Side-bounce beamlines using single-reflection diamond monochromators at Cornell High Energy Synchrotron Source

2021 ◽  
Vol 28 (2) ◽  
pp. 429-438
Author(s):  
Stanislav Stoupin ◽  
Thomas Krawczyk ◽  
David Sagan ◽  
Alexander Temnykh ◽  
Louisa Smieska ◽  
...  
Keyword(s):  
Chemical Vapor ◽  
Functional Materials ◽  
Soft Materials ◽  
High Energy ◽  
Bragg Angle ◽  
Chemical Vapor Deposition Method ◽  
X Rays ◽  
Time Resolved ◽  
Synchrotron Source ◽  
X Ray

The design and implementation of new beamlines featuring side-bounce (single-reflection) diamond monochromators at Cornell High Energy Synchrotron Source (CHESS) are described. Undulator radiation is monochromated using an interchangeable set of diamond crystal plates reflecting radiation in the horizontal (synchrotron) plane, where each crystal plate is set to one of the low-index Bragg reflections (111, 220, 311 and 400) in either Bragg or Laue reflection geometries. At the nominal Bragg angle of 18° these reflections deliver monochromated X-rays with photon energies of 9.7, 15.9, 18.65 and 22.5 keV, respectively. An X-ray mirror downstream of the diamond monochromator is used for rejection of higher radiation harmonics and for initial focusing of the monochromated beam. The characteristics of the X-ray beam entering the experimental station were measured experimentally and compared with the results of simulations. A reasonable agreement is demonstrated. It is shown that the use of selected high-dislocation-density `mosaic' diamond single-crystal plates produced using the chemical vapor deposition method yields a few-fold enhancement in the flux density of the monochromated beam in comparison with that delivered by perfect crystals under the same conditions. At present, the Functional Materials Beamline at CHESS, which is used for time-resolved in situ characterization of soft materials during processing, has been outfitted with the described setup.

Time-Resolved X-Ray Studies During Pulsed-Laser Irradiation of Ge

1984 ◽  
Vol 35 ◽  
Author(s):  
J.Z. Tischler ◽  
B.C. Larson ◽  
D.M. Mills
Keyword(s):  
Melting Point ◽  
Laser Irradiation ◽  
Pulsed Laser ◽  
Laser Pulses ◽  
High Energy ◽  
Measured Temperature ◽  
Time Resolved ◽  
Synchrotron Source ◽  
X Ray ◽  
Pulsed Laser Irradiation

ABSTRACTSynchrotron x-ray pulses from the Cornell High Energy Synchrotron Source (CHESS) have been used to carry out nanosecond resolution measurements of the temperature distrubutions in Ge during UV pulsed-laser irradiation. KrF (249 nm) laser pulses of 25 ns FWHM with an energy density of 0.6 J/cm2 were used. The temperatures were determined from x-ray Bragg profile measurements of thermal expansion induced strain on <111> oriented Ge. The data indicate the presence of a liquid-solid interface near the melting point, and large (1500-4500°C/pm) temperature gradients in the solid; these Ge results are analagous to previous ones for Si. The measured temperature distributions are compared with those obtained from heat flow calculations, and the overheating and undercooling of the interface relative to the equilibrium melting point are discussed.

scholarly journals Design and Performance of the X-ray Polarimeter X-Calibur

2014 ◽  
Vol 03 (02) ◽  
pp. 1440008 ◽  
Author(s):  
M. Beilicke ◽  
F. Kislat ◽  
A. Zajczyk ◽  
Q. Guo ◽  
R. Endsley ◽  
...  
Keyword(s):  
Gamma Ray ◽  
Detection Efficiency ◽  
Grazing Incidence ◽  
High Energy ◽  
X Rays ◽  
Field Orientation ◽  
Synchrotron Source ◽  
X Ray ◽  
And Performance ◽  
Detector Assembly

