Heavy ion linear energy transfer measurements during single event upset testing of electronic devices

1999 ◽  
Vol 46 (1) ◽  
pp. 59-69 ◽  
Author(s):  
V. Zajic ◽  
P. Thieberger
Keyword(s):  
Energy Transfer ◽  
Linear Energy Transfer ◽  
Electronic Devices ◽  
Heavy Ion ◽  
Single Event Upset ◽  
Single Event

Modeling the applicability of linear energy transfer on single event upset occurrence

2013 ◽  
Vol 37 (6) ◽  
pp. 066001 ◽  
Author(s):  
Chao Geng ◽  
Jie Liu ◽  
Zhan-Gang Zhang ◽  
Kai Xi ◽  
Song Gu ◽  
...  
Keyword(s):  
Energy Transfer ◽  
Linear Energy Transfer ◽  
Single Event Upset ◽  
Single Event

Impact of heavy ion energy and species on single-event upset in commercial floating gate cells

2021 ◽  
Vol 120 ◽  
pp. 114128
Author(s):  
Bing Ye ◽  
Li-Hua Mo ◽  
Peng-Fei Zhai ◽  
Li Cai ◽  
Tao Liu ◽  
...  
Keyword(s):  
Heavy Ion ◽  
Floating Gate ◽  
Single Event Upset ◽  
Single Event ◽  
Ion Energy

Simulation of Thermal-Neutron-Induced Single-Event Upset Using Particle and Heavy-Ion Transport Code System

2007 ◽  
Vol 46 (6A) ◽  
pp. 3377-3379
Author(s):  
Yutaka Arita ◽  
Koji Niita ◽  
Yuji Kihara ◽  
Junich Mitsuhasi ◽  
Mikio Takai ◽  
...  
Keyword(s):  
Ion Transport ◽  
Thermal Neutron ◽  
Heavy Ion ◽  
Single Event Upset ◽  
Single Event ◽  
Code System ◽  
Transport Code

scholarly journals Influence of Orbital Parameters on SEU Rate of Low-Energy Proton in Nano-SRAM Device

Symmetry ◽  
2020 ◽  
Vol 12 (12) ◽  
pp. 2030
Author(s):  
Bing Ye ◽  
Li-Hua Mo ◽  
Tao Liu ◽  
You-Mei Sun ◽  
Jie Liu
Keyword(s):  
Heavy Ion ◽  
High Energy ◽  
Low Energy ◽  
Single Event Upset ◽  
Single Event ◽  
High Energy Proton ◽  
Orbital Parameters ◽  
Energy Proton ◽  
Orbital Height ◽  
Selection Of

The on-orbit single-event upset (SEU) rate of nanodevices is closely related to the orbital parameters. In this paper, the on-orbit SEU rate (OOSR) induced by a heavy ion (HI), high-energy proton (HEP) and low-energy proton (LEP) for a 65 nm SRAM device is calculated by using the software SPACE RADIATION under different orbits based on the experimental data. The results indicate that the OOSR induced by the HI, HEP and LEP varies with the orbital parameters. In particular, the orbital height, inclination and shieling thickness are the key parameters that affect the contribution of the LEP to the total OOSR. Our results provide guidance for the selection of nanodevices on different orbits.

scholarly journals Impact of Heavy Ion Energy and Nuclear Interactions on Single-Event Upset and Latchup in Integrated Circuits

2007 ◽  
Vol 54 (6) ◽  
pp. 2303-2311 ◽  
Author(s):  
P. E. Dodd ◽  
J. R. Schwank ◽  
M. R. Shaneyfelt ◽  
J. A. Felix ◽  
P. Paillet ◽  
...  
Keyword(s):  
Integrated Circuits ◽  
Heavy Ion ◽  
Single Event Upset ◽  
Single Event ◽  
Ion Energy ◽  
Nuclear Interactions

Heavy ion mutagenesis: Linear energy transfer effects and genetic linkage

1995 ◽  
Vol 34 (2) ◽  
pp. 73-78 ◽  
Author(s):  
A. Kronenberg ◽  
S. Gauny ◽  
K. Criddle ◽  
D. Vannais ◽  
A. Ueno ◽  
...  
Keyword(s):  
Energy Transfer ◽  
Linear Energy Transfer ◽  
Genetic Linkage ◽  
Heavy Ion ◽  
Transfer Effects

scholarly journals Linear Energy Transfer-Dependent Change in Rice Gene Expression Profile after Heavy-Ion Beam Irradiation

PLoS ONE ◽  
2016 ◽  
Vol 11 (7) ◽  
pp. e0160061 ◽  
Author(s):  
Kotaro Ishii ◽  
Yusuke Kazama ◽  
Ryouhei Morita ◽  
Tomonari Hirano ◽  
Tokihiro Ikeda ◽  
...  
Keyword(s):  
Gene Expression ◽  
Energy Transfer ◽  
Linear Energy Transfer ◽  
Ion Beam ◽  
Heavy Ion ◽  
Beam Irradiation ◽  
Rice Gene ◽  
Ion Beam Irradiation ◽  
Dependent Change ◽  
Heavy Ion Beam
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