Fatigue Life Evaluation and Test Method for Representative Printed Circuit Board

Author(s):  
Jun Tong ◽  
Hao Chen ◽  
Hefeng Liu
2020 ◽  
Vol 76 (4) ◽  
pp. 68-75
Author(s):  
Anatolyi Nester ◽  
Larisa Tretyakova ◽  
Liudmyla Mitiuk ◽  
Natalya Prakhovnik ◽  
Arkadii Husev

This paper examines the environmental conditions at the premises of printed circuit boards (PCBs) manufacturers, which have electroplating plants. It provides a brief overview of the key aspects of adverse environmental impacts of wastes generated by PCB manufacture and electroplating plants. The aim of this research was to improve the test method for evaluation of wastewater effect on the soil salinity at the premises of PCBs manufacturers. The object of research was the process of extraction and use of copper from wastewater generated by PCBs manufacture and electroplating. As an example, the process of sludge formation during PCBs etching has been reviewed. With the etching line capacity of 14 m2/h, one-shift manufacturing process will result in the production of up to 2,500 kg of sludge monthly. For enterprises with capacities of 2,000–4,000 m2 circuits, this means annual accumulation at their premises of up to 70 tons of wastes in the form of sludge. Estimates suggest that the upper half-meter layer of the aeration zone will be qualified as slightly saline in one year after accumulation of the sludge. In subsequent years, the salt content will increase and saline soil can be found at the depths of 1.5–2 m over ten years of storage. The authors of this paper propose to treat spent etching solutions applying regeneration technology in order to reduce the amount of sludge. With this technology, it is possible to use the extracted metal as a secondary raw material for copper production and re-use the regenerated solution in PCBs etching. This paper provides estimated hazard indices calculated for the storage of sludge at the manufacturer’s premises before and after the implementation of the proposed technology. With regards to findings of the study, it has been proposed to reuse copper recovered from wastes as a raw material for the industry.


2008 ◽  
Vol 6 ◽  
pp. 279-284
Author(s):  
S. Korte ◽  
O. Döring ◽  
H. Garbe

Abstract. This paper shows a possibility to visualize signal propagation in electronic circuits. Instead of using various galvanic measurement points all over the circuit, a test method is shown which measures the radiated field of the printed circuit board. By use of a 2-dimensional positionable field probe it is possible to get an overview over the signals running on the different parts of the PCB. In order to measure transient disturbing signals and distinguish them from normal device operation, problems of probe design and triggering need to be discussed.


2012 ◽  
Vol 132 (6) ◽  
pp. 404-410 ◽  
Author(s):  
Kenichi Nakayama ◽  
Kenichi Kagoshima ◽  
Shigeki Takeda

2014 ◽  
Vol 5 (1) ◽  
pp. 737-741
Author(s):  
Alejandro Dueñas Jiménez ◽  
Francisco Jiménez Hernández

Because of the high volume of processing, transmission, and information storage, electronic systems presently requires faster clock speeds tosynchronizethe integrated circuits. Presently the “speeds” on the connections of a printed circuit board (PCB) are in the order of the GHz. At these frequencies the behavior of the interconnects are more like that of a transmission line, and hence distortion, delay, and phase shift- effects caused by phenomena like cross talk, ringing and over shot are present and may be undesirable for the performance of a circuit or system.Some of these phrases were extracted from the chapter eight of book “2-D Electromagnetic Simulation of Passive Microstrip Circuits” from the corresponding author of this paper.


Author(s):  
Prabjit Singh ◽  
Ying Yu ◽  
Robert E. Davis

Abstract A land-grid array connector, electrically connecting an array of plated contact pads on a ceramic substrate chip carrier to plated contact pads on a printed circuit board (PCB), failed in a year after assembly due to time-delayed fracture of multiple C-shaped spring connectors. The land-grid-array connectors analyzed had arrays of connectors consisting of gold on nickel plated Be-Cu C-shaped springs in compression that made electrical connections between the pads on the ceramic substrates and the PCBs. Metallography, fractography and surface analyses revealed the root cause of the C-spring connector fracture to be plating solutions trapped in deep grain boundary grooves etched into the C-spring connectors during the pre-plating cleaning operation. The stress necessary for the stress corrosion cracking mechanism was provided by the C-spring connectors, in the land-grid array, being compressed between the ceramic substrate and the printed circuit board.


Author(s):  
William Ng ◽  
Kevin Weaver ◽  
Zachary Gemmill ◽  
Herve Deslandes ◽  
Rudolf Schlangen

Abstract This paper demonstrates the use of a real time lock-in thermography (LIT) system to non-destructively characterize thermal events prior to the failing of an integrated circuit (IC) device. A case study using a packaged IC mounted on printed circuit board (PCB) is presented. The result validated the failing model by observing the thermal signature on the package. Subsequent analysis from the backside of the IC identified a hot spot in internal circuitry sensitive to varying value of external discrete component (inductor) on PCB.


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