X-ray polarimetry promises to give qualitatively new information about high-energy astrophysical sources, such as binary black hole systems, micro-quasars, active galactic nuclei, neutron stars, and gamma-ray bursts. We designed, built and tested a X-ray polarimeter, X-Calibur, to be used in the focal plane of the balloon-borne InFOCμS grazing incidence X-ray telescope. X-Calibur combines a low-Z scatterer with a Cadmium Zinc Telluride (CZT) detector assembly to measure the polarization of 20–80 keV X-rays making use of the fact that polarized photons scatter preferentially perpendicular to the electric field orientation. X-Calibur achieves a high detection efficiency of ≃80%. The X-Calibur detector assembly is completed, tested, and fully calibrated. The response to a polarized X-ray beam was measured successfully at the Cornell High Energy Synchrotron Source. This paper describes the design, calibration and performance of the X-Calibur polarimeter. In principle, a similar space-borne scattering polarimeter could operate over the broader 2–100 keV energy band.

scholarly journals Pixelated transmission-mode diamond X-ray detector

2015 ◽  
Vol 22 (6) ◽  
pp. 1396-1402 ◽  
Author(s):  
Tianyi Zhou ◽  
Wenxiang Ding ◽  
Mengjia Gaowei ◽  
Gianluigi De Geronimo ◽  
Jen Bohon ◽  
...  
Keyword(s):  
Single Channel ◽  
Sampling Rate ◽  
Incident Beam ◽  
Chemical Vapor ◽  
High Energy ◽  
Transmission Mode ◽  
Beam Position ◽  
Synchrotron Source ◽  
X Ray ◽  
Single Crystal Diamond

Fabrication and testing of a prototype transmission-mode pixelated diamond X-ray detector (pitch size 60–100 µm), designed to simultaneously measure the flux, position and morphology of an X-ray beam in real time, are described. The pixel density is achieved by lithographically patterning vertical stripes on the front and horizontal stripes on the back of an electronic-grade chemical vapor deposition single-crystal diamond. The bias is rotated through the back horizontal stripes and the current is read out on the front vertical stripes at a rate of ∼1 kHz, which leads to an image sampling rate of ∼30 Hz. This novel signal readout scheme was tested at beamline X28C at the National Synchrotron Light Source (white beam, 5–15 keV) and at beamline G3 at the Cornell High Energy Synchrotron Source (monochromatic beam, 11.3 keV) with incident beam flux ranges from 1.8 × 10−2to 90 W mm−2. Test results show that the novel detector provides precise beam position (positional noise within 1%) and morphology information (error within 2%), with an additional software-controlled single channel mode providing accurate flux measurement (fluctuation within 1%).

Nanosecond resolution time-resolved x-ray study of silicon during pulsed-laser irradiation

1986 ◽  
Vol 1 (1) ◽  
pp. 144-154 ◽  
Author(s):  
B. C. Larson ◽  
J. Z. Tischler ◽  
D. M. Mills
Keyword(s):  
Laser Irradiation ◽  
Irradiation Time ◽  
Pulsed Laser ◽  
High Energy ◽  
Resolution Time ◽  
Time Resolved ◽  
Synchrotron Source ◽  
X Ray ◽  
Temperature Distributions ◽  
Pulsed Laser Irradiation

We have used the pulsed time structure of the Cornell High-Energy Synchrotron Source (CHESS) to carry out a nanosecond resolution time-resolved x-ray study of silicon during pulsed-laser irradiation. Time-resolved temperature distributions and interfacial overheating and undercooling were measured on 〈111〉 and 〈100〉 silicon during 25 ns UV laser pulses through the analysis of thermal expansion induced strain. The temperature gradients were found to be > 107 K/cm at the liquid-solid interface and the temperature distributions have been shown to be in agreement with numerical heat flow calculations for these laser conditions. The combined overheating and undercooling (during ∼ 10 m/s melting and ∼ 6 m/s regrowth) was measured to be 110 ± 30 K on 〈111〉 oriented silicon and 50 ± 25 K on 〈100〉 silicon. These values have been interpreted in terms of velocity coefficients of overheating and undercooling.

