On-chip microaccelerometers using piezoelectric thin films has attracted much interest due to their simple structure and potentially high sensitivity. However, the relationships between the structure of the microaccelerometer and its performance still need to be further developed in more details. In this paper we present a theoretical model for a microaccelerometer with four suspended flexural PZT/silicon beams and a central proof mass configuration. The model takes into account the effect of device geometry and elastic properties of the piezoelectric film, and is supported by the finite element analysis. The good agreement of the results demonstrates the validity of the modeling assumptions. This study shows that the accelerometer sensitivity decreases with increasing the width and thickness of the bilayer beams, and elastic modulus of the mechanical microstructure, while increasing the length of the beam, increases sensitivity. For a fixed beam thickness, a maximum sensitivity exists for appropriate PZT/Si thickness. In addition, it is found that the sensitivity is also proportional to the magnitude of the input acceleration. The results of this study can be readily applied to for on-chip piezoelectric microaccelerometer design and its structural optimization.