicted from high-resolution theory, can be seen readily in diffractograms (Fig. 1) and high-resolution images (Fig. 2). Even if the information in the image is limited deliberately to the point resolution by using an objective aperture, the improved contrast transfer close to the point resolution (Fig. 1) is already worthwhile.

Nano-probe x-ray analysis and high-resolution imaging on planar defects in high-pressure synthesized infinite-layer superconductor

1994 ◽  
Vol 52 ◽  
pp. 728-729
Author(s):  
Y. Y. Wang ◽  
H. Zhang ◽  
V. P. Dravid ◽  
H. Zhang ◽  
L. D. Marks ◽  
...  
Keyword(s):  
High Pressure ◽  
High Resolution ◽  
Atomic Structure ◽  
Emission Spectra ◽  
High Resolution Electron Microscopy ◽  
Planar Defects ◽  
X Ray ◽  
Infinite Layer ◽  
Resolution Electron ◽  
Resolution Imaging

Azuma et al. observed planar defects in a high pressure synthesized infinitelayer compound (i.e. ACuO2 (A=cation)), which exhibits superconductivity at ~110 K. It was proposed that the defects are cation deficient and that the superconductivity in this material is related to the planar defects. In this report, we present quantitative analysis of the planar defects utilizing nanometer probe xray microanalysis, high resolution electron microscopy, and image simulation to determine the chemical composition and atomic structure of the planar defects. We propose an atomic structure model for the planar defects.Infinite-layer samples with the nominal chemical formula, (Sr1-xCax)yCuO2 (x=0.3; y=0.9,1.0,1.1), were prepared using solid state synthesized low pressure forms of (Sr1-xCax)CuO2 with additions of CuO or (Sr1-xCax)2CuO3, followed by a high pressure treatment.Quantitative x-ray microanalysis, with a 1 nm probe, was performed using a cold field emission gun TEM (Hitachi HF-2000) equipped with an Oxford Pentafet thin-window x-ray detector. The probe was positioned on the planar defects, which has a 0.74 nm width, and x-ray emission spectra from the defects were compared with those obtained from vicinity regions.

X-Ray Nanotomography (XRMT) Tool for Non-Destructive High-Resolution Imaging of ICs

2001 ◽  
Author(s):  
Wenbing Yun ◽  
Steve Wang ◽  
David Scott ◽  
Kenneth W. Nill ◽  
Waleed S. Haddad
Keyword(s):  
High Resolution ◽  
Process Development ◽  
3D Visualization ◽  
Tomographic Reconstruction ◽  
Reconstruction Algorithms ◽  
X Ray ◽  
Visualization Software ◽  
Volumetric Reconstruction ◽  
Resolution Imaging ◽  
Non Destructive

Abstract A high-resolution table-sized x-ray nanotomography (XRMT) tool has been constructed that shows the promise of nondestructively imaging the internal structure of a full IC stack with a spatial resolution better than 100 nm. Such a tool can be used to detect, localize, and characterize buried defects in the IC. By collecting a set of X-ray projections through the full IC (which may include tens of micrometers of silicon substrate and several layers of Cu interconnects) and applying tomographic reconstruction algorithms to these projections, a 3D volumetric reconstruction can be obtained, and analyzed for defects using 3D visualization software. XRMT is a powerful technique that will find use in failure analysis and IC process development, and may facilitate or supplant investigations using SEM, TEM, and FIB tools, which generally require destructive sample preparation and a vacuum environment.

Cryogenic high-resolution X-ray spectrometers for SR-XRF and microanalysis

1998 ◽  
Vol 5 (3) ◽  
pp. 515-517 ◽  
Author(s):  
M. Frank ◽  
C. A. Mears ◽  
S. E. Labov ◽  
L. J. Hiller ◽  
J. B. le Grand ◽  
...  
Keyword(s):  
High Resolution ◽  
Energy Resolution ◽  
Superconducting Tunnel Junction ◽  
Semiconductor Detectors ◽  
X Rays ◽  
X Ray ◽  
Sr Xrf ◽  
Demonstration Experiment ◽  
Near Future ◽  
Stj Detector

Experimental results are presented obtained with a cryogenically cooled high-resolution X-ray spectrometer based on a 141 × 141 µm Nb-Al-Al2O3-Al-Nb superconducting tunnel junction (STJ) detector in an SR-XRF demonstration experiment. STJ detectors can operate at count rates approaching those of semiconductor detectors while still providing a significantly better energy resolution for soft X-rays. By measuring fluorescence X-rays from samples containing transition metals and low-Z elements, an FWHM energy resolution of 6–15 eV for X-rays in the energy range 180–1100 eV has been obtained. The results show that, in the near future, STJ detectors may prove very useful in XRF and microanalysis applications.