Confocal X-ray Fluorescence (XRF) Microscopy: A New Technique for the Nondestructive Compositional Depth Profiling of Paintings

2004 ◽  
Vol 852 ◽  
Author(s):  
Arthur R. Woll ◽  
Donald H. Bilderback ◽  
Sol Gruner ◽  
Ning Gao ◽  
Rong Huang ◽  
...  
Keyword(s):  
Depth Profiling ◽  
Incident Beam ◽  
High Energy ◽  
X Rays ◽  
Oil Painting ◽  
Synchrotron Source ◽  
X Ray ◽  
Glass Slides ◽  
A New Technique ◽  
Paint Films

ABSTRACTA confocal x-ray fluorescence microscope was built at the Cornell High Energy Synchrotron Source (CHESS) to determine the composition of buried paint layers that range from 10–80 μm thick in paintings. The microscope consists of a borosilicate monocapillary optic to focus the incident beam and a borosilicate polycapillary lens to collect the fluorescent x-rays. The overlap of the two focal regions is several tens of microns in extent, and defines the active, or confocal, volume of the microscope. The capabilities of the technique were tested using acrylic paint films with distinct layers brushed onto glass slides and a twentieth century oil painting on canvas. The position and thickness of individual layers were extracted from their fluorescence profiles by fitting to a simple, semi-empirical model.

scholarly journals An X-ray Spectral Survey of BL Lac Objects

1989 ◽  
Vol 134 ◽  
pp. 191-193 ◽  
Author(s):  
P. Barr ◽  
P. Giommi ◽  
A. Pollock ◽  
G. Tagliaferri ◽  
D. Maccagni ◽  
...  
Keyword(s):  
High Energy ◽  
Oxygen Absorption ◽  
X Rays ◽  
Bl Lac Objects ◽  
Synchrotron Source ◽  
X Ray ◽  
High Energy Tail ◽  
Bl Lac ◽  
Spectral Survey ◽  
Bl Lacs

A wide variety of X-ray spectral forms has been reported in BL Lac objects. Concave spectra, i.e. a steep soft X-ray spectrum with a flat high energy tail, have been reported in a few of the brightest BL Lacs (e.g Urry 1986). Conversely, convex spectra (steep hard X-rays, flat soft X-ray spectrum) have also been reported, sometimes in the same objects (Madejski 1985, Barr et al 1988, George et al 1988). The high energy tails have usually been invoked as a signature of synchrotron-self-Compton emission. Two conflicting interpretations of the convex spectra have been made. Urry et al (1986) suggest absorption by a partially ionised medium, probably intrinsic to the BL Lac object, following the identification of an Oxygen absorption trough in the Einstein OGS spectrum of PKS 2155-304 by Canizares and Kruper (1984). Conversely, Barr et al (1988) attribute the hard X-ray steepening to energy loss mechanisms operating on a synchrotron source.

Overheating and Undercooling in Silicon During Pulsed-Laser Irradiation

1984 ◽  
Vol 35 ◽  
Author(s):  
B. C. Larson ◽  
J. Z. Tischler ◽  
D. M. Mills
Keyword(s):  
Pulsed Laser ◽  
Laser Pulses ◽  
High Energy ◽  
X Ray Diffraction ◽  
Laser Melting ◽  
Time Resolved ◽  
Synchrotron Source ◽  
X Ray ◽  
Krf Excimer Laser ◽  
Pulsed Laser Irradiation

ABSTRACTWe have used time-resolved x-ray diffraction measurements of thermal expansion induced strain to measure overheating and undercooling in <100> and <111> oriented silicon during pulsed laser melting and regrowth. 249 nm (KrF) excimer laser pulses of 1.2 J/cm2 energy density and 25 ns FWHM were synchronized with x-ray pulses from the Cornell High Energy Synchrotron Source (CHESS) to carry out Bragg profile measurements with ±2 ns time resolution. Combined overheating and undercooling values of 120 ± 30 K and 45 ± 20 K were found for the <111> and <100> orientations, respectively, and these values have been used to obtain information on the limiting regrowth velocities for silicon.

scholarly journals Quick X-ray reflectivity using monochromatic synchrotron radiation for time-resolved applications

2018 ◽  
Vol 25 (3) ◽  
pp. 706-716 ◽  
Author(s):  
H. Joress ◽  
J. D. Brock ◽  
A. R. Woll
Keyword(s):  
Synchrotron Radiation ◽  
Film Growth ◽  
Sample Surface ◽  
High Energy ◽  
Time Resolved ◽  
Synchrotron Source ◽  
X Ray ◽  
Area Detector ◽  
Monochromatic Synchrotron

A new technique for the parallel collection of X-ray reflectivity (XRR) data, compatible with monochromatic synchrotron radiation and flat substrates, is described and applied to thein situobservation of thin-film growth. The method employs a polycapillary X-ray optic to produce a converging fan of radiation, incident onto a sample surface, and an area detector to simultaneously collect the XRR signal over an angular range matching that of the incident fan. Factors determining the range and instrumental resolution of the technique in reciprocal space, in addition to the signal-to-background ratio, are described in detail. This particular implementation records ∼5° in 2θ and resolves Kiessig fringes from samples with layer thicknesses ranging from 3 to 76 nm. The value of this approach is illustrated by showingin situXRR data obtained with 100 ms time resolution during the growth of epitaxial La0.7Sr0.3MnO3on SrTiO3by pulsed laser deposition at the Cornell High Energy Synchrotron Source (CHESS). Compared with prior methods for parallel XRR data collection, this is the first method that is both sample-independent and compatible with the highly collimated, monochromatic radiation typical of third-generation synchrotron sources. Further, this technique can be readily adapted for use with laboratory-based sources.

scholarly journals High-pressure small-angle X-ray scattering cell for biological solutions and soft materials

2021 ◽  
Vol 54 (1) ◽  
Author(s):  
Durgesh K. Rai ◽  
Richard E. Gillilan ◽  
Qingqiu Huang ◽  
Robert Miller ◽  
Edmund Ting ◽  
...  
Keyword(s):  
High Pressure ◽  
Small Angle ◽  
High Pressures ◽  
Protein Denaturation ◽  
Soft Materials ◽  
High Energy ◽  
Synchrotron Source ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Pressure is a fundamental thermodynamic parameter controlling the behavior of biological macromolecules. Pressure affects protein denaturation, kinetic parameters of enzymes, ligand binding, membrane permeability, ion transduction, expression of genetic information, viral infectivity, protein association and aggregation, and chemical processes. In many cases pressure alters the molecular shape. Small-angle X-ray scattering (SAXS) is a primary method to determine the shape and size of macromolecules. However, relatively few SAXS cells described in the literature are suitable for use at high pressures and with biological materials. Described here is a novel high-pressure SAXS sample cell that is suitable for general facility use by prioritization of ease of sample loading, temperature control, mechanical stability and X-ray background minimization. Cell operation at 14 keV is described, providing a q range of 0.01 < q < 0.7 Å−1, pressures of 0–400 MPa and an achievable temperature range of 0–80°C. The high-pressure SAXS cell has recently been commissioned on the ID7A beamline at the Cornell High Energy Synchrotron Source and is available to users on a peer-reviewed proposal basis.

X-Ray Scattering above 100KeV

1988 ◽  
Vol 143 ◽  
Author(s):  
J. B. Hastings
Keyword(s):  
High Energy ◽  
X Rays ◽  
Synchrotron Source ◽  
X Ray ◽  
High Energies ◽  
X Ray Scattering ◽  
Very High ◽  
Ray Scattering

Conventional x-ray scattering studies have been limited to photon energies (wavelengths) in the 5 to 20 KeV (approx. 2A to 0..5A) regime. With these energies absorption lengths limit the volume of illumination to the first tens of microns of samples. If it were possible to use x-rays of very high energies, true bulk (tens of millimeters) samples could be studied. The availability, intensity and resolution possible with high energies will be discussed and their role in the expanding field of x-ray scattering presented. Preliminary studies at the Cornell High Energy Synchrotron Source (CHESS) will form the basis of these discussions.

Sign in / Sign up

Export Citation Format

Share Document