Applications of High-Resolution Powder X-Ray Diffraction

2007 ◽  
Vol 130 ◽  
pp. 7-14 ◽  
Author(s):  
Andrew N. Fitch
Keyword(s):  
High Resolution ◽  
Synchrotron Radiation ◽  
Powder Diffraction ◽  
X Rays ◽  
X Ray Diffraction ◽  
Crystalline Materials ◽  
X Ray ◽  
Structural Characterisation ◽  
Pdf Analysis

The highly-collimated, intense X-rays produced by a synchrotron radiation source can be harnessed to build high-resolution powder diffraction instruments with a wide variety of applications. The general advantages of using synchrotron radiation for powder diffraction are discussed and illustrated with reference to the structural characterisation of crystalline materials, atomic PDF analysis, in-situ and high-throughput studies where the structure is evolving between successive scans, and the measurement of residual strain in engineering components.

HIGH-RESOLUTION PIXE USING BRAGG’S SPECTROMETER

1991 ◽  
Vol 01 (03) ◽  
pp. 251-258 ◽  
Author(s):  
M. TERASAWA
Keyword(s):  
High Resolution ◽  
Heavy Ions ◽  
X Rays ◽  
Light Elements ◽  
Element Analysis ◽  
X Ray ◽  
Peak Intensity ◽  
Moderate Energy ◽  
Practical Analysis ◽  
Wavelength Selectivity

K, L, and M X-rays in the wavelengths between 6Å and 130Å generated by the bombardment of 200 keV protons and other heavy ions were measured by means of a wavelength dispersive Bragg’s spectrometer. The X-ray peak intensity was fairly high in general, while the background was very low. The technique was favorably applied to a practical analysis of several light elements (Be, B, C, N, O, and F). Use of moderate-energy heavy ions considering the wavelength selectivity in X-ray generation was effective for the element analysis. The high-resolution spectrometry in the analytical application of ion-induced X-ray generation was found to be useful for the study of fine electronic structure, e.g. satellite and hypersatellite X-ray study, and of the chemical state of materials.

High-Resolution Imaging of the Ocean Surface Backscatter by Inversion of Altimeter Waveforms

2011 ◽  
Vol 28 (8) ◽  
pp. 1050-1062 ◽  
Author(s):  
Jean Tournadre ◽  
Bertrand Chapron ◽  
Nicolas Reul
Keyword(s):  
High Resolution ◽  
Significant Wave Height ◽  
Basic Assumption ◽  
Sea Surface ◽  
Small Scale ◽  
High Resolution Imaging ◽  
Small Islands ◽  
Backscatter Coefficient ◽  
High Resolution Images ◽  
Resolution Imaging

Abstract This paper presents a new method to analyze high-resolution altimeter waveforms in terms of surface backscatter. Over the ocean, a basic assumption of modeling altimeter echo waveforms is to consider a homogeneous sea surface within the altimeter footprint that can be described by a mean backscatter coefficient. When the surface backscatter varies strongly at scales smaller than the altimeter footprint size, such as in the presence of surface slicks, rain, small islands, and altimeter echoes can be interpreted as high-resolution images of the surface whose geometry is annular and not rectangular. A method based on the computation of the imaging matrix and its pseudoinverse to infer the surface backscatter at high resolution (~300 m) from the measured waveforms is presented. The method is tested using synthetic waveforms for different surface backscatter fields and is shown to be unbiased and accurate. Several applications can be foreseen to refine the analysis of rain patterns, surface slicks, and lake surfaces. The authors choose here to focus on the small-scale variability of backscatter induced by a submerged reef smaller than the altimeter footprint as the function of tide, significant wave height, and wind.

scholarly journals Detection Capability Verification and Performance Test for the High Resolution Imaging Camera of China’s Tianwen-1 Mission

2021 ◽  
Vol 217 (6) ◽  
Author(s):  
Wei Yan ◽  
Jianjun Liu ◽  
Xin Ren ◽  
Chunlai Li ◽  
Qiang Fu ◽  
...  
Keyword(s):  
High Resolution ◽  
Data Processing ◽  
High Resolution Imaging ◽  
Martian Surface ◽  
Detection Capability ◽  
High Quality ◽  
Mars Exploration ◽  
Imaging Camera ◽  
High Resolution Images ◽  
Resolution Imaging

AbstractHigh-resolution optical cameras have always been important scientific payloads in Mars exploration missions, which can obtain detailed images of Martian surface for the study of geomorphology, topography and geological structure. At present, there are still many challenges for Mars high-resolution images in terms of global coverage, stereo coverage (especially for colour images), and data processing methods. High Resolution Imaging Camera (HiRIC) is a high-quality, multi-mode, multi-functional, multi-spectral remote sensing camera that is suitable for the deep space developed for China’s first Mars Exploration Mission (Tianwen-1), which was successfully launched in July 2020. Here we design special experiments based on the in-orbit detection conditions of Tianwen-1 mission to comprehensively verify the detection capability and the performance of HiRIC, from the aspects of image motion compensation effect, focusing effect, image compression quality, and data preprocessing accuracy. The results showed that the performance status of HiRIC meets the requirements of obtaining high resolution images on the Martian surface. Furthermore, proposals for HiRIC in-orbit imaging strategy and data processing are discussed to ensure the acquisition of high-quality HiRIC images, which is expected to serve as a powerful complementation to the current Mars high-resolution images.